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公开(公告)号：US20230127522A1
公开(公告)日：2023-04-27
申请号：US17910362
申请日：2021-02-22
发明人： Masahiro KAWAGUCHI
摘要： A clamp-type AC voltage probe includes: a clamp portion that clamps a cable to be measured; an electrode disposed to be opposed to the cable clamped by the clamp portion; a parallel circuit in which a capacitor and a resistance are connected in parallel, and one end of which is connected to the electrode; a resistance one end of which is connected to the other end of the parallel circuit and the other end of which is connected to a circuit ground; a capacitor one end of which is connected to the other end of the parallel circuit and the other end of which is connected to the circuit ground; and an amplifier an input terminal of which is connected to the one end or the other end of the parallel circuit, and that amplifies and outputs a signal input into the input terminal.
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82.发明授权公开(公告)号：US11630125B2
公开(公告)日：2023-04-18
申请号：US16473661
申请日：2017-10-04
申请人： LEONI KABEL GMBH
发明人： Nikolaj Giske , Kim-Thorben Bulik , Bernd Janssen
摘要： The invention relates to an adapter device (10, 110, 210) for positioning at least one conductor (68), such as a conductor pair, for example, of a cable (70) to be measured, which adapter device comprises a receiving device (12) and a holding clamp (14) which can be attached to the receiving device (12). Attaching the holding clamp (14) to the receiving device (12) fixes the holding clamp (14) in position and alignment relative to the receiving device (12). The holding clamp (14) is designed to receive and clamp the at least one conductor (68) of the cable (70) to be measured in sections in order to fix said cable in the position and alignment thereof relative to the holding clamp (14), such that an end section of the at least one conductor (68) extends beyond the holding clamp (14).
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公开(公告)号：US11624673B2
公开(公告)日：2023-04-11
申请号：US17380430
申请日：2021-07-20
申请人： Sick AG
发明人： Markus Bleiziffer , Thomas Graner , Martin Urban
摘要： To enable easy alignment of a leakage outlet according to known guidelines, a connecting device (1) for connecting a sensor (3) to a unit (2) containing a fluid is provided, comprising a first mounting portion (1a) to which the sensor (3) is mountable, a second mounting portion (1b) which is mountable to the unit (2), a central portion (1c) located between the first and second mounting portions (1a and 1b) and a leakage ring (1e) covering the bore (1d) of the central portion (1c), the leakage ring (1e) being sealed and rotatable relative to the central portion (1c), wherein the leakage ring (1e) has a leakage outlet (1f) on its periphery, the leakage outlet (1f) being provided to be located in the region of a lowest position of the periphery of the leakage ring (1e) in an operating position to allow any fluid present to drain.
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公开(公告)号：US11614465B2
公开(公告)日：2023-03-28
申请号：US17222559
申请日：2021-04-05
发明人： Scott Lee Short , Narendra Nagaraj , Fernando D. Gonzalez Tristan , Kevin M. Sullivan , Christopher R. Hamilton
摘要： A diagnostic test instrument for testing power system equipment may include a chassis having a number of bays capable of receiving test circuitry modules, which may be field inserted by a user desiring to perform a particular test. The instrument may include controller circuitry that may sense in each of the bays whether a respective test circuitry module is inserted therein, and then interrogate respective test circuitry modules in each respective bay to identify a type of the respective test circuitry module. Available testing capabilities may be identified according to the type of each of the respective test circuitry modules identified in respective bays. The controller circuitry may output configuration instructions to test circuitry modules, and respective test ports included in each of the respective test circuitry modules may be selectively illuminated as a configuration instruction to visually identify an assigned functionality of the respective test ports.
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公开(公告)号：US20230087704A1
公开(公告)日：2023-03-23
申请号：US17947439
申请日：2022-09-19
申请人： Kistler Holding AG
发明人： Reinhold Buck , Davorin Konic , Patrick Dudler , Martin Giger
摘要： A device for testing at least one plug-in element includes a plug-in element receptacle and a test element receptacle, which are adapted to be movable along a test axis for establishing a plug-in connection. A force sensor is configured and disposed to detect a force along the test axis when the plug-in connection is established. A compensating element is configured and disposed for compensating for an offset between the plug-in element and a test element. The compensating element is configured to be at least partially elastic so that the test element is elastically movable to compensate for alignment deviations from the test axis. A method for testing at least one plug-in element is provided along with a method for producing the compensating element.
