摘要:
A method and apparatus capable of generating and executing large numbers of functional tests for complex digital electronic systems at low cost are presented. The apparatus includes a test generator which uses a decision tree representation of a verification space, derived from a functional specification of the digital electronic system, to generate functional tests. A decision tree representation of a verification space includes an initial goal node, a leaf goal node, and at least one intermediate goal node interconnected by a plurality of directed decision arcs formed between the initial goal node and the leaf goal node. Goal plans assigned to goal nodes include operations which generate functional tests. Functional tests are generated by recursively "walking" the decision tree, the choices of which goal node to visit next being made at random and according to decision weights assigned to each goal node. The decision weights assigned to each goal node in the decision tree may be adjusted to ensure all portions of the verification space are adequately tested. A testing system issues functional tests to both a golden device and a device under test. The testing system compares expected responses from the golden unit to responses from device under test and produces functional test results. Specialized structures called monitors ensure sets of functional tests (i.e., functional test suites) exercise all parts of a system implementation.
摘要:
A method and apparatus capable of generating and executing large numbers of functional tests for complex digital electronic systems at low cost are presented. The apparatus includes a test generator which uses a decision tree representation of a verification space, derived from a functional specification of the digital electronic system, to generate functional tests. A decision tree representation of a verification space includes an initial goal node, a leaf goal node, and at least one intermediate goal node interconnected by a plurality of directed decision arcs formed between the initial goal node and the leaf goal node. Goal plans assigned to goal nodes include operations which generate functional tests. Functional tests are generated by recursively “walking” the decision tree, the choices of which goal node to visit next being made at random and according to decision weights assigned to each goal node. The decision weights assigned to each goal node in the decision tree may be adjusted to ensure all portions of the verification space are adequately tested. A testing system issues functional tests to both a golden device and a device under test. The testing system compares expected responses from the golden unit to responses from device under test and produces functional test results. Specialized structures called monitors ensure sets of functional tests (i.e., functional test suites) exercise all parts of a system implementation.
摘要:
A method, system and apparatus for constructing a comprehensive test plan for a design under test (DUT) using a case analysis graph is provided. Embodiments of the present invention provide for automatically generating test cases of the test plan from the case analysis graph by traversing paths through the case analysis graph to select a sequence of components to be exercised by a DUT. Selection of the components is constrained by one or more rules. The rules, in aspects of the invention, provide for selection of specified components to be included in the sequence of components.
摘要:
A method, system and apparatus for constructing a comprehensive test plan using a case analysis graph is provided. Embodiments of the present invention further provide for automatically generating test cases from a case analysis graph and for measuring functional coverage of the test cases. Additional embodiments of the present invention provide for visualizing both the comprehensive test plan and functional coverage data.
摘要:
A method, system and apparatus for constructing a comprehensive test plan for a design under test (DUT) using a hierarchy of goals to generate test cases are provided. Embodiments of the present invention provide for automatically generating a first test case of the test plan from the goal hierarchy by traversing a path from a starting goal to an ending goal, wherein a first goal in the path has a first definition for one or more of a slot and a method. The ending goal of will then assume the first definition of the slot or method, as needed. A further aspect of the invention is generating a second test case by traversing a second path through the hierarchy. If the second path involves traversing a second goal with a second definition of the slot or method, then the ending goal will assume the second definition of the slot or method, as needed.
摘要:
A method of describing a set of tests capable of being performed on a device under test (DUT) is disclosed. The method includes identifying a scenario space of the DUT.
摘要:
A method of describing a set of tests capable of being performed on a device under test (DUT) is disclosed. The method includes identifying a scenario space of the DUT.