Combined Laser Processing System and Focused Ion Beam System
    2.
    发明申请
    Combined Laser Processing System and Focused Ion Beam System 有权
    组合激光加工系统和聚焦离子束系统

    公开(公告)号:US20130323937A1

    公开(公告)日:2013-12-05

    申请号:US13905085

    申请日:2013-05-29

    申请人: Carl Kuebler

    发明人: Carl Kuebler

    IPC分类号: H01L21/268

    摘要: A processing system for forming a cross-section of an object. The processing system comprises a focused ion beam system for forming the cross-section from a pre-prepared surface region of the object and a laser and a light optical system for forming the pre-prepared surface region by laser ablation of a processing region of the object with a first and a second laser beam. The light optical system is configured to direct the first and the second laser beams onto common impingement locations of a common scanning line in the processing region for scanning the first laser beam and for scanning the second laser beam. For each of the impingement locations, an angle between a first incidence direction along an axis of the first laser beam and a second incidence direction along an axis of the second laser beam is greater than 10 degrees,

    摘要翻译: 一种用于形成物体的横截面的处理系统。 处理系统包括聚焦离子束系统,用于从物体的预制表面区域形成横截面,激光和光学系统用于通过激光烧蚀来形成预制表面区域 物体具有第一和第二激光束。 光学系统被配置为将第一和第二激光束引导到处理区域中的公共扫描线的共同冲击位置上,用于扫描第一激光束并用于扫描第二激光束。 对于每个冲击位置,沿着第一激光束的轴线的第一入射方向和沿着第二激光束的轴线的第二入射方向之间的角度大于10度,