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    Method and apparatus for generation of test bitstreams and testing of close loop transducers
    1.
    发明授权
    Method and apparatus for generation of test bitstreams and testing of close loop transducers 失效
    用于产生测试比特流的方法和装置以及闭环换能器的测试

    公开(公告)号：US6101864A

    公开(公告)日：2000-08-15

    申请号：US992663

    申请日：1997-12-17

    申请人： Michael L. Abrams ,  Ben W. Jones ,  Franklin W. Mayo ,  Scott T. Dupuie ,  Jeffery C. Gannon ,  Richard A. Johnson

    发明人： Michael L. Abrams ,  Ben W. Jones ,  Franklin W. Mayo ,  Scott T. Dupuie ,  Jeffery C. Gannon ,  Richard A. Johnson

    IPC分类号： G01P21/00 ,  G01C17/38

    CPC分类号： G01P21/00

    摘要： A high performance method and apparatus for testing a closed loop transducer is disclosed. A test bitstream signal is combined with a .SIGMA..DELTA. feedback bitstream of the transducer to produce a combined bitstream which is converted to a physical feedback to the sensor of the transducer. The .SIGMA..DELTA. bitstream output of the transducer is recorded for later analysis so as to test characteristics of the transducer. The test bitstream signal is preferably an oversampled, pulse density modulated signal. A testing arrangement is provided which is based upon the storage of short-length test patterns which are repetitively accessed to form a continuous test pattern. The test bitstream provided by the method of the invention produces very low noise and low distortion test signals where a repetitive test pattern is equivalent in length to one period of the test signal.

    摘要翻译： 公开了一种用于测试闭环换能器的高性能方法和装置。 测试比特流信号与换能器的SIGMA DELTA反馈比特流组合以产生被转换成对换能器的传感器的物理反馈的组合比特流。 记录换能器的SIGMA DELTA比特流输出用于后续分析，以便测试换能器的特性。 测试比特流信号优选地是过采样的脉冲密度调制信号。 提供了一种测试装置，其基于重复访问的短长度测试图案的存储，以形成连续的测试图案。 通过本发明的方法提供的测试比特流产生非常低的噪声和低失真测试信号，其中重复测试模式长度与测试信号的一个周期相等。

    Method and apparatus for generation of test bitstreams and testing of closed loop transducers
    2.
    发明授权
    Method and apparatus for generation of test bitstreams and testing of closed loop transducers 有权
    用于产生测试比特流和闭环换能器测试的方法和装置

    公开(公告)号：US6023960A

    公开(公告)日：2000-02-15

    申请号：US304421

    申请日：1999-04-28

    申请人： Michael L. Abrams ,  Ben W. Jones ,  Franklin W. Mayo ,  Scott T. Dupuie ,  Jeffery C. Gannon ,  Richard A. Johnson

    发明人： Michael L. Abrams ,  Ben W. Jones ,  Franklin W. Mayo ,  Scott T. Dupuie ,  Jeffery C. Gannon ,  Richard A. Johnson

    IPC分类号： G01P21/00 ,  G01C17/38

    CPC分类号： G01P21/00

    摘要： A high performance method and apparatus for testing a closed loop transducer is disclosed. A test bitstream signal is combined with a .SIGMA..DELTA. feedback bitstream of the transducer to produce a combined bitstream which is converted to a physical feedback to the sensor of the transducer. The .SIGMA..DELTA. bitstream output of the transducer is recorded for later analysis so as to test characteristics of the transducer. The test bitstream signal is preferably an oversampled, pulse density modulated signal. A testing arrangement is provided which is based upon the storage of short-length test patterns which are repetitively accessed to form a continuous test pattern. The test bitstream provided by the method of the invention produces very low noise and low distortion test signals where a repetitive test pattern is equivalent in length to one period of the test signal.

    摘要翻译： 公开了一种用于测试闭环换能器的高性能方法和装置。 测试比特流信号与换能器的SIGMA DELTA反馈比特流组合以产生被转换成对换能器的传感器的物理反馈的组合比特流。 记录换能器的SIGMA DELTA比特流输出用于后续分析，以便测试换能器的特性。 测试比特流信号优选地是过采样的脉冲密度调制信号。 提供了一种测试装置，其基于重复访问的短长度测试图案的存储，以形成连续的测试图案。 通过本发明的方法提供的测试比特流产生非常低的噪声和低失真测试信号，其中重复测试模式长度与测试信号的一个周期相等。