Light measuring apparatus and a method for correcting non-linearity of a light measuring apparatus
    71.
    发明授权
    Light measuring apparatus and a method for correcting non-linearity of a light measuring apparatus 有权
    光测量装置和用于校正光测量装置的非线性的方法

    公开(公告)号:US07286215B2

    公开(公告)日:2007-10-23

    申请号:US10841189

    申请日:2004-05-06

    申请人: Kenji Imura

    发明人: Kenji Imura

    IPC分类号: G01J1/10

    摘要: A correction LED is provided to illuminate a light receiving sensor array, and a calculation controlling circuit calculates correction values at the respective illuminance levels based on sensor output levels expected at the respective illuminance levels and actual sensor output levels while successively turning the correction LED on at a plurality of illuminance levels whose illuminance ratios are at least known, and corrects a sensor output level by the corresponding correction value to obtain a measurement output at the time of an actual measurement. The discontinuity of an input/output characteristic resulting from the switching of gains of an amplifier for amplifying a photocurrent and the non-linearity caused by the saturation of the photoelectrically converting characteristic of the optical sensor and the exponential characteristics of the optical sensor and the amplifier can be corrected without employing a large-scale construction such as a bench. The non-linearity can be highly precisely and efficiently corrected in a measuring apparatus realized as a spectral luminometer or a spectral colorimeter without requiring a special facility.

    摘要翻译: 提供校正LED以照明光接收传感器阵列,并且计算控制电路基于在各个照度水平和实际传感器输出电平处预期的传感器输出电平来计算各照度水平下的校正值,同时依次将校正LED接通 其照度比至少为已知的多个照度水平,并且通过相应的校正值校正传感器输出电平,以获得实际测量时的测量输出。 由用于放大光电流的放大器的增益切换引起的输入/输出特性的不连续性以及由光学传感器的光电转换特性的饱和引起的非线性以及光学传感器和放大器的指数特性 可以在不使用诸如台架的大规模构造的情况下进行校正。 在实现为光谱发光计或光谱色度计的测量装置中,不需要特殊设备,可以高精度和有效地校正非线性。

    Two-dimensional spectroradiometer
    72.
    发明申请
    Two-dimensional spectroradiometer 有权
    二维光谱仪

    公开(公告)号:US20060132781A1

    公开(公告)日:2006-06-22

    申请号:US11300778

    申请日:2005-12-15

    申请人: Kenji Imura

    发明人: Kenji Imura

    IPC分类号: G01N21/25 G01J3/51

    摘要: A two-dimensional spectroradiometer has an optical system such as an objective optical system 2 and a relay lens 6 for receiving light rays La from a two-dimensional light source L to form an optical image i.e. a first image 2a and a second image 6a, a WBPF 12 as a transmittance wavelength variable filter having a spectral transmittance characteristic that transmittance wavelengths of the light rays La differ from each other depending on transmittance sites of the filter where the respective light rays La pass, a scanning WBPF 10 which scannably holds the WBPF 12 on an optical path forming the optical image, and an image sensor 7 for capturing the second image 6a composed of the light rays La passing through the WBPF 12 at a position corresponding to each of scanning steps of the WBPF 12 to acquire a plurality of images each having a different spectral sensitivity among pixels of the image at the position corresponding to the each of the scanning steps. This arrangement enables to provide a compact and inexpensive two-dimensional spectroradiometer with shortening of the measurement time.

    摘要翻译: 二维光谱仪具有物镜光学系统2和中继透镜6等光学系统,用于从二维光源L接收光线La以形成光学图像,即第一图像2a和第二图像6 a,WBPF12作为透射率波长可变滤波器,具有根据各光线La通过的滤光器的透射率位置彼此不同的光线La的透射率特性的光谱透射率特性,可扫描地保持的扫描WBPF 10 在形成光学图像的光路上的WBPF12和用于捕获由在WBPF 12的每个扫描步骤相对应的位置处通过WBPF 12的光线La组成的第二图像6a的图像传感器7,以获取 在对应于每个扫描步骤的位置处,图像的像素之间各自具有不同的光谱灵敏度的多个图像。 这种布置使得能够提供紧凑且廉价的二维光谱辐射计,缩短了测量时间。

    Light measuring apparatus and a method for correcting non-linearity of a light measuring apparatus
    73.
    发明申请
    Light measuring apparatus and a method for correcting non-linearity of a light measuring apparatus 有权
    光测量装置和用于校正光测量装置的非线性的方法

