Abstract:
A semiconductor integrated circuit formed on an insulator substrate and comprising a drive transistor and a load transistor, in which a threshold voltage of the load transistor is set in the range of -2.8V to -1.0V so as to ensure stable operation without temperature dependency with respect to working speed and power consumption of the circuit.
Abstract:
In an apparatus for forming a single crystal semiconductor layer from a non-single-crystalline semiconductor material by scanning a region of the material with an electron beam, a first pair of deflection electrodes and a second pair of deflection electrodes, both pairs being provided in the path of the electron beam. A deflection signal generated by modifying the amplitude of a high-frequency fundamental wave signal with a modulation wave signal having a frequency lower than that of the high-frequency fundamental wave signal is supplied to the deflection electrodes of the first pair. The electrodes rapidly deflect the electron beam in a first direction, while changing the range of deflecting the beam, thereby forming a locus of the beam spot on the sample. Simultaneously, the deflection electrodes of the second pair deflect the beam in a second direction, thereby annealing a region of the material, to form a single crystal semiconductor layer.
Abstract:
A method for the manufacture of semiconductor devices comprises the steps of forming a number of mutually electrically isolated semiconductor islands on an insulating substrate and cutting a semiconductor wafer, made of semiconductor elements and substrate, along its dicing line to provide a number of semiconductor chips, the method characterized in that additional semiconductor islands are formed on the insulating substrate simultaneously with, or after, the formation of the first-mentioned semi-conductor islands so that each substantially surrounds the chip. The method permits very easy mask alignments for photoengraving as well as a clear judgment as to whether or not the formation of contact openings has been completed.
Abstract:
A semiconductor device having silicon-on-sapphire structure in which a pn junction element is formed in a silicon substrate disposed on a sapphire plate. An oxide layer is formed in the surface area of the p-type region which serves to form the pn junction elements.
Abstract:
An insulated-gate field-effect transistor having improved high-speed operation characteristics and high channel controllability includes a source region having first and second diffused regions and a drain region having first and second diffused regions. The first diffused regions of both the source and drain regions are formed by diffusion of a first impurity having relatively low diffusion coefficient and the second diffused regions of both the source and drain regions are formed by diffusion of a second impurity having relatively high diffusion coefficient.
Abstract:
In an apparatus for forming a single crystal semiconductor layer from a non-single-crystalline semiconductor material by scanning a region of the material with an electron beam, a first pair of deflection electrodes and a second pair of deflection electrodes, both pairs being provided in the path of the electron beam. A deflection signal generated by modifying the amplitude of a high-frequency fundamental wave signal with a modulation wave signal having a frequency lower than that of the high-frequency fundamental wave signal is supplied to the deflection electrodes of the first pair. The electrodes rapidly deflect the electron beam in a first direction, while changing the range of deflecting the beam, thereby forming a locus of the beam spot on the sample. Simultaneously, the deflection electrodes of the second pair deflect the beam in a second direction, thereby annealing a region of the material, to form a single crystal semiconductor layer.
Abstract:
A MOS integrated circuit comprises a MOS IC body including at least one MOS transistor made of an island-like semiconductor layer formed on an insulating substrate, and a protective circuit connected between a signal input terminal and the gate electrode of a MOS transistor at least at an input stage of the MOS IC body and adapted to protect the MOS integrated circuit against an irregular input signal. The protective circuit is also connected between ground and the gate electrode of the MOS transistor at the input stage of the MOS IC body and comprises a protective MOS transistor made of an island-like semiconductor layer formed on the insulating substrate in a manner to be arranged in juxtaposition with the MOS transistor at the input stage of the MOS IC body, a resistor connected between the signal input terminal and the gate circuit of the MOS transistor as the input stage of the MOS IC body the resistor being formed on a grounded insulating layer on the semiconductor layer overlying the insulating substrate to provide a stray capacitance therebetween, the resistor being formed in juxtapositon with the protective MOS transistor.
Abstract translation:MOS集成电路包括:MOS IC体,其包括至少一个MOS晶体管,所述MOS晶体管由形成在绝缘基板上的岛状半导体层构成;以及保护电路,其连接在MOS晶体管的信号输入端和栅极之间,至少在 MOS IC体的输入级,适于保护MOS集成电路不受不规则输入信号的影响。 保护电路也连接在MOS晶体管的输入级的MOS晶体管的接地端和栅电极之间,并且包括由绝缘基板上形成的岛状半导体层构成的保护MOS晶体管, 在MOS IC体的输入级与MOS晶体管并置,连接在信号输入端子和MOS晶体管的栅极电路之间的电阻器作为MOS IC体的输入级,电阻器形成在接地绝缘层上 在覆盖绝缘基板的半导体层上提供杂散电容,电阻器与保护MOS晶体管并置形成。