Abstract:
A photomultiplier tube and a method and apparatus for molding an optical coupler thereto are described. An optical coupler molding fixture includes a frame and a frame base. A photomultiplier tube is positioned within the frame between a spring and a shim. The optical coupler is formed with a mold which is positioned against the shim. A cavity is created radially interior to the shim between the photomultiplier tube and the mold. The optical coupler is molded to a faceplate of the photomultiplier tube with the fixture oriented so that its longitudinal axis L is parallel to the ground. A clamping structure presses the mold against the shim and provides the optical coupler material a non-leak space in which to cure. The optical coupler material is injected into the mold through a fill hole, and may be injected at ambient temperature. Curing time may range from one week at ambient temperatures to four hours at 65° C. The mold can be machined to create any form desired for the optical coupler. The shim can be sized and configured to allow for adjustment in the thickness of the optical coupler. The optical coupler may be as thin as less than 0.015 inches in thickness. If, for example, a thicker optical coupler is desired, the shim may be made thicker. The edge of the photomultiplier tube housing which abuts the shim is checked for its perpendicularity to the longitudinal axis L. Without perpendicularity, proper alignment of the photomultiplier tube is less likely.
Abstract:
A photomultiplier tube includes dynodes electrically joined to corresponding leads. The tube, containing a loose debris particle, may be reprocessed by positioning the particle at an accessible site inside the tube. A power laser is aimed at the particle through a transparent wall of the tube and fired to reduce the size of the particle.
Abstract:
A particle and photon detector includes a body having a beam-incident surface (8) capable of releasing secondary electrons in numbers proportional to the number of particles incident on the surface, and a plurality of secondary electron multiplier channels (4) whose inlet openings are disposed in the beam-incident surface, therewith to amplify the number of secondary electrons. A center channel (2) extends from the beam-incident surface (8) through the detector body and enables a beam of particles or photons to pass through the body. The inlet openings of the secondary electron multipliers are conveniently disposed in the beam-incident surface in a ring around the center channel for receiving secondary electrons. The method applied in the detection of charged particles, such as ions and electrons, in a beam that contains charged and charge-free particles comprises the steps of subjecting the charged particles to the effect of an electric field so as to collect the charged particles in an outer tubular layer or beam which surrounds the residual beam of charge-free particles, such as to form two mutually, coaxial beams, wherein the outer tubular particle beam is captured by a plurality of secondary electron multipliers and wherein signals delivered by the electron multipliers are read-off.
Abstract:
A photomultiplier tube of the present invention is the one which collects the electrons, which have been multiplied by the dynodes laminated into a plurality of stages in the electron multiplier section and that have subsequently been reflected at the final-stage dynode, as an output signal. The photomultiplier tube forms the final-stage dynode as multi-stage, for example, in two layers, and has its alkali metal vapor passage holes of its first layer so arranged as to have the holes shifted with respect to the alkali metal vapor passage holes of the second layer. Furthermore, each of the dynodes, except the final-stage dynode consists of the focusing mesh electrode, the coarse mesh electrode, and the spacer electrode and the reinforcing bars are formed at identical locations in the coarse mesh electrode and the spacer electrode. Secondary electron emission sections are provided in the vicinity regions of these reinforcing bars of the focusing mesh electrodes.
Abstract:
This invention relates to an electron tube having a structure for enabling a stable operation for a long time. In the electron tube, at least a confining mechanism is arranged between a photocathode and the electron incident surface of a semiconductor device, which are arranged to oppose each other through a container. Particularly, the area of the opening of the confining mechanism is smaller than that of the electron incident surface, thereby confining the orbits of photoelectrons from the photocathode. This structure avoids bombardment of electrons arriving at portions other than the electron incident surface of the semiconductor device and prevents the semiconductor device from being unnecessarily charged.
Abstract:
The present invention relates to a versatile side-on type photomultiplier comprising a structure for improving the uniformity in light receiving sensitivity. This photomultiplier comprises a positioning structure for precisely positioning, with respect to the light receiving surface of a photocathode, a lens element which guides light to be detected to a photocathode and constitutes a part of an envelope accommodating the photocathode. The precisely positioned lens element guides the light to be detected into, of the light receiving surface of the photocathode, an effective region where the light receiving sensitivity is high, thereby restraining the light to be detected from reaching the outside of the effective region.
Abstract:
A photomultiplier is constituted by a photocathode and an electron multiplier having a typical structure in which a dynode unit having a plurality of dynode plates stacked in an incident direction of photoelectrons, an anode plate, and an inverting dynode plate are sequentially stacked. Through holes for injecting a metal vapor are formed in the inverting dynode plate to form secondary electron emitting layers on the surfaces of dynodes supported by the dynode plates, and the photocathode. With this structure, the secondary electron emitting layers are uniformly formed on the surfaces of the dynodes. Therefore, variations in output signals obtained from anodes can be reduced regardless of the positions of the photocathode.
Abstract:
A photomultiplier includes a photocathode and an electron multiplier. A typical structure of the electron multiplier is obtained such that a dynode unit constituted by stacking a plurality of dynode plates in the incident direction of photoelectrons, an anode plate, and an inverting dynode plate are stacked. The anode plate has electron through holes at a predetermined portion to cause secondary electrons emitted from the dynode unit to pass therethrough. Each electron through hole has a diameter on the inverting dynode plate side larger than that on the dynode unit side, thereby increasing the capture area of the secondary electrons orbit-inverted by the inverting dynode plate.
Abstract:
A photomultiplier has a focusing electrode plate for supporting focusing electrodes, provided between a photocathode and a dynode unit. Since the focusing electrode plate has holding springs which are integrally formed with the focusing electrode plate, resistance-welding becomes unnecessary to prevent field discharge. A concave portion is formed in a main surface of the focusing electrode plate to arrange an insulating member sandwiched between the focusing electrode plate and the photoelectron incidence side of the dynode unit and partially in contact with the concave portion. With this structure, discharge between the focusing electrode plate and the dynode unit can be prevented.
Abstract:
A photomultiplier which can be easily made compact has a dynode unit having a plurality of dynode plates stacked in an electron incident direction in a vacuum container fabricated by a housing and a base member integrally formed with the housing. Each dynode plate is constituted by welding at least two plates overlapping each other. The welding positions do not overlap each other in the stacking direction of the dynode plates. With this structure, field discharge at the welding portions between the dynode plates can be prevented to reduce noise.