公开(公告)号：US08704180B2

公开(公告)日：2014-04-22

申请号：US13416244

申请日：2012-03-09

Applicant: Benoît Dupont ,  Aurélie Touvignon ,  Michel Vilain ,  Antoine Dupret

Inventor： Benoît Dupont ,  Aurélie Touvignon ,  Michel Vilain ,  Antoine Dupret

IPC: G01J5/24

CPC classification number: G01J5/24 ,  G01J5/20 ,  G01J5/22 ,  H04N5/3651

Abstract: An infrared radiation detection device comprising: a substrate; a matrix of at least one line of elements for detecting the radiation, each comprising a resistive imaging bolometer, the matrix being formed above the substrate; a bolometer reading circuit, a temperature measuring device for measuring the temperature in at least one point of the substrate; and a compensation circuit and data processing device for correcting the signal formed from each bolometer as a function of the temperature measured in at least one point of the substrate. The compensation circuit and data processing device capable of correcting the signal formed from the imaging bolometer by using a predetermined physical model of the temperature behavior of the signal.

Abstract translation: 一种红外辐射检测装置，包括：基板; 用于检测辐射的至少一行元件的矩阵，每个元件包括电阻成像测辐射热计，所述基体形成在所述衬底上方; 测辐射热量计读取电路，用于测量衬底的至少一个点的温度的温度测量装置; 以及补偿电路和数据处理装置，用于根据在基板的至少一个点测量的温度来校正由每个测辐射热计形成的信号。 该补偿电路和数据处理装置能够通过使用信号的温度特性的预定物理模型来校正由成像测辐射热谱仪形成的信号。

公开(公告)号：US20120211657A1

公开(公告)日：2012-08-23

申请号：US13416244

申请日：2012-03-09

Applicant: Benoit Dupont ,  Aurélie Touvignon ,  Michel Vilain ,  Antoine Dupret

Inventor： Benoit Dupont ,  Aurélie Touvignon ,  Michel Vilain ,  Antoine Dupret

IPC: G01J5/10

CPC classification number: G01J5/24 ,  G01J5/20 ,  G01J5/22 ,  H04N5/3651

Abstract: An infrared radiation detection device comprising: a substrate; a matrix of at least one line of elements for detecting said radiation, each comprising a resistive imaging bolometer, said matrix being formed above the substrate; means for reading the bolometers of the matrix, means for measuring the temperature in at least one point of the substrate; and means for correcting the signal formed from each bolometer as a function of the temperature measured in at least one point of the substrate. The correcting means are capable of correcting the signal formed from the imaging bolometer by means of a predetermined physical model of the temperature behaviour of said signal.

Abstract translation: 一种红外辐射检测装置，包括：基板; 用于检测所述辐射的至少一行元件的矩阵，每个元件包括电阻成像测辐射热计，所述矩阵形成在所述衬底上; 用于读取基质的辐射热测量仪的装置，用于测量衬底的至少一个点的温度的装置; 以及用于根据在基板的至少一个点测量的温度来校正由每个测辐射热计形成的信号的装置。 校正装置能够通过所述信号的温度特性的预定物理模型校正由成像测辐射热谱仪形成的信号。

公开(公告)号：US08158942B2

公开(公告)日：2012-04-17

申请号：US12956350

申请日：2010-11-30

Applicant: Benoît Dupont ,  Aurélie Touvignon ,  Michel Vilain ,  Antoine Dupret

Inventor： Benoît Dupont ,  Aurélie Touvignon ,  Michel Vilain ,  Antoine Dupret

IPC: G01J5/24

CPC classification number: G01J5/20 ,  G01J5/22 ,  G01J5/24 ,  H04N5/3651

Abstract: A device for detecting infrared radiation including a matrix of resistive imaging bolometers above a substrate, a read circuit forming an analog electrical signal constituting an image of the infrared radiation impinging on the matrix, a probe for measuring the temperature of the substrate, an ADC for converting the analogue electrical signals from the read circuit and probe, and a data processing unit for correcting the signal formed by the read circuit according digital values NC(i,j) corresponding to electrical signals from the bolometers exposed to a uniform scene at the measured temperature of the substrate. The data processing unit including a unit for computing the digital values NC(i,j) based on a single set of parameters of a predetermined physical model of the read circuit electrical signals and corresponding to the exposure of the matrix of imaging bolometers to a temperature substantially equal to the measured substrate temperature.

Abstract translation: 一种用于检测红外辐射的装置，包括在衬底上方的电阻成像测辐射热表的矩阵，形成构成射入基体的红外辐射的图像的模拟电信号的读取电路，用于测量衬底的温度的探针， 转换来自读取电路和探针的模拟电信号，以及数据处理单元，用于根据与所测量的暴露于均匀场景的辐射热计的电信号对应的数字值NC（i，j）校正由读取电路形成的信号 基板的温度。 数据处理单元包括用于基于读取电路电信号的预定物理模型的单个参数集计算数字值NC（i，j）的单元，并且对应于成像测辐射热矩阵的曝光与温度 基本上等于测量的基板温度。

公开(公告)号：US20110068272A1

公开(公告)日：2011-03-24

申请号：US12956350

申请日：2010-11-30

Applicant: Benoît Dupont ,  Aurélie Touvignon ,  Michel Vilain ,  Antoine Dupret

Inventor： Benoît Dupont ,  Aurélie Touvignon ,  Michel Vilain ,  Antoine Dupret

IPC: G01J5/26 ,  G01J5/02

CPC classification number: G01J5/20 ,  G01J5/22 ,  G01J5/24 ,  H04N5/3651

Abstract: An infrared radiation detection device comprising: a substrate; a matrix of at least one line of elements for detecting said radiation, each comprising a resistive imaging bolometer, said matrix being formed above the substrate; means for reading the bolometers of the matrix, means for measuring the temperature in at least one point of the substrate; and means for correcting the signal formed from each bolometer as a function of the temperature measured in at least one point of the substrate. The correcting means are capable of correcting the signal formed from the imaging bolometer by means of a predetermined physical model of the temperature behaviour of said signal.

Abstract translation: 一种红外辐射检测装置，包括：基板; 用于检测所述辐射的至少一行元件的矩阵，每个元件包括电阻成像测辐射热计，所述矩阵形成在所述衬底上; 用于读取基质的辐射热测量仪的装置，用于测量衬底的至少一个点的温度的装置; 以及用于根据在基板的至少一个点测量的温度来校正由每个测辐射热计形成的信号的装置。 校正装置能够通过所述信号的温度特性的预定物理模型校正由成像测辐射热谱仪形成的信号。