摘要:
A light beam is chopped and split into two beams. Intensity of a first beam is changed by using, e.g., an electrooptic material in accordance of a change in a signal to be detected, such as a voltage in an electronic device, and detected by a first photodetector. On the other hand, a second beam is detected by a second photodetector without being subjected to the intensity change. At least one of the outputs of the first and second photodetectors are adjusted so that they become equal to each other when no signal is applied to the light intensity changing means. The difference of the thus adjusted output signals is detected by, e.g., a lock-in amplifier in a narrow band at the chopping frequency.
摘要:
A system for time-resolving ultra-short electrical waveforms of up to a few hundred gigahertz bandwidth is presented. The system utilizes a fast electro-optic modulator capable of subpicosecond responsivity. A CW (continuous wave) laser is used to probe the change in birefringence resulting in the modulator due to an induced electric field. The rapid change in the transmitted optical signal due to an equally rapid changing electric field (picosecond pulse) is then detected and temporally dispersed using a picosecond resolution streak camera. The modulator operates in a region close to minimum transmission where the average optical power is below the damage threshold for the photocathode of the streak camera and where small electrical signals can significantly modulate the transmitted beam. The system can be used in either sampling mode where the modulation and subsequent detection are repeated and the data accumulated at repetition rates as high as 100 MHz or in single shot mode.
摘要:
An apparatus for sampling, analyzing and displaying an electrical signal as disclosed having a good signal-to-noise ratio and high resolution. The apparatus includes a light pulse source for emitting a light pulse toward the electro-optical surface of a photoelectron sampling tube which in turn emits a photoelectron pulse after receiving the light pulse. The emitted photoelectron pulse is then modulated by a signal to be measured and is accelerated to an anode which may comprise a display for displaying the wave form of the electrical signal as a two-dimensional image.
摘要:
A high-speed test system for semiconductor integrated circuits utilizes electro-optic sampling techniques to perform tests at data rates up to 1.2 Gb/s. The receiver portion of the tester has a 4.5 GHz bandwidth and can perform ECL level functional test with one sampling pulse per vector. A device under test is positioned in a test head with an electro-optic birefringent crystal sensor positioned below the device under test to minimize signal path length. A system control unit includes a Nd: YAG modelocked laser which generates optical pulses, and optical transmission means directs the optical pulses to an array of reflective contacts on the sensor. The sensor functions as a Pockels cell with the electric field in the crystal sensor due to voltages on the array of contacts changing the transmission of polarized light through the crystal. Reflected pulses are received and converted to electrical signals indicative of the voltages on the array of contacts on the electro-optic sensor.
摘要:
In a process for the sampling of an electric signal changing over time, an electron beam (12) is deflected laterally and linearly over time and at the same time modulated in its intensity according to the instantaneous amplitude of the electric signal. The electron beam (12) generates on a fluorescent screen (14) a brightness-modulated bar of light, which is preferably sampled with a sensor (15) arranged ahead of the fluorescent screen (14) in the form of a CCD line camera having a linear array of sensor elements (15a, b, c).The read-out analog sampled values of the sensor (15) are subsequently digitized and further processed.The advantage of the process is its high broad-bandedness and resolution and the capability of being able to carry out an averaging without additional expenditure of time.
摘要:
An electro-optic sampler comprises a body of semiconductor material that can be energized to emit polarized light, a photodetector device for generating an electrical output signal representative of the intensity with which light polarized in a predetermined manner is incident on the photodetector device, and a body of electro-optic material defining an optical waveguide for transmitting light from the source of polarized light to the photodetector. First and second electrodes are provided for establishing an electrical field within the body of electro-optic material. The body of electro-optic material has a spherical index ellipsoid when the first and second electrodes are at the same potential and otherwise has a non-spherical index ellipsoid.
摘要:
A waveform sampler, for cooperation with a conventional sampling oscilloscope, has, as part of a bridge circuit, two Gallium Arsenide photoconductors mounted on a 50 ohm stripline. One GaAs photoconductor, the sampling photoconductor, is illuminated. The other GaAs photoconductor remains dark and functions as a common mode compensating photoconductor. To sample an unknown electrical waveform traversing the stripline the electrical wave is optically strobed by illuminating the sampling GaAs photoconductor with pulses of light from a laser. To sample an unknown optical waveform the optical wave is focused on the sampling GaAs photoconductor and an electrical strobe signal is sent through the stripline. Outputs from each of the photoconductors are amplified in high input impedance FET amplifiers and after electrical compensation they are passed to a conventional difference amplifier. The difference output is further amplified and fed to a conventional sampling oscilloscope. The sampling oscilloscope provides a conventional DC feedback control voltage to stabilize the bridge circuit and a strobe synchronization pulse for controlling either the electrical or optical strobe. A trigger pulse that is in advance of the signal being sampled is derived from the unknown signal and supplied to the sampling oscilloscope.
摘要:
A sampling system is described which utilizes electrooptic techniques for sampling an electrical signal. Short duration light pulses are polarized and directed through a crystal exhibiting either a linear or longitudinal electrooptic effect or through a liquid showing a large Kerr effect, located in traveling wave relationship with a terminated transmission line structure. The group velocity of the polarized light, that is, the velocity of a light pulse, or the velocity, of the modulation envelope of a modulated light beam, along the electrooptic crystal and the phase velocity of the electrical signal along the transmission line structure are in synchronism. Due to electrically induced birefringence, the state of polarization of the light pulse is altered according to the electrical field intensity to which the electrooptic crystal is subjected by that portion of the electrical signal traveling coincidentally along the transmission line structure. Consequently, the transmission of the light pulse by a crossed analyzer placed at the output of the electrooptic crystal varies in response to the coincidental portion of the electrical signal. The energy of the light pulse emanating from the analyzer is detected and directed to a utilization of circuit, for example, the hold and display circuitry of a sampling oscilloscope.