公开(公告)号：US07886258B2

公开(公告)日：2011-02-08

申请号：US12816144

申请日：2010-06-15

Applicant: Mohammed Ouali ,  Jason Abt ,  Edward Keyes ,  Vyacheslav Zavadsky

Inventor： Mohammed Ouali ,  Jason Abt ,  Edward Keyes ,  Vyacheslav Zavadsky

IPC: G06F17/50

CPC classification number: G06F17/5068 ,  G06K9/623

Abstract: A method and apparatus to reduce occurrences of electrically non-functional elements, known as dummy features, from a source data structure is described. The source data structure may be image data, a vector based data structure or some other data format. Dummy features in the source data structure are detected and then deleted. Dummy features may be detected by selecting a representative dummy feature, using it as a reference pattern or polygon and comparing it to features in the source data structure. The step of comparing the selected reference to the comprises selecting a cut-off correlation threshold value, and computing the correlation coefficients between the reference and the feature. Features are selectively removed based on a comparison between their correlation coefficients and the selected cut-off correlation threshold value. This threshold value may require updating to remove all dummy features in the source data structure. When different shaped dummy features in the same data structure are encountered, a further reference feature may be selected and the process repeated.

Abstract translation: 描述了从源数据结构中减少电非功能元件（称为虚拟特征）的发生的方法和装置。 源数据结构可以是图像数据，基于向量的数据结构或一些其他数据格式。 检测源数据结构中的虚拟特征，然后删除。 可以通过选择代表性的虚拟特征，将其用作参考图案或多边形并将其与源数据结构中的特征进行比较来检测虚拟特征。 将所选择的参考与比较的步骤包括选择截止相关阈值，以及计算参考和特征之间的相关系数。 基于它们的相关系数和所选择的截止相关阈值之间的比较来选择性地去除特征。 该阈值可能需要更新以去除源数据结构中的所有虚拟特征。 当遇到相同数据结构中的不同形状的虚拟特征时，可以选择另外的参考特征并重复该过程。

公开(公告)号：US20070256037A1

公开(公告)日：2007-11-01

申请号：US11411593

申请日：2006-04-26

Applicant: Vyacheslav Zavadsky ,  Edward Keyes ,  Sergei Sourjko ,  Val Gont ,  Stephen Begg ,  Jason Abt

Inventor： Vyacheslav Zavadsky ,  Edward Keyes ,  Sergei Sourjko ,  Val Gont ,  Stephen Begg ,  Jason Abt

IPC: G06F17/50

CPC classification number: G06F17/5045

Abstract: The present invention provides an accurate and efficient method of organizing circuitry from a net-list of an integrated circuit, by the steps of generating a reference pattern; identifying the potential matches in the net-list using inexact graph matching; further analyzing the matches to determine if they match the reference pattern; and organizing the net-list into a hierarchy by replacing the identified instances with higher-level representations.

Abstract translation: 本发明提供一种通过产生参考图案的步骤从集成电路的网络列表组织电路的精确和有效的方法; 使用不精确的图匹配来识别网络列表中的潜在匹配; 进一步分析匹配以确定它们是否匹配参考模式; 并通过用更高级别的表示替换所识别的实例来将网络列表组织成层次结构。

公开(公告)号：US07207018B2

公开(公告)日：2007-04-17

申请号：US10910624

申请日：2004-08-04

Applicant: Vyacheslav L. Zavadsky ,  Elmehdi Aitnouri ,  Edward Keyes ,  Jason Abt ,  Val Gont ,  Stephen Begg

Inventor： Vyacheslav L. Zavadsky ,  Elmehdi Aitnouri ,  Edward Keyes ,  Jason Abt ,  Val Gont ,  Stephen Begg

IPC: G06F17/50

CPC classification number: G06F17/5081

Abstract: The method and apparatus in accordance with the present invention determines the locations of incorrectly connected polygons in a polygon representation of an integrated circuit layout. These incorrectly connected polygons result in short circuits, which often occur for major signal busses such as power and ground. It can be time-consuming to determine the exact location of the short. The invention includes the step of tessellating the polygon representation, including each conductive layer, into predetermined shapes such as triangles or trapezoids. Each of the triangles or trapezoids is then translated into a node for the development of a nodal network where nodes are connected directly to one another to represent shapes having edges adjacent to other shape edges. The current capacity of each connection between adjacent nodes is then specified. Two nodes that are electrically connected to the incorrectly connected polygons are selected and used as parameters for a network flow analysis algorithm. This algorithm determines the areas of high density where high flow is dictated by the triangle or trapezoid having the lowest current capacity. The areas of high density are flagged as points where short circuits may exist. These flagged points may then be investigated to confirm whether they are short circuits.