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公开(公告)号：US20230083634A1
公开(公告)日：2023-03-16
申请号：US17877660
申请日：2022-07-29
发明人： KARTHIK RANGANATHAN , GILBERTO OSEGUERA , GREGORY CRUZAN , JOE KOETH , IKEDA HIROKI , KIYOKAWA TOSHIYUKI
摘要： An automated test equipment (ATE) includes a test interface board assembly. The test interface board includes a socket configured to provide electrical couplings from the test interface board to a device under test (DUT). The socket is further configured to accept an active thermal interposer (ATI) device while the DUT is disposed in the socket. The socket includes a plurality of spring-loaded roller retention devices configured to retain one or more devices in the socket. The ATE further includes a Z-axis interface plate configured to open the plurality of spring-loaded roller retention devices to enable insertion of the DUT into the socket and an ATI placement plate configured to open the plurality of spring-loaded roller retention devices to enable insertion of the ATI device into the socket.
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公开(公告)号：US20230073230A1
公开(公告)日：2023-03-09
申请号：US17799210
申请日：2021-05-02
申请人： Cohu GmbH
发明人： Markus WAGNER , Johann PÖTZINGER , Alan WHYTE , Kevin LUDWIG , Justin FELTEN
摘要： An automated test equipment (ATE) for testing semiconductor devices, the test equipment comprises a test handler, a spare part, or a contactor socket, and a semiconductor devices tester, The spare part comprises an electronic component for storing and or processing data regarding the spare part or a portion thereof, The test equipment comprises an operator terminal comprising a display or GUI and a data exchange interface which is connected or connectable to the electronic component within the spare part, for at least displaying data stored therein. The ATE further comprises a data buffer unit for buffering the data, a maintenance planning and control unit for planning and controlling maintenance actions of the test equipment, and a dedicated database residing in a control computer.
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公开(公告)号：US20230067209A1
公开(公告)日：2023-03-02
申请号：US17461967
申请日：2021-08-30
发明人： Jian-Ting Chen , Cheng-Han Huang , Kuang-Hua Wang
摘要： A testing apparatus for a semiconductor package includes a circuit board, testing patterns and a socket. The circuit board has a testing region and includes a plurality of testing contacts and a plurality of signal contacts distributed in the testing region. The testing patterns are embedded in the circuit board and electrically connected to the testing contacts, where each of the testing patterns includes a first conductive line and a second conductive line including a main portion and a branch portion connected to main portion. The first conductive line is connected to the main portion. The socket is located on the circuit board and comprising connectors electrically connected to the circuit board, wherein the connectors are configured to transmit electric signals for testing the semiconductor package from the testing apparatus.
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公开(公告)号：US20230060664A1
公开(公告)日：2023-03-02
申请号：US17412889
申请日：2021-08-26
发明人： Ba Duong Phan , Alireza Daneshgar
摘要： A testing apparatus for Devices Under Test (DUTs) includes at least one intake damper and at least one exhaust damper. At least one fan moves recirculated fluid and exterior fluid across one or more DUTs inside the testing apparatus. In one aspect, the testing apparatus includes a door to provide access to a chamber and the door includes at least one channel. At least a portion of the fluid flows through the at least one channel of the door. In another aspect, the door is configured to provide access to a chamber from the front of the chamber and the fluid is moved in a direction across the one or more DUTs substantially from the front of the chamber towards a rear of the chamber.
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公开(公告)号：US11592473B2
公开(公告)日：2023-02-28
申请号：US16909167
申请日：2020-06-23
发明人： Hansang Kwon
摘要： This application relates to a method of preparing a composite material for a semiconductor test socket, and a composite material prepared through the method. In one embodiment, the method includes preparing a powder mixture including (i) a metal powder comprising aluminum or aluminum alloy particles and magnesium particles and (ii) a polymer powder. The method may also include sintering the powder mixture to produce the composite material using a spark plasma sintering (SPS) process. This application also relates to a method of manufacturing a semiconductor test socket, the method including forming an insulating portion of the semiconductor test socket with the composite material. This application further relates to a semiconductor test socket produced through the method.
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