摘要:
An image sensor includes: a charge generating unit that generates a charge in response to light, and has a potential well that stores the charge; a first charge storage unit the first charge storage unit having a potential well deeper than the potential well of the charge generating unit and storing a charge transferred from the charge generating unit; a first electrode covering an end of the charge generating unit, to which a voltage is applied, to form a gradient of a potential so that a charge stored in the charge generating unit is transferred to the first charge storage unit; and a second electrode covering a part of the charge generating unit, to which a voltage is applied to make a part of the potential well of the charge generating unit shallow, the shallow part corresponding to the part of the charge generating unit covered by the second electrode.
摘要:
A solid state imaging device comprises: a photoelectric converting portion provided on a semiconductor substrate; a charge transfer path, formed in an adjacent position to the photoelectric converting portion, that receives a signal charge generated in the photoelectric converting portion and transfers the signal charge in a predetermined direction; and a gate electrode that transfers the signal charge from the photoelectric converting portion to the charge transfer path, wherein the gate electrode comprises polysilicon having a different conductive type from that of a semiconductor region forming a charge storing portion of the charge transfer path.
摘要:
A solid state imaging apparatus comprises: a semiconductor substrate; a photoelectric converting portion on the semiconductor substrate; a light shielding film in a region excluding a light receiving surface of the photoelectric converting portion; and a P-type impurity layer between a lower surface of the light shielding film and the semiconductor substrate.
摘要:
A gauge for a coordinate measuring machine has a plurality of balls whose centers are located on at least one line inclined with respect to a reference axis in a virtual reference plane. The gauge is set on a measuring table of the coordinate measuring machine. Orthogonal coordinates in which one of the coordinate axes is identical to the reference axis are set in the virtual reference plane. The coordinates of the center of each ball are measured by the coordinate measuring machine. Thereafter, the gauge is turned and inverted by 180 degrees about the reference axis and is set again on the measuring table. Orthogonal coordinates in which one of the coordinate axes is identical to the reference axis are set in the virtual reference plane. The coordinates of the center of each ball are measured in the same way as above. Thus, measurement errors of the straightness of the machine axes of the coordinate measuring machine and the orthogonality between the machine axes can be easily and precisely evaluated.
摘要:
A reading device includes a first illuminating section that illuminates a reading area with first illumination light of a first direction; a second illuminating section that illuminates the reading area with second illumination light of a second direction; a light-receiving section that receives reflection light of the first illumination light and reflection light of the second illumination light reflected from the reading area, the first illumination light being applied from the first illuminating section and the second illumination light being applied from the second illuminating section; and reflecting members that are disposed side by side in the reading area in a widthwise direction thereof, and that have first and second reflecting surfaces.
摘要:
A reading device includes a first illuminating section that illuminates a reading area with first illumination light of a first direction; a second illuminating section that illuminates the reading area with second illumination light of a second direction; a light-receiving section that receives reflection light of the first illumination light and reflection light of the second illumination light reflected from the reading area, the first illumination light being applied from the first illuminating section and the second illumination light being applied from the second illuminating section; and reflecting members that are disposed side by side in the reading area in a widthwise direction thereof, and that have first and second reflecting surfaces.
摘要:
A solid-state imaging device comprises: a semiconductor substrate; a plurality of photoelectric conversion elements formed in a surface portion of the semiconductor substrate in the form of a two-dimensional array so as to comprise a plurality of sets, each comprising a subset of the photoelectric conversion elements arranged in one direction; charge transfer paths each formed at a side portion of the subset of the photoelectric conversion elements to cause a signal charge of the photoelectric conversion elements be read out when a readout pulse is applied and cause the signal charge which has been read out to be transferred when a transfer pulse is applied; and an electrically conductive light shielding film which is laminated on a surface of the semiconductor substrate through an insulating layer and has openings immediately above each of the photoelectric conversion elements.
摘要:
A gauge (10) for a three-dimensional coordinate measurer fixed onto the measurement table of the three-dimensional coordinate measurer to measure by utilizing the center-to-center distances of spheres and the axis and plane formed of the centers of the plurality of spheres, wherein fitting grooves (2) are formed in the surface of a cylindrical or conical holding body (1) and spherical fixing members (4) having the plurality of spheres (3) arranged thereon are fixedly fitted to the fitting grooves (2), and a standard ring gauge (5) is formed in the holding body (1), whereby three items, that are, scale calibration, straightness, and squareness of the three-dimensional coordinate measurer can be evaluated simultaneously merely by one measurement.
摘要:
A CMM calibrating gauge includes a block gauge which has a first end face and an opposite second end face and whose length absolute value has been certified, and a sphere fixed to a front surface of the block gauge. A method for calibrating a CMM using the CMM calibrating gauge includes the steps of bringing a probe of the CMM into contact with the first end face of the block gauge to specify planarity of the first end face, bringing the probe into contact with the peripheral surface and the pole point of the sphere to specify coordinates of the center of the sphere relative to the first end face and the diameter of the sphere, bringing the probe into contact with the second end face of the block gauge to measure planarity of the second end face, and bringing the probe into contact with the peripheral surface and the pole point of the sphere to measure coordinates of the center of the sphere relative to the second end face and the diameter of the sphere and revise the specified planarity of the first end face and the specified sphere center coordinates and sphere diameter, thereby specifying three-dimensional dimensions of the CMM calibrating gauge to calibrating the CMM.
摘要:
An image sensor includes: a charge generating unit that generates a charge in response to light, and has a potential well that stores the charge; a first charge storage unit the first charge storage unit having a potential well deeper than the potential well of the charge generating unit and storing a charge transferred from the charge generating unit; a first electrode covering an end of the charge generating unit, to which a voltage is applied, to form a gradient of a potential so that a charge stored in the charge generating unit is transferred to the first charge storage unit; and a second electrode covering a part of the charge generating unit, to which a voltage is applied to make a part of the potential well of the charge generating unit shallow, the shallow part corresponding to the part of the charge generating unit covered by the second electrode.