    公开(公告)号:US20050128475A1

    公开(公告)日:2005-06-16

    申请号:US10841189

    申请日:2004-05-06

    申请人: Kenji Imura

    发明人: Kenji Imura

    摘要: A correction LED is provided to illuminate a light receiving sensor array, and a calculation controlling circuit calculates correction values at the respective illuminance levels based on sensor output levels expected at the respective illuminance levels and actual sensor output levels while successively turning the correction LED on at a plurality of illuminance levels whose illuminance ratios are at least known, and corrects a sensor output level by the corresponding correction value to obtain a measurement output at the time of an actual measurement. The discontinuity of an input/output characteristic resulting from the switching of gains of an amplifier for amplifying a photocurrent and the non-linearity caused by the saturation of the photoelectrically converting characteristic of the optical sensor and the exponential characteristics of the optical sensor and the amplifier can be corrected without employing a large-scale construction such as a bench. The non-linearity can be highly precisely and efficiently corrected in a measuring apparatus realized as a spectral luminometer or a spectral calorimeter without requiring a special facility.

    摘要翻译: 提供校正LED以照明光接收传感器阵列,并且计算控制电路基于在各个照度水平和实际传感器输出电平处预期的传感器输出电平来计算各照度水平下的校正值,同时依次将校正LED接通 其照度比至少为已知的多个照度水平,并且通过相应的校正值校正传感器输出电平,以获得实际测量时的测量输出。 由用于放大光电流的放大器的增益切换引起的输入/输出特性的不连续性以及由光学传感器的光电转换特性的饱和引起的非线性以及光学传感器和放大器的指数特性 可以在不使用诸如台架的大规模构造的情况下进行校正。 在实现为光谱发光计或光谱量热计的测量装置中,不需要特殊设备,可以高精度和有效地校正非线性。

    Spectral characteristic measuring apparatus and method for correcting wavelength shift of spectral sensitivity in the apparatus
    74.
    发明授权
    Spectral characteristic measuring apparatus and method for correcting wavelength shift of spectral sensitivity in the apparatus 有权
    用于校正装置中光谱灵敏度的波长偏移的光谱特性测量装置和方法

    公开(公告)号:US06876448B2

    公开(公告)日:2005-04-05

    申请号:US10193291

    申请日:2002-07-12

    IPC分类号: G01J3/02 G01J3/10 G01J3/28

    摘要: A spectral characteristic measuring apparatus is provided with a memory and a CPU. The memory stores a spectral profile output from a sample light sensor array when light from a lamp is received, and a plurality of spectral profiles to be output from the sensor array at each displaced position in the case where a light separator is displaced relative to a grating member of the sensor array at a certain pitch stepwise in a wavelength diffusing direction. The CPU controls the lamp to emit light in a state that a white plate for calibration is disposed as a sample, compares a spectral profile output from the sensor array for correction with each spectral profile stored in the memory, and sets a displacement amount corresponding to the spectral profile that is most approximate to the corrective spectral profile as a wavelength shift correction amount.

    摘要翻译: 光谱特征测量装置具有存储器和CPU。 存储器存储当来自灯的光被接收时来自样本光传感器阵列的光谱分布输出,以及在光分离器相对于光源分离器移位的情况下,在每个位移位置处从传感器阵列输出的多个光谱轮廓 传感器阵列的光栅构件在波长扩散方向上逐步地以一定的间距。 在将校准用白板作为样本配置的状态下,CPU控制灯发光,将来自校正用传感器阵列的光谱分布图与存储在存储器中的各光谱分布进行比较,并设定与 作为波长偏移校正量最接近校正光谱分布的光谱分布。

    Spectrometer and method for correcting wavelength displacement of spectrometer
    75.
    发明申请
    Spectrometer and method for correcting wavelength displacement of spectrometer 有权
    用于校正光谱仪波长位移的光谱仪和方法

    公开(公告)号:US20050041248A1

    公开(公告)日:2005-02-24

    申请号:US10752595

    申请日:2004-01-08

    申请人: Kenji Imura

    发明人: Kenji Imura

    CPC分类号: G01J3/28 G01J2003/2866

    摘要: A spectrometer capable of correcting a displacement of a dispersed light image is provided with a light source for outputting a monochromatic ray of light, a slit member formed with an incident slit, an optical system which images a dispersed light image of the monochromatic ray through the incident slit on an imaging plane, a sensor array including a number of photoelectric conversion elements arrayed on the imaging plane, and a calculator for calculating a variation in an imaging position of a primary dispersed light image of the monochromatic ray through the incident slit on the imaging plane from its initial position as a first image displacement amount, and a variation in an imaging position of a secondary dispersed light image of the monochromatic ray through the incident slit from its initial position as a second image displacement amount, and calculating, based on the first and second image displacement amounts, a third image displacement amount which is free of an influence due to a fluctuation of a wavelength of the monochromatic ray.

