Method for determining a hydrodynamic size of an object

    公开(公告)号:US10794816B2

    公开(公告)日:2020-10-06

    申请号:US15780695

    申请日:2016-12-02

    摘要: The disclosure relates to a method for determining a hydrodynamic size of an object, such as a nano-sized object, said method comprising the steps of: —providing a fluid interface, —linking said object to said fluid interface thereby providing a linked object, whereby the movement of said linked object is restricted by virtue of being linked to said fluid interface, —providing and determining a hydrodynamic shear force that acts on said linked object, —tracking the movement of said linked object, and —calculating the hydrodynamic size of the object using the Einstein-Smoluchowski relation.

    WAVEGUIDE STRUCTURE
    4.
    发明申请
    WAVEGUIDE STRUCTURE 有权
    波形结构

    公开(公告)号:US20160153888A1

    公开(公告)日:2016-06-02

    申请号:US14901639

    申请日:2014-06-26

    摘要: A waveguide structure for evanescent wave microscopy and/or spectroscopy, comprising an optically transparent core layer, a lower dielectric cladding layer and an upper dielectric cladding layer arranged on opposite sides of the core layer. The core layer has a refractive index higher than the refractive indices of the cladding layers. The upper cladding layer is made of an organic material. A sample well is arranged on an upper surface of the core layer formed by a cavity in the upper cladding layer, the sample well being adapted to contain a sample medium with one or more sample objects. The core layer is made of a first dielectric inorganic material, and the upper cladding layer has a refractive index which closely matches the refractive index of the sample medium. A method for manufacturing such waveguide structure, and a measurement system comprising the waveguide structure are also disclosed.

    摘要翻译: 一种用于ev逝波显微镜和/或光谱学的波导结构,包括光学透明芯层,下电介质包覆层和布置在芯层相对侧上的上电介质包覆层。 芯层的折射率高于包覆层的折射率。 上覆层由有机材料制成。 样品孔布置在由上包层中的空腔形成的芯层的上表面上,样品阱适于容纳具有一个或多个样品的样品介质。 芯层由第一介电无机材料制成,并且上包层具有与样品介质的折射率紧密匹配的折射率。 还公开了一种用于制造这种波导结构的方法,以及包括波导结构的测量系统。