Abstract translation: 根据本发明的方法和装置确定在集成电路布局的多边形表示中不正确连接的多边形的位置。 这些不正确连接的多边形导致短路，这通常发生在诸如电源和地面之类的主要信号总线上。 确定短路的确切位置可能是耗时的。 本发明包括将包括每个导电层的多边形表示细分为预定形状（例如三角形或梯形）的步骤。 然后，每个三角形或梯形被转换成节点以开发节点，其中节点彼此直接相连以表示具有与其它形状边缘相邻的边缘的形状。 然后指定相邻节点之间的每个连接的当前容量。 电连接到不正确连接的多边形的两个节点被选择并用作网络流分析算法的参数。 该算法确定了高流量由具有最低电流容量的三角形或梯形决定的高密度区域。 高密度区域被标记为可能存在短路的点。 然后可以调查这些标记点以确认它们是否是短路。

公开(公告)号：US07013028B2

公开(公告)日：2006-03-14

申请号：US09920937

申请日：2001-08-03

Applicant: Val Gont ,  Jason Abt ,  Larry Lam

Inventor： Val Gont ,  Jason Abt ,  Larry Lam

IPC: G06K9/00

CPC classification number: G06F17/5081 ,  G06F17/5045 ,  G06F2217/02 ,  G06F2217/74 ,  Y10S706/919

Abstract: An editor in a computer system for editing an schematic having a number of pages. The editor may cut a selected portion of the schematic from any one of the schematic pages, paste the cut portion of the schematic onto any one of the schematic pages, and connect nets located on the same schematic page. The editor may search for objects such as signal labels and cells within the schematic netlist as well as other editing functions. Further a navigator is provided for interactively viewing netlist data from a high level schematic where the data includes schematic page numbers, cell names, nets, signal labels and segments. The project viewer software and project schematic netlist data may be contained in a computer-readable medium. The project viewer software controls output schematic images and enables a user to view, trace and search objects throughout the project netlist data.

公开(公告)号：US08219940B2

公开(公告)日：2012-07-10

申请号：US11174732

申请日：2005-07-06

Applicant: Mohammed Ouali ,  Jason Abt ,  Edward Keyes ,  Vyacheslav Zavadsky

Inventor： Mohammed Ouali ,  Jason Abt ,  Edward Keyes ,  Vyacheslav Zavadsky

IPC: G06F17/50

CPC classification number: G06F17/5068 ,  G06K9/623

Abstract: A method and apparatus to reduce occurrences of electrically non-functional elements, known as dummy features, from a source data structure is described. The source data structure may be image data, a vector based data structure or some other data format. Dummy features in the source data structure are detected and then deleted. Dummy features may be detected by selecting a representative dummy feature, using it as a reference pattern or polygon and comparing it to features in the source data structure. The step of comparing the selected reference to the comprises selecting a cut-off correlation threshold value, and computing the correlation coefficients between the reference and the feature. Features are selectively removed based on a comparison between their correlation coefficients and the selected cut-off correlation threshold value. This threshold value may require updating to remove all dummy features in the source data structure. When different shaped dummy features in the same data structure are encountered, a further reference feature may be selected and the process repeated.