    摘要翻译: 能够校正分散的光图像的位移的光谱仪设置有用于输出单色光线的光源,形成有入射狭缝的狭缝部件,通过所述单色光线成像分散的单色光的图像的光学系统 在成像平面上的入射狭缝,包括排列在成像平面上的多个光电转换元件的传感器阵列,以及用于计算通过入射缝的单色光的初步分散光图像的成像位置的变化的计算器 成像平面从其作为第一图像位移量的初始位置以及通过来自其初始位置的入射狭缝的单色光的二次分散光图像的成像位置的变化作为第二图像位移量,并且基于 第一和第二图像位移量,没有影响力的第三图像位移量 e到单色光的波长的波动。

    Calibration system for a spectral luminometer and a method for calibrating a spectral luminometer
    76.
    发明申请
    Calibration system for a spectral luminometer and a method for calibrating a spectral luminometer 有权
    用于光谱发光计的校准系统和用于校准光谱发光计的方法

    公开(公告)号:US20050018184A1

    公开(公告)日:2005-01-27

    申请号:US10733370

    申请日:2003-12-12

    申请人: Kenji Imura

    发明人: Kenji Imura

    CPC分类号: G01J3/10 G01J2003/2866

    摘要: A calibration light source outputs emission lines having a known emission-line wavelength, a spectral luminometer to be calibrated measures an emission-line output of the calibration light source, and a system control unit calibrates the wavelength of the spectral luminometer by estimating the wavelength of the emission-line output from ratios of outputs of a light receiving unit at a plurality of measurement wavelengths neighboring an emission-line wavelength and estimating a wavelength change amount from a difference between the estimated wavelength of the emission-line output and the known emission-line wavelength. The wavelength and the sensitivity of a spectral luminometer can be calibrated at a user side.

    摘要翻译: 校准光源输出具有已知发射线波长的发射线,要校准的光谱发光计测量校准光源的发射线输出,并且系统控制单元通过估计光谱发光计的波长来估计波长 在与发射线波长相邻的多个测量波长处的光接收单元的输出比率和从发射线输出的估计波长与已知发射线波长之间的差估计波长变化量的发射线输出, 线波长。 可以在用户侧校准光谱发光计的波长和灵敏度。

    Apparatus and method for measuring spectral property of fluorescent sample
    77.
    发明授权
    Apparatus and method for measuring spectral property of fluorescent sample 有权
    用于测量荧光样品的光谱性质的装置和方法

    公开(公告)号:US06535278B1

    公开(公告)日:2003-03-18

    申请号:US09500481

    申请日:2000-02-09

    申请人: Kenji Imura

    发明人: Kenji Imura

    IPC分类号: G01J300

    摘要: In an apparatus for measuring a spectral property such as a total spectral radiant factor of a fluorescent sample, a weight factor is previously calculated by using a standard fluorescent sample in which an index of a spectral property such as a total spectral radiant factor is known. When a spectral intensity distribution of a fluorescent sample to be measured is measured, the measured spectral intensity distribution is corrected similar to a value when the fluorescent sample is illuminated as if the same illumination light when the weight factor is set. As a result, the error component in the measurement result due to the variation of the illumination light in a time period from the setting of the weight factor to the measurement of the fluorescent sample can be reduced.

    摘要翻译: 在用于测量诸如荧光样品的总光谱辐射因子之类的光谱特性的装置中,通过使用其中诸如总光谱辐射系数的光谱特性的指数已知的标准荧光样品,预先计算加权因子。 当测量要测量的荧光样品的光谱强度分布时,测量的光谱强度分布类似于当荧光样品被照亮时的值被校正,就像在设定重量因子时相同的照明光一样。 结果,可以减少在从重量因数的设定到荧光试样的测量的时间段内的照明光的变化引起的测量结果中的误差分量。

    Reflection characteristic measuring apparatus
    78.
    发明授权
    Reflection characteristic measuring apparatus 有权
    反射特性测量装置

    公开(公告)号:US6088117A

    公开(公告)日:2000-07-11

    申请号:US141727

    申请日:1998-08-27

    摘要: A reflection characteristic of a sample is measured using an integrating sphere by: measuring an apparent reflectance of a reference sample by using integrating sphere, the reference sample having a known true reflectance under a given illumination condition; calculating coefficients for rendering a linear combination of a measured apparent reflectance of the reference sample and N-th power (N is 2 or more integer) of the measured apparent reflectance closer to the known true reflectance of the reference sample; storing calculated coefficients in a storage medium as coefficients for the given illumination condition; measuring an apparent reflectance of a desired sample by using the integrating sphere; calculating a true reflectance of the desired sample under the given illumination condition by multiplying the terms of the linear combination of an measured apparent reflectance of the desired sample and N-th power of the measured apparent reflectance of the desired sample by the coefficients stored in the storage medium, respectively.

