Scanning tunneling atom-probe microscope
    1.
    发明授权
    Scanning tunneling atom-probe microscope 失效
    扫描隧道原子探针显微镜

    公开(公告)号:US5621211A

    公开(公告)日:1997-04-15

    申请号:US578376

    申请日:1995-12-26

    申请人: John C. H. Spence

    发明人: John C. H. Spence

    摘要: A scanning tunneling atom-probe microscope and method for identifying atoms at an identified site on a sample surface involves first identifying the atoms of interest on the sample surface in images formed by a conventional scanning tunneling microscope. These atoms are then transferred to the tip of the scanning tunneling microscope. The sample is then removed, and the atoms ejected from the tip into a conventional time-of-flight spectrometer. By measuring the time of flight of the atoms from the tip to a channel-plate ion detector, the atomic number of the atoms may be determined.

    摘要翻译: 扫描隧道原子探针显微镜和用于识别样品表面上的鉴定位点处的原子的方法包括首先在常规扫描隧道显微镜形成的图像中识别样品表面上的感兴趣原子。 然后将这些原子转移到扫描隧道显微镜的尖端。 然后取出样品,将原子从尖端喷射到常规飞行时间谱仪中。 通过测量原子从尖端到通道板离子检测器的飞行时间,可以确定原子的原子数。

    Atomic focusers in electron microscopy
    3.
    发明授权
    Atomic focusers in electron microscopy 失效
    电子显微镜中的原子聚焦器

    公开(公告)号:US06448556B1

    公开(公告)日:2002-09-10

    申请号:US09645999

    申请日:1999-06-14

    IPC分类号: H01J3712

    CPC分类号: H01J37/28 H01J37/12

    摘要: In electron microscopy, resolution is improved by using an atom or atom-array focuser, with the atom or atom array serving as an electrostatic lens at a focal plane of an electron beam probe having a beam size less than about 0.2 nm at the focal plane. An electrostatic lens can be included in ultra-high resolution microscopes wherein (i) in a linear atom array, the atoms are in alignment with the electron path, (ii) the distance between a sample and the electrostatic lens is adjustable, (iii) a two-dimensional focuser is used, (iv) a sample is at Fourier image distance from a two-dimensionally periodic focuser, (v) a two-dimensional detector or detector array is used, and/or (vi) the electron beam is scanned at the focal plane.

    摘要翻译: 在电子显微镜中,通过使用原子或原子阵列聚焦器来提高分辨率,其中原子或原子阵列在焦平面处具有小于约0.2nm的光束尺寸的电子束探针的焦平面处用作静电透镜 。 静电透镜可以包括在超高分辨率显微镜中,其中(i)在线性原子阵列中,原子与电子路径对准,(ii)样品和静电透镜之间的距离是可调节的,(iii) 使用二维聚焦器,(iv)样品与二维周期性聚焦器的傅里叶图像距离,(v)使用二维检测器或检测器阵列,和/或(vi)电子束为 在焦平面扫描。