Deflection analysis system and method for circuit design
    2.
    发明申请
    Deflection analysis system and method for circuit design 失效
    偏转分析系统及电路设计方法

    公开(公告)号:US20070174796A1

    公开(公告)日:2007-07-26

    申请号:US11336524

    申请日:2006-01-20

    IPC分类号: G06F17/50

    CPC分类号: G06F17/50

    摘要: A system, a method and a computer program product for analyzing a circuit design provide for discretizing the circuit design into a series of pixels. A fraction of at least one constituent material is determined for each pixel. A deflection is also determined for each pixel. The deflection is predicated upon a planarizing of the pixel, and it is calculated while utilizing an algorithm that includes the fraction of the at least one constituent material. A series of deflections for the series of pixels may be mapped and evaluated.

    摘要翻译: 用于分析电路设计的系统,方法和计算机程序产品提供将电路设计离散成一系列像素。 确定每个像素的至少一个构成材料的一部分。 还为每个像素确定偏转。 该偏转基于像素的平面化,并且在利用包括至少一个构成材料的分数的算法的同时进行计算。 可以映射和评估一系列像素的一系列偏转。