Method and system for centrally-controlled semiconductor wafer correlation
    1.
    发明授权
    Method and system for centrally-controlled semiconductor wafer correlation 有权
    中央控制半导体晶片相关的方法和系统

    公开(公告)号:US07403864B2

    公开(公告)日:2008-07-22

    申请号:US11556724

    申请日:2006-11-06

    IPC分类号: G01R31/01 G01N37/00

    CPC分类号: G01R31/2894

    摘要: A centrally-controlled correlation system for testing a correlation wafer and comparing the testing results with the wafer's reference data that has been determined previously. The testing instructions and the correlation criteria are stored and transmitted from a central database. Such centrally-controlled correlation system improves the reliability of the correlation results and reduces the time to correlate a correlation wafer.

    摘要翻译: 一种用于测试相关晶片并将测试结果与先前已确定的晶片参考数据进行比较的中央控制相关系统。 测试指令和相关标准从中央数据库存储和发送。 这种中央控制的相关系统提高了相关结果的可靠性,并减少了相关晶片的相关时间。

    FLEXIBLE DISPLAY
    2.
    发明申请

    公开(公告)号:US20220147103A1

    公开(公告)日:2022-05-12

    申请号:US17506690

    申请日:2021-10-21

    IPC分类号: G06F1/16

    摘要: A flexible display, including a stand, a supporting mechanism, a flexible screen, a driving component, a driven component, and a link, is provided. The supporting mechanism is connected to the stand. The flexible screen is attached to the supporting mechanism. The driving component is disposed on the stand. The driven component is disposed on a side of the supporting mechanism distant from the stand. The link has a first end and a second end opposite to the first end. The first end is connected to the driving component, and the second end is connected to the driven component. The driving component drives the driven component through the link to move on a first horizontal plane to drive the supporting mechanism and the flexible screen to transform when the driving component moves between the first horizontal plane and a second horizontal plane that is parallel to the first horizontal plane.

    Flexible display
    5.
    发明授权

    公开(公告)号:US11983041B2

    公开(公告)日:2024-05-14

    申请号:US17506690

    申请日:2021-10-21

    IPC分类号: H05K1/18 G06F1/16

    CPC分类号: G06F1/1652 G06F1/1681

    摘要: A flexible display, including a stand, a supporting mechanism, a flexible screen, a driving component, a driven component, and a link, is provided. The supporting mechanism is connected to the stand. The flexible screen is attached to the supporting mechanism. The driving component is disposed on the stand. The driven component is disposed on a side of the supporting mechanism distant from the stand. The link has a first end and a second end opposite to the first end. The first end is connected to the driving component, and the second end is connected to the driven component. The driving component drives the driven component through the link to move on a first horizontal plane to drive the supporting mechanism and the flexible screen to transform when the driving component moves between the first horizontal plane and a second horizontal plane that is parallel to the first horizontal plane.

    Test time forecast system and method thereof
    6.
    发明申请
    Test time forecast system and method thereof 审中-公开
    测试时间预报系统及其方法

    公开(公告)号:US20060100844A1

    公开(公告)日:2006-05-11

    申请号:US10983817

    申请日:2004-11-08

    IPC分类号: G06F13/10

    摘要: A system and method thereof for test time forecasting. The system comprises a storage device and a first program module. The storage device stores Circuit Probing (CP) test records individually storing information regarding a test time and a yield of a test unit corresponding to a test program. The first program module receives the CP test records and generates a new test time forecast model according to the CP test records. The new test time forecast model determines a dependent variable corresponding to the test time by utilizing an independent variable corresponding to the yield.

    摘要翻译: 一种用于测试时间预测的系统及其方法。 该系统包括存储装置和第一程序模块。 存储装置存储单独存储与测试程序对应的测试时间和测试单元的产量的信息的电路测试(CP)测试记录。 第一个程序模块接收CP测试记录,并根据CP测试记录生成新的测试时间预测模型。 新的测试时间预测模型通过利用与产量相对应的独立变量来确定与测试时间相对应的因变量。