Abstract:
An electric power steering apparatus comprises a transmission mechanism having a drive gear and a driven gear. One end of the drive gear is supported by a bearing hole in a housing through a bearing and a curved plate spring. The curved plate spring comprises a main body surrounding the bearing and at least one crank-shaped elastic tongue supported by at least one of ends of the main body. A recess formed on an inner peripheral surface of the bearing hole has a bottom and a pair of inner wall surfaces opposed to each other in the circumferential direction of the bearing hole. A relief portion for avoiding contact with a connection portion of the elastic tongue is formed between at least one of the inner wall surfaces and the inner peripheral surface of the bearing hole. A boundary between the relief portion and the inner peripheral surface of the bearing hole is engaged with the main body of the curved plate spring, to restrict the movement of the main body in the circumferential direction.
Abstract:
An electric power steering apparatus comprises a transmission mechanism having a drive gear and a driven gear. One end of the drive gear is supported by a bearing hole in a housing through a bearing and a curved plate spring. The curved plate spring comprises a main body surrounding the bearing and at least one crank-shaped elastic tongue supported by at least one of ends of the main body. A recess formed on an inner peripheral surface of the bearing hole has a bottom and a pair of inner wall surfaces opposed to each other in the circumferential direction of the bearing hole. A relief portion for avoiding contact with a connection portion of the elastic tongue is formed between at least one of the inner wall surfaces and the inner peripheral surface of the bearing hole. A boundary between the relief portion and the inner peripheral surface of the bearing hole is engaged with the main body of the curved plate spring, to restrict the movement of the main body in the circumferential direction.
Abstract:
A main object of the invention is to provide a reflective mask for EUV lithography, which may detect an alignment mark by transmission. The invention achieves the object by providing a reflective mask comprising a substrate, a multilayer formed on one side of the substrate, an intermediate layer formed on the multilayer, an absorber formed in pattern on the substrate on which the multilayer and the intermediate layer are formed, and a conductive layer formed on the other side of the substrate, wherein the pattern of the absorber constitutes a circuit pattern and an alignment mark, and in an alignment region where the alignment mark is provided, the other side of the substrate is exposed.
Abstract:
An electric power steering system is provided, which comprises a steering assist electric motor, and a reduction gear mechanism for reducing a rotation speed of a rotatable shaft of the electric motor. The reduction gear mechanism comprises a worm shaft driven by the rotatable shaft, and a worm wheel driven by the warm shaft. The electric power steering system further comprises a joint for coupling the rotatable shaft to the worm shaft for transmission of a driving force. Longitudinally biasing means is provided in association with the joint for longitudinally biasing the worm shaft.
Abstract:
A inspection image data of the chip A is captured and the data representing the amount of correction of flare corresponded to the chip A is appropriately loaded from the map storage block. Next, a inspection image of the chip A′ is captured, and the data representing the amount of correction of flare corresponded to the chip A′ is loaded from the flare map storage block as the amount of shifting of the edge of the contour of the pattern. The amount of correction is converted, by a correction data generation block which is a correction data generator, into the amount of geometrical correction of pattern which provides correction data. In the comparison block, the images of the geometry of two chips are compared and corrected on the amount of correction of flare generated by a correction data generation block, to thereby judge whether defect is found or not.
Abstract:
A inspection image data of the chip A is captured and the data representing the amount of correction of flare corresponded to the chip A is appropriately loaded from the map storage block. Next, a inspection image of the chip A′ is captured, and the data representing the amount of correction of flare corresponded to the chip A′ is loaded from the flare map storage block as the amount of shifting of the edge of the contour of the pattern. The amount of correction is converted, by a correction data generation block which is a correction data generator, into the amount of geometrical correction of pattern which provides correction data. In the comparison block, the images of the geometry of two chips are compared and corrected on the amount of correction of flare generated by a correction data generation block, to thereby judge whether defect is found or not.
Abstract:
A main object of the invention is to provide a reflective mask for EUV lithography, which may detect an alignment mark by transmission. The invention achieves the object by providing a reflective mask comprising a substrate, a multilayer formed on one side of the substrate, an intermediate layer formed on the multilayer, an absorber formed in pattern on the substrate on which the multilayer and the intermediate layer are formed, and a conductive layer formed on the other side of the substrate, wherein the pattern of the absorber constitutes a circuit pattern and an alignment mark, and in an alignment region where the alignment mark is provided, the other side of the substrate is exposed.