    摘要翻译: 使用积分球来测量样品的反射特性:通过使用积分球来测量参考样品的表观反射率,参考样品在给定照明条件下具有已知的真实反射率; 计算用于渲染参考样本的测量的表观反射率和近似于参考样品的已知真实反射率的测量的表观反射率的N次方(N是2或更大整数)的线性组合的系数; 将计算的系数存储在存储介质中作为给定照明条件的系数; 使用积分球测量所需样品的表观反射率; 通过将所需样品的测量的表观反射率和所需样品的测量的表观反射率的N次方的线性组合的项乘以存储在所需样品中的系数,将所需样品的真实反射率乘以给定照明条件 存储介质。

    Measuring apparatus for measuring an optical property of a fluorescent
sample
    79.
    发明授权
    Measuring apparatus for measuring an optical property of a fluorescent sample 失效
    用于测量荧光样品的光学性质的测量装置

    公开(公告)号:US5636015A

    公开(公告)日:1997-06-03

    申请号:US648335

    申请日:1996-05-15

    摘要: The measuring apparatus of the present invention measures the optical properties of a sample containing a fluorescent material by irradiating the sample with light containing a UV component. In the present invention are provided a first light source for irradiating the sample with light containing a UV component, a second light source for irradiating the sample with light which does not contain a UV component, light receiving element for receiving light reflected from the sample irradiated by said light sources, and output means for generating weighting coefficients for weighting the output of the light receiving element during emission by each light source. The optical properties of the sample is calculated based on the output of the light receiving element for a first light source, output of the light receiving element for a second light source, and the respective weighting coefficients. Accordingly, measurement values can be obtained which are equal to values when measurement is accomplished with a standard light source.

    摘要翻译: 本发明的测量装置通过用含有UV成分的光照射样品来测量含有荧光材料的样品的光学性质。 在本发明中提供了一种用于对含有UV成分的光照射样品的第一光源,用于用不含UV成分的光照射样品的第二光源,用于接收从所照射的样品反射的光的光接收元件 以及用于产生加权系数的输出装置,用于在由每个光源发射期间加权光接收元件的输出。 基于用于第一光源的光接收元件的输出,用于第二光源的光接收元件的输出和各个加权系数来计算样品的光学性质。 因此,可以获得与使用标准光源进行测量时的值相等的测量值。

    Radiation thermometer
    80.
    发明授权
    Radiation thermometer 失效
    辐射温度计

    公开(公告)号:US5001657A

    公开(公告)日:1991-03-19

    申请号:US449357

    申请日:1989-12-06

    IPC分类号: G01J5/00 G01J5/62

    摘要: A radiation thermometer has a detector for receiving radiation energy from a target object, and the detector generates an AC signal as a result of movement of a chopper. The AC signal is rectified by a rectifying circuit and the rectified signal is supplied to a microcomputer. On the other hand, temperatures around the detector are detected by a temperature sensor and the temperature of the target object is measured based on those detected values. In addition, the radiation thermometer has various calibration modes other than a measurement mode. In a calibration mode I, calibration data concerning a difference in characteristics of the temperature sensor for each thermometer is obtained. Data for correcting timing for synchronous rectification by the rectifying circuit is obtained in a calibration mode II. Calibration data for calculation of the temperature of the target object is obtained in a calibration mode III. Those calibration data are temporarily stored in a non-volatile RAM so that the temperature of the target object can be calculated by using those calibration data when the measurement mode is selected.

    摘要翻译: 辐射温度计具有用于从目标物体接收辐射能量的检测器,并且由于斩波器的移动,检测器产生交流信号。 交流信号由整流电路整流,整流信号供给微型计算机。 另一方面,通过温度传感器检测检测器周围的温度,并且基于那些检测值来测量目标物体的温度。 此外,辐射温度计具有除测量模式之外的各种校准模式。 在校准模式I中,获得关于每个温度计的温度传感器的特性差的校准数据。 在校准模式II中获得用于校正整流电路的同步整流定时的数据。 在校准模式III中获得用于计算目标物体温度的校准数据。 这些校准数据被临时存储在非易失性RAM中,使得当选择测量模式时可以通过使用那些校准数据来计算目标对象的温度。