Abstract translation: 描述了从源数据结构中减少电非功能元件（称为虚拟特征）的发生的方法和装置。 源数据结构可以是图像数据，基于向量的数据结构或一些其他数据格式。 检测源数据结构中的虚拟特征，然后删除。 可以通过选择代表性的虚拟特征，将其用作参考图案或多边形并将其与源数据结构中的特征进行比较来检测虚拟特征。 将所选择的参考与比较的步骤包括选择截止相关阈值，以及计算参考和特征之间的相关系数。 基于它们的相关系数和所选择的截止相关阈值之间的比较来选择性地去除特征。 该阈值可能需要更新以去除源数据结构中的所有虚拟特征。 当遇到相同数据结构中的不同形状的虚拟特征时，可以选择另外的参考特征并重复该过程。

公开(公告)号：US07873203B2

公开(公告)日：2011-01-18

申请号：US12200975

申请日：2008-08-29

Applicant: Vyacheslav L. Zavadsky ,  Val Gont ,  Edward Keyes ,  Jason Abt ,  Stephen Begg

Inventor： Vyacheslav L. Zavadsky ,  Val Gont ,  Edward Keyes ,  Jason Abt ,  Stephen Begg

IPC: G06K9/00

CPC classification number: G06T7/001 ,  G01R31/31704 ,  G01R31/318357 ,  G06T7/74 ,  G06T2207/30148

Abstract: The present invention involves a computationally efficient method of determining the locations of standard cells in an image of an IC layout. The initial step extracts and characterizes points of interest of the image. A coarse localization of possible standard cell locations is performed and is based on a comparison of the points of interest of an instance of an extracted standard cell and the remaining points of interest in the image. A more rigid comparison is made on the list of possible locations comprising a coarse match and a fine match. The coarse match results in a shortlist of possible locations. The fine match performs comparisons between the template and the shortlist. Further filtering is done to remove the effects of noise and texture variations and statistics on the results are generated to achieve the locations of the standard cells on the IC layout.

Abstract translation: 本发明涉及一种确定IC布局图像中的标准单元的位置的计算上有效的方法。 初始步骤提取并表征图像的兴趣点。 执行可能的标准单元位置的粗略定位，并且基于提取的标准单元的实例与图像中的剩余兴趣点的兴趣点的比较。 在包括粗匹配和精细匹配的可能位置的列表上进行更刚性的比较。 粗匹配导致可能位置的最后一个列表。 精细比赛会在模板和候选名单之间进行比较。 进行进一步的滤波以消除噪声和纹理变化的影响，并且生成结果的统计以实现标准单元在IC布局上的位置。

公开(公告)号：US07765517B2

公开(公告)日：2010-07-27

申请号：US11976409

申请日：2007-10-24

Applicant: Mohammed Ouali ,  Jason Abt ,  Edward Keyes ,  Vyacheslav Zavadsky

Inventor： Mohammed Ouali ,  Jason Abt ,  Edward Keyes ,  Vyacheslav Zavadsky

IPC: G06F17/50

CPC classification number: G06F17/5068 ,  G06K9/623

Abstract: A method and apparatus to reduce occurrences of electrically non-functional elements, known as dummy features, from a source data structure is described. The source data structure may be image data, a vector based data structure or some other data format. Dummy features in the source data structure are detected and then deleted. Dummy features may be detected by selecting a representative dummy feature, using it as a reference pattern or polygon and comparing it to features in the source data structure. The step of comparing the selected reference to the comprises selecting a cut-off correlation threshold value, and computing the correlation coefficients between the reference and the feature. Features are selectively removed based on a comparison between their correlation coefficients and the selected cut-off correlation threshold value. This threshold value may require updating to remove all dummy features in the source data structure. When different shaped dummy features in the same data structure are encountered, a further reference feature may be selected and the process repeated.

Abstract translation: 描述了从源数据结构中减少电非功能元件（称为虚拟特征）的发生的方法和装置。 源数据结构可以是图像数据，基于向量的数据结构或一些其他数据格式。 检测源数据结构中的虚拟特征，然后删除。 可以通过选择代表性的虚拟特征，将其用作参考图案或多边形并将其与源数据结构中的特征进行比较来检测虚拟特征。 将所选择的参考与比较的步骤包括选择截止相关阈值，以及计算参考和特征之间的相关系数。 基于它们的相关系数和所选择的截止相关阈值之间的比较来选择性地去除特征。 该阈值可能需要更新以去除源数据结构中的所有虚拟特征。 当遇到相同数据结构中的不同形状的虚拟特征时，可以选择另外的参考特征并重复该过程。

