摘要:
The invention provides a method of determining at least one electrochemical characteristic of a chemical-mechanical or electrochemical-mechanical polishing system comprising application of a potential between a polishing substrate and an electrode to generate a current, and determining the at least one electrochemical characteristic by analysis of the current as a function of time.
摘要:
Disclosed is a LGA socket connector including an insulative housing (2), a stiffener (3), a clip (4), and a lever (5) defining thereof a driving portion (50) and a locking portion (52) linked thereto. The stiffener is configured to grasp a periphery of the housing. The clip and the locking portion of the lever are essentially pivotally moved about longitudinal ends of the housing respectively, but with the driving portion disposed adjacent one transverse side of the housing. At least one of the clip and the stiffener is provided with a recessed region (300) adjacent said transverse side of the housing, thereby preventing the whole connector from becoming inclined when the connector is horizontally locked and placed on the printed circuit board.
摘要:
Disclosed is a LGA socket connector including an insulative housing (2), a stiffener (3), a clip (4), and a lever (5) defining thereof a driving portion (50) and a locking portion (52) linked thereto. The stiffener is configured to grasp a periphery of the housing. The clip and the locking portion of the lever are essentially pivotally moved about longitudinal ends of the housing respectively, but with the driving portion disposed adjacent one transverse side of the housing. At least one of the clip and the stiffener is provided with a recessed region (300) adjacent said transverse side of the housing, thereby preventing the whole connector from becoming inclined when the connector is horizontally locked and placed on the printed circuit board.
摘要:
A technique for in situ monitoring of polishing processes and other material removal processes employs a quartz crystal nanobalance embedded in a wafer carrier. Material removed from the wafer is deposited upon the surface of the crystal. The resulting frequency shift of the crystal gives an indication of the amount of material removed, allowing determination of an instantaneous removal rate as well as a process endpoint. The deposition on the quartz crystal nanobalance may be controlled by an applied bias. Multiple quartz crystal nanobalances may be used. In a further embodiment of the invention, the quartz crystal nanobalance is used to detect defect-causing events, such as a scratches, during the polishing process.
摘要:
A method for fabricating a MEMS device comprises providing a substrate having a back side, a front side opposite to the back side and a periphery portion. A desired microstructure is formed on the back side of the substrate. The substrate is then supported for rotation. A precursor solution is deposited on the front side of the substrate during rotation so that a thin film layer may be formed thereon. During formation of the thin film layer, the substrate is supported and rotated that the microstructure formed on the back side is protected.
摘要:
A method for depositing a nanostructure-containing material onto an object or substrate includes one or more of the following: (1) forming a solution or suspension of nanostructure-containing material, (2) selectively adding “chargers” to the solution, (3) immersing electrodes in the solution, the substrate or object upon which the nanostructure material is to be deposited acting as one of the electrodes, (4) applying a direct and/or alternating current electrical field between the two electrodes for a certain period of time thereby causing the nanostructure materials in the solution to migrate toward and attach themselves to the substrate electrode, and (5) subsequent optional processing of the coated substrate. Associated objects and devices are also provided. A method for separating nanostructures based on their properties and/or geometry is also described.
摘要:
Computed tomography device comprising an x-ray source and an x-ray detecting unit. The x-ray source comprises a cathode with a plurality of individually programmable electron emitting units that each emit an electron upon an application of an electric field, an anode target that emits an x-ray upon impact by the emitted electron, and a collimator. Each electron emitting unit includes an electron field emitting material. The electron field emitting material includes a nanostructured material or a plurality of nanotubes or a plurality of nanowires. Computed tomography methods are also provided.
摘要:
An electrical connector (1) for interconnecting an LGA chip (60) with a PCB includes an dielectric housing (10) defining a number of terminal passageways (16) with a plurality of electrical contacts (12) accommodated therein, a metal reinforcement (20) enclosing the housing (10) partly, a loading plate (40) pivotally mounted to an end of the reinforcement (20), and an actuator member (30) attached to an opposite end of the reinforcement (20) for engaging with the loading plate (40). The loading plate (40) defines a pair of pressing portions (43) to press the chip (60) against the connector (1). The pressing portion (43) defines some flexible materials (431) on the bottom surface (430) toward the housing (10) for protecting the chip (60) from being scraped by the loading plate (40).
摘要:
A graphing calculator (10) having an X=Editor with inequalities. The calculator (10) is programmed to provide an X=Editor which displays one or more “X=” to allow input of a vertical line inequality. The X=Editor allows the user to input an inequality symbol and a constant for each X, allows the user to select or deselect each X, and a graph function to graph each selected X on the X=Editor display.
摘要翻译:具有X =编辑器的图形计算器(10)具有不等式。 计算器(10)被编程为提供X =编辑器,其显示一个或多个“X =”以允许输入垂直线不等式。 X =编辑器允许用户为每个X输入不等式符号和常数,允许用户选择或取消选择每个X,以及图形功能,以在X =编辑器显示上绘制每个选定的X。
摘要:
Data is analysed by an independent component analysis to derive a transform matrix W encoding properties of the data. The data is encoded using this transform matrix W, and a watermark is embedded into it. Then that the inverse of the transform matrix is applied to obtain watermarked data. The presence of the watermark is found by applying the transform matrix again, and examining the result for the presence of the watermark. The invention is particularly, but not exclusively suitable for data which is image data 10.