公开(公告)号：US1446149A

公开(公告)日：1923-02-20

申请号：US48521321

申请日：1921-07-16

Applicant: BENOIT WILFRED J ,  PIERCE GEORGE L

Inventor： BENOIT WILFRED J ,  PIERCE GEORGE L

IPC: G01B5/20

CPC classification number: G01B5/201

公开(公告)号：US11740072B2

公开(公告)日：2023-08-29

申请号：US17939080

申请日：2022-09-07

Applicant: Tokyo Seimitsu Co., Ltd.

Inventor： Hideki Morii ,  Katsufumi Moriyama

IPC: G01B11/12 ,  G01B11/00 ,  G01B21/04 ,  G01B5/20

CPC classification number: G01B11/12 ,  G01B5/201 ,  G01B11/002 ,  G01B21/042

Abstract: The inner surface shape measurement device, which measures an inner surface shape of a small hole formed in a workpiece, includes: a rotating body for rotating the workpiece around a rotation axis, and a linear-and-tilting-motion stage; an elongated probe capable of being inserted into the small hole of the workpiece; a probe linear-and-tilting-motion mechanism capable of adjusting posture of the probe; a camera, configured to be rotatable integrally with the rotating body, for imaging the probe from at least three circumferential positions on a rotation trajectory centered on a rotation axis; and a controller for adjusting the posture of the probe using the probe linear-and-tilting-motion mechanism based on an image taken by the camera at each of the circumferential positions.

公开(公告)号：US09983001B2

公开(公告)日：2018-05-29

申请号：US13932350

申请日：2013-07-01

Applicant: MITUTOYO CORPORATION

Inventor： Masafumi Shimizu ,  Yoichi Saito

IPC: G01B21/20 ,  G01B5/008 ,  G01B5/20 ,  G01B5/24

CPC classification number: G01B21/20 ,  G01B5/201 ,  G01B5/24

Abstract: A shape analysis method for analyzing shape data acquired by measuring a contour shape of a workpiece to be measured, includes: deciding a geometric element used in shape analysis; deciding one data point to be included in an evaluation range; applying the geometric element to an interval including the one data point; searching the widest interval for satisfying a threshold condition of a preset shape tolerance while changing a width of the interval; pinpointing two boundary points between which the interval found by the search is sandwiched; obtaining two edge points at which the two boundary points are respectively shifted by preset shift amounts; setting a range sandwiched between the edge points in the evaluation range; and targeting the shape data within the evaluation range for calculation of geometric properties.

公开(公告)号：US20180010898A1

公开(公告)日：2018-01-11

申请号：US15544190

申请日：2016-01-18

Applicant: Marposs Societa' Per Azioni

Inventor： Daniele Pasqualino Brambilla

IPC: G01B5/00 ,  G01B5/20 ,  F16K37/00

CPC classification number: G01B5/0032 ,  F16K37/0041 ,  G01B5/20 ,  G01B5/201 ,  G01B5/241

Abstract: A device (1) for measuring a valve seat formed in a piece has an elongate shape and defines a longitudinal axis (A), and includes: a slide (9), slidingly coupled to a guide (11) for translating in a scanning direction (B) inclined to the longitudinal axis; a sensor (10), mounted on the slide for measuring a parameter relating to a profile of the seat; a processing unit connected to the sensor; a rotary actuator (13) defining a longitudinal rotation axis substantially parallel to the longitudinal axis of the device; and a transmission assembly interposed between the rotary actuator and the slide for transforming a rotary motion about a longitudinal rotation axis in a reciprocating linear motion of the slide along the scanning direction.

公开(公告)号：US20170336189A1

公开(公告)日：2017-11-23

申请号：US15486038

申请日：2017-04-12

Applicant: JENOPTIK Industrial Metrology Germany GmbH

Inventor： Raimund VOLK

IPC: G01B5/20 ,  G01B5/28 ,  G01B5/004

CPC classification number: G01B5/20 ,  G01B5/003 ,  G01B5/004 ,  G01B5/201 ,  G01B5/28 ,  G01B21/20

Abstract: A measuring assembly for measuring the contour of a workpiece has a measuring probe that is pivotably supported and deflectable about a first axis (measuring axis) in order to contact a surface of the workpiece, and has a second axis that is associated with the workpiece. The first axis and the second axis are parallel or approximately parallel to one another for radially contacting a surface of the workpiece. A device for rotating the measuring probe and the workpiece relative to one another is provided, such that the measuring probe contacts the surface of the workpiece during the rotation, and a device for plotting the angular deflection of the measuring probe as a function of the particular rotational position of the workpiece relative to the measuring probe is provided.