公开(公告)号：US07751643B2

公开(公告)日：2010-07-06

申请号：US10916615

申请日：2004-08-12

Applicant: Vyacheslav L. Zavadsky ,  Jason Abt

Inventor： Vyacheslav L. Zavadsky ,  Jason Abt

IPC: G06K9/40

CPC classification number: G06T5/008

Abstract: The present invention provides a method and apparatus for reducing uneven brightness in an image from a particle based image system. This uneven brightness is most often seen as regions of shadow, but may also be seen as regions of over brightness. In cases where the uneven brightness is in the form of shadowing, the method corrects for the shadowy regions by first identifying the area of shadow, obtaining brightness information from a region near the shadow, where the brightness is optimal, applying statistical methods to determine the measured brightness as a regression function of the optimal brightness, and number and proximity of shadowy objects, then correcting the shadow area brightness by calculating the inverse of the function of the shadow brightness. With this method, the brightness within the shadowy or over brightness regions are corrected to appear at a substantially similar level of brightness as the region of optimal brightness in the image.

Abstract translation: 本发明提供了一种降低来自基于粒子的图像系统的图像中的不均匀亮度的方法和装置。 这种不均匀的亮度通常被看作是阴影的区域，但是也可以看作是亮度的区域。 在不均匀亮度为阴影形式的情况下，该方法通过首先识别阴影区域来校正阴影区域，从阴影附近的区域获取亮度信息，其中亮度最佳，应用统计方法来确定 测量亮度作为最佳亮度的回归函数，以及阴影对象的数量和接近度，然后通过计算阴影亮度的函数的倒数来校正阴影区域亮度。 利用该方法，修正阴影或过亮度区域内的亮度，以与图像中的最佳亮度区域基本相似的亮度出现。

公开(公告)号：US07693348B2

公开(公告)日：2010-04-06

申请号：US11201233

申请日：2005-08-10

Applicant: Vyacheslav Zavadsky ,  Jason Abt ,  Mark Braverman ,  Edward Keyes ,  Vladimir Martincevic

Inventor： Vyacheslav Zavadsky ,  Jason Abt ,  Mark Braverman ,  Edward Keyes ,  Vladimir Martincevic

IPC: G06K9/32

CPC classification number: G06T3/4038 ,  G06K2009/2045

Abstract: A method of registering and vertically aligning multiply-layered images into a mosaic is described. The method comprises performing an iterative process of vertical alignment of layers into a mosaic using a series of defined alignment correspondence pairs and global registration of images in a layer using a series of defined registration correspondence points and then redefining the identified alignment correspondence pairs and/or registration correspondence points until a satisfactory result is obtained. Optionally, an initial global registration of each layer could be performed initially before commencing the alignment process. The quality of the result could be determined using a least squares error minimization or other technique.

Abstract translation: 描述了将多层图像注册并垂直排列成马赛克的方法。 该方法包括使用一系列定义的对准对应对和使用一系列定义的注册对应点来对层中的图像进行全局注册，然后重新定义所识别的对准对应对和/或 注册对应点，直到获得令人满意的结果。 可选地，可以在开始对齐过程之前首先执行每个层的初始全局配准。 可以使用最小二乘法误差最小化或其他技术来确定结果的质量。

公开(公告)号：US20080317328A1

公开(公告)日：2008-12-25

申请号：US12200975

申请日：2008-08-29

Applicant: Vyacheslav L. Zavadsky ,  Val Gont ,  Edward Keyes ,  Jason Abt ,  Stephen Begg

Inventor： Vyacheslav L. Zavadsky ,  Val Gont ,  Edward Keyes ,  Jason Abt ,  Stephen Begg

IPC: G06K9/00

CPC classification number: G06T7/001 ,  G01R31/31704 ,  G01R31/318357 ,  G06T7/74 ,  G06T2207/30148

Abstract: The present invention involves a computationally efficient method of determining the locations of standard cells in an image of an IC layout. The initial step extracts and characterizes points of interest of the image. A coarse localization of possible standard cell locations is performed and is based on a comparison of the points of interest of an instance of an extracted standard cell and the remaining points of interest in the image. A more rigid comparison is made on the list of possible locations comprising a coarse match and a fine match. The coarse match results in a shortlist of possible locations. The fine match performs comparisons between the template and the shortlist. Further filtering is done to remove the effects of noise and texture variations and statistics on the results are generated to achieve the locations of the standard cells on the IC layout.