Design structures of and simplified methods for forming field emission microtip electron emitters
    2.
    发明授权
    Design structures of and simplified methods for forming field emission microtip electron emitters 失效
    用于形成场发射微带电子发射体的设计结构和简化方法

    公开(公告)号:US06771011B2

    公开(公告)日:2004-08-03

    申请号:US10383966

    申请日:2003-03-07

    IPC分类号: H01J1304

    CPC分类号: H01J9/025

    摘要: Electron emission structures formed using standard semiconductor processes on a substrate first prepared with a topographical feature are disclosed. At least one layer of a first material is concurrently deposited on the substrate and etched from the substrate to form an atomically sharp feature. An at least one layer of a second material is deposited over the atomically sharp feature. A conductive layer is deposited over the at least one layer of the second material. A selected area of material is removed from the conductive layer and the at least one layer of second material to expose the atomically sharp feature. Finally, electrical connectivity is provided to elements of the electron emission structure.

    摘要翻译: 公开了首先使用形貌特征制备的基板上使用标准半导体工艺形成的电子发射结构。 至少一层第一材料同时沉积在衬底上并从衬底上蚀刻以形成原子锋利的特征。 在原子锋利特征上沉积至少一层第二材料。 导电层沉积在第二材料的至少一层上。 从导电层和至少一层第二材料中去除选择的材料区域以暴露原子锋利的特征。 最后,电连接被提供给电子发射结构的元件。

    Methods for forming microtips in a field emission device
    3.
    发明授权
    Methods for forming microtips in a field emission device 有权
    在场发射装置中形成微尖的方法

    公开(公告)号:US06572425B2

    公开(公告)日:2003-06-03

    申请号:US09820338

    申请日:2001-03-28

    IPC分类号: H01J902

    CPC分类号: H01J9/025

    摘要: Electron emission structures formed using standard semiconductor processes on a substrate first prepared with a topographical feature are disclosed. At least one layer of a first material is concurrently deposited on the substrate and etched from the substrate to form an atomically sharp feature. An at least one layer of a second material is deposited over the atomically sharp feature. A conductive layer is deposited over the at least one layer of the second material. A selected area of material is removed from the conductive layer and the at least one layer of second material to expose the atomically sharp feature. Finally, electrical connectivity is provided to elements of the electron emission structure.

    摘要翻译: 公开了首先使用形貌特征制备的基板上使用标准半导体工艺形成的电子发射结构。 至少一层第一材料同时沉积在衬底上并从衬底上蚀刻以形成原子锋利的特征。 在原子锋利特征上沉积至少一层第二材料。 导电层沉积在第二材料的至少一层上。 从导电层和至少一层第二材料中去除选择的材料区域以暴露原子锋利的特征。 最后,电连接被提供给电子发射结构的元件。