公开(公告)号：US09581424B2

公开(公告)日：2017-02-28

申请号：US14565058

申请日：2014-12-09

Applicant: Tokyo Seimitsu Co., Ltd.

Inventor： Ryo Takanashi

IPC: G01B5/20 ,  G01B5/00

CPC classification number: G01B5/201 ,  G01B5/0014 ,  G01B5/20

Abstract: A roundness measuring apparatus, which has a small space required for installation and of which measurement error due to a temperature change is small, is disclosed. The roundness measuring apparatus includes: a base; a turn-table which is fixed to the base and rotates a work placed on the turn-table; a two-dimensional moving mechanism provided at the base so as to move a holder holding part in parallel to a measurement plane including a rotation axis of the turn-table and a measuring point of the work; a detector holder attached to the holder holding part; and a detector attached to the detector holder so that a probe can be displaced on the measurement plane.

Abstract translation: 公开了一种具有安装所需的空间小，温度变化导致测量误差小的圆度测量装置。 圆度测量装置包括：底座; 固定在基座上并转动放置在转台上的工件的转台; 二维移动机构，其设置在所述基座上，以使保持器保持部平行于包括所述转台的旋转轴线和所述工件的测量点的测量平面移动; 附接到所述保持器保持部的检测器保持器; 以及附接到检测器保持器的检测器，使得探针可以在测量平面上移位。

公开(公告)号：US20160131302A1

公开(公告)日：2016-05-12

申请号：US14928209

申请日：2015-10-30

Applicant: MITUTOYO CORPORATION

Inventor： Kotaro HIRANO ,  Ryousuke WATANABE ,  Hisayoshi SAKAI

IPC: F16M11/24

CPC classification number: G01B5/0002 ,  G01B5/008 ,  G01B5/201

Abstract: A method of placing a work piece on a measuring device in which a work piece is placed on a table of a measuring device is provided. The method includes: using a retainer capable of holding the work piece above the table and a lifting/lowering device lifting and lowering a top surface of the table; holding the work piece above the table with the retainer; lifting the top surface of the table with the lifting/lowering device to bring the top surface of the table into contact with a bottom surface of the work piece; and, after a load of the work piece is borne by the table, releasing the hold of the retainer on the work piece.

Abstract translation: 提供了将工件放置在将工件放置在测量装置的工作台上的测量装置上的方法。 该方法包括：使用能够将工件保持在工作台上方的保持器和提升和降低工作台顶面的升降装置; 将工件用保持架固定在工作台上方; 用提升/降低装置提升桌子的顶面，使桌子的上表面与工件的底面接触; 并且在工件的载荷被工作台承载之后，释放保持件在工件上的保持。

公开(公告)号：US09228820B2

公开(公告)日：2016-01-05

申请号：US14178120

申请日：2014-02-11

Applicant: Chin-Chang Huang

Inventor： Chin-Chang Huang

IPC: G01B3/00 ,  G01B5/00 ,  G01B1/00 ,  G01B5/28 ,  G01B21/22 ,  G01B5/25 ,  G01B3/14 ,  G01B5/20 ,  G01B5/252

CPC classification number: G01B5/285 ,  G01B5/0004 ,  G01B5/201 ,  G01B5/205 ,  G01B5/252

Abstract: A straightness measuring instrument includes a base, two loading units, a center clamping apparatus, and a measure apparatus. The base includes two support rods and a sliding rod. The loading units are mounted on the base and are arranged along an axial direction of the support rods at intervals. The center clamping apparatus is mounted in the base and includes a fixed seat and a movable seat. The measure apparatus is mounted movably around the sliding rod. The loading units are adjustable for easy and quick movement depending on the length of a workpiece. Also, the center clamping apparatus can assist with clamping the workpiece that has different diameters.

