公开(公告)号：US08872534B2

公开(公告)日：2014-10-28

申请号：US13179185

申请日：2011-07-08

申请人： Tommie Edward Berry ,  Alistair Nicholas Sporck

发明人： Tommie Edward Berry ,  Alistair Nicholas Sporck

IPC分类号： G01R31/20 ,  G01R1/073

CPC分类号： G01R1/07342 ,  G01R31/2889

摘要： Methods and apparatus for testing devices using serially controlled intelligent switches have been described. In some embodiments, a probe card assembly can be provided that includes a plurality of integrated circuits (ICs) serially coupled to form a chain, the chain coupled to at least one serial control line, the plurality of ICs including switches coupled to test probes, each of the switches being programmable responsive to a control signal on the at least one serial control line.

摘要翻译： 已经描述了使用串行控制的智能开关来测试装置的方法和装置。 在一些实施例中，可以提供探针卡组件，其包括串联耦合以形成链的多个集成电路（IC），所述链耦合到至少一个串行控制线，所述多个IC包括耦合到测试探针的开关， 每个开关是可响应于至少一个串行控制线上的控制信号来编程的。

公开(公告)号：US20110043233A1

公开(公告)日：2011-02-24

申请号：US12543386

申请日：2009-08-18

申请人： Brian Arkin ,  Alistair Nicholas Sporck

发明人： Brian Arkin ,  Alistair Nicholas Sporck

IPC分类号： G01R1/06 ,  G01R31/00

CPC分类号： G01R31/2889 ,  G01R31/024

摘要： A probe card assembly can include a plurality of probes disposed on a substrate and arranged to contact terminals of a semiconductor wafer. Switches can be disposed on the probe card assembly and provide for selective connection and disconnection of the probes from electrical interconnections on the probe card assembly.

摘要翻译： 探针卡组件可以包括设置在基板上并布置成接触半导体晶片的端子的多个探针。 开关可以放置在探针卡组件上，并提供探头与探针卡组件上的电气互连的选择性连接和断开。

公开(公告)号：US08400176B2

公开(公告)日：2013-03-19

申请号：US12543386

申请日：2009-08-18

申请人： Brian J. Arkin ,  Alistair Nicholas Sporck

发明人： Brian J. Arkin ,  Alistair Nicholas Sporck

IPC分类号： G01R31/00

CPC分类号： G01R31/2889 ,  G01R31/024

摘要： A probe card assembly can include a plurality of probes disposed on a substrate and arranged to contact terminals of a semiconductor wafer. Switches can be disposed on the probe card assembly and provide for selective connection and disconnection of the probes from electrical interconnections on the probe card assembly.

摘要翻译： 探针卡组件可以包括设置在基板上并布置成接触半导体晶片的端子的多个探针。 开关可以放置在探针卡组件上，并提供探头与探针卡组件上的电气互连的选择性连接和断开。

公开(公告)号：US07116119B2

公开(公告)日：2006-10-03

申请号：US11059164

申请日：2005-02-15

申请人： Alistair Nicholas Sporck ,  Makarand S. Shinde

发明人： Alistair Nicholas Sporck ,  Makarand S. Shinde

IPC分类号： G01R31/02

CPC分类号： G01R1/07342

摘要： A probe card assembly includes a printed circuit board with tester contacts for making electrical connections to a semiconductor tester. The probe card assembly also includes a probe head assembly with probes for contacting a semiconductor device under test. One or more daughter cards is mounted to the printed circuit board such that they are substantially coplanar with the printed circuit board. The daughter cards may contain a circuit for processing test data, including test signals to be input into the semiconductor and/or response signals generated by the semiconductor device in response to the test signals.

公开(公告)号：US07977959B2

公开(公告)日：2011-07-12

申请号：US11862751

申请日：2007-09-27

申请人： Tommie Edward Berry ,  Alistair Nicholas Sporck

发明人： Tommie Edward Berry ,  Alistair Nicholas Sporck

IPC分类号： G01R1/02 ,  G01R31/26

CPC分类号： G01R1/07342 ,  G01R31/2889

摘要： Methods and apparatus for testing devices using serially controlled intelligent switches have been described. In some embodiments, a probe card assembly can be provided that includes a plurality of integrated circuits (ICs) serially coupled to form a chain, the chain coupled to at least one serial control line, the plurality of ICs including switches coupled to test probes, each of the switches being programmable responsive to a control signal on the at least one serial control line.

摘要翻译： 已经描述了使用串行控制的智能开关来测试装置的方法和装置。 在一些实施例中，可以提供探针卡组件，其包括串联耦合以形成链的多个集成电路（IC），所述链耦合到至少一个串行控制线，所述多个IC包括耦合到测试探针的开关， 每个开关可响应于至少一个串行控制线上的控制信号来编程。