Abstract translation: 平直度测量仪器包括基座，两个装载单元，中心夹紧装置和测量装置。 底座包括两个支撑杆和一个滑杆。 装载单元安装在基座上并且沿着支撑杆的轴向间隔地布置。 中心夹紧装置安装在基座中，并包括固定座和可动座。 测量装置可移动地安装在滑动杆周围。 装载单元是可调节的，以便根据工件的长度容易且快速地移动。 此外，中心夹紧装置可以帮助夹紧具有不同直径的工件。

公开(公告)号：US09151602B2

公开(公告)日：2015-10-06

申请号：US12730534

申请日：2010-03-24

Applicant: Takashi Noda ,  Hiromi Deguchi

Inventor： Takashi Noda ,  Hiromi Deguchi

IPC: G01B21/04 ,  G01B5/008 ,  G01B5/20 ,  G01B5/28

CPC classification number: G01B21/042 ,  G01B5/008 ,  G01B5/20 ,  G01B5/201 ,  G01B5/28 ,  G01B21/045

Abstract: A corrected ball diameter calculating method includes: preparing a reference gauge that has at least one reference peripheral surface of an outer peripheral surface and an inner peripheral surface; valuing of diameter values of the reference peripheral surface at a plurality of different height positions from a bottom surface of the reference gauge; calculating calibrated diameter values per each of the height positions; placing the reference gauge on the rotary table and causing the stylus tip to touch a plurality of measurement sites on the reference peripheral surface at each of the height positions to calculate measured diameter values that are diameter values of a circle passing through the neighborhood of center points of the stylus tip; and calculating the corrected ball diameters per each of the height positions from the calibrated diameter values and the measured diameter values that are calculated per each of the height positions.

Abstract translation: 校正球直径计算方法包括：准备具有外周面和内周面的至少一个参考外周面的基准量规; 在距离基准计的底面的多个不同的高度位置处估计参考外周表面的直径值; 计算每个高度位置的校准直径值; 将参考仪器放置在旋转台上，并使触针尖端在每个高度位置处接触参考外周表面上的多个测量位置，以计算经过中心点附近的圆的直径值的测量直径值 的笔尖; 以及根据每个高度位置计算的校准直径值和测量的直径值来计算每个高度位置的每个高度位置的校正球直径。

公开(公告)号：US20150233693A1

公开(公告)日：2015-08-20

申请号：US14704239

申请日：2015-05-05

Applicant: FRITZ STUDER AG

Inventor： Andreas SENN ,  Walter FABRIS ,  Reto ZWAHLEN ,  Fred GAEGAUF

IPC: G01B5/08 ,  G01B5/20 ,  B23Q17/20 ,  B24B49/04 ,  B24B5/02

CPC classification number: G01B5/08 ,  B23Q17/20 ,  B24B5/02 ,  B24B5/42 ,  B24B19/125 ,  B24B49/04 ,  B24B49/045 ,  G01B5/201

Abstract: The present disclosure relates to a machine tool, such as a grinding machine, and to a method for measuring a workpiece in a machine tool. The machine tool may comprise a workpiece mount (14), a tool unit (28), a measuring device (48) and a control device (56) that is connectable to the measuring device (48) and the tool unit (28), wherein the measuring device (48) is received at the tool unit (28) and comprises at least one toggle measurement head (66; 68), wherein the at least one toggle measurement head (66; 68) is received at a support piece (80) that provides a plurality of defined predetermined locations for the at least one toggle measurement head (66; 68), and wherein the control device (56) is arranged to detect signals that are triggered by the at least one toggle measurement head (66; 68) when touching a workpiece (96), and to determine on the basis of an actual location of the tool unit (28) an actual position of the at least one toggle measurement head (66; 68).

Abstract translation: 本公开涉及一种机床，例如研磨机，以及用于在机床中测量工件的方法。 机床可以包括可连接到测量装置（48）和工具单元（28）的工件安装件（14），工具单元（28），测量装置（48）和控制装置（56） 其中所述测量装置（48）被接收在所述工具单元（28）处并且包括至少一个肘节测量头（66; 68），其中所述至少一个肘节测量头（66; 68）被接纳在支撑件 80），其为所述至少一个肘节测量头（66; 68）提供多个限定的预定位置，并且其中所述控制装置（56）被布置成检测由所述至少一个肘节测量头（66）触发的信号 ; 68）当接触工件（96）时，并且基于所述工具单元（28）的实际位置来确定所述至少一个肘节测量头（66; 68）的实际位置。