High-energy X-ray-spectroscopy-based inspection system and methods to determine the atomic number of materials
    1.
    发明授权
    High-energy X-ray-spectroscopy-based inspection system and methods to determine the atomic number of materials 有权
    基于高能X射线光谱的检测系统和方法来确定材料的原子数

    公开(公告)号:US08750454B2

    公开(公告)日:2014-06-10

    申请号:US13033590

    申请日:2011-02-23

    Abstract: The application discloses systems and methods for X-ray scanning for identifying material composition of an object being scanned. The system includes at least one X-ray source for projecting an X-ray beam on the object, where at least a portion of the projected X-ray beam is transmitted through the object, and an array of detectors for measuring energy spectra of the transmitted X-rays. The measured energy spectra are used to determine atomic number of the object for identifying the material composition of the object. The X-ray scanning system may also have an array of collimated high energy backscattered X-ray detectors for measuring the energy spectrum of X-rays scattered by the object at an angle greater than 90 degrees, where the measured energy spectrum is used in conjunction with the transmission energy spectrum to determine atomic numbers of the object for identifying the material composition of the object.

    Abstract translation: 本申请公开了用于识别被扫描物体的材料组成的用于X射线扫描的系统和方法。 该系统包括至少一个用于在物体上投射X射线束的X射线源,其中投影的X射线束的至少一部分透射穿过物体,以及用于测量所述X射线束的能量谱的检测器阵列 透射X射线。 测量的能谱用于确定物体的原子序号,用于识别物体的材料组成。 X射线扫描系统还可以具有准直的高能量背散射X射线检测器阵列,用于以大于90度的角度测量由物体散射的X射线的能谱,其中测量的能谱结合使用 用传输能谱来确定用于识别物体的材料组成的物体的原子序号。

    SYSTEMS AND METHODS FOR DETECTING NUCLEAR MATERIAL
    2.
    发明申请
    SYSTEMS AND METHODS FOR DETECTING NUCLEAR MATERIAL 审中-公开
    用于检测核材料的系统和方法

    公开(公告)号:US20120155592A1

    公开(公告)日:2012-06-21

    申请号:US13035886

    申请日:2011-02-25

    CPC classification number: G01T3/00 G01T3/06 G01V5/0069 G01V5/0091

    Abstract: The present specification discloses a system for detecting nuclear material based on at least one source of probing radiation and the radiation signatures generated from interrogating an object under inspection. In addition, the present specification describes a threshold-activation detector capable of detecting prompt neutrons, via the activation, after the source's blinding radiation has stopped. The threshold-activation detector can be manufactured from liquid fluorocarbons that allow for the detection of beta radiation and gamma rays.

    Abstract translation: 本说明书公开了一种用于基于探测辐射的至少一个源和从查询被检查物体产生的辐射特征来检测核材料的系统。 此外,本说明书描述了阈值激活检测器,其能够在源的眩光辐射停止之后经由激活来检测到迅速的中子。 阈值激活检测器可以由允许检测β辐射和γ射线的液体碳氟化合物制造。

    High-Energy X-Ray-Spectroscopy-Based Inspection System and Methods to Determine the Atomic Number of Materials
    3.
    发明申请
    High-Energy X-Ray-Spectroscopy-Based Inspection System and Methods to Determine the Atomic Number of Materials 有权
    高能X射线光谱检测系统及确定材料原子数的方法

    公开(公告)号:US20110235777A1

    公开(公告)日:2011-09-29

    申请号:US13033590

    申请日:2011-02-23

    Abstract: The application discloses systems and methods for X-ray scanning for identifying material composition of an object being scanned. The system includes at least one X-ray source for projecting an X-ray beam on the object, where at least a portion of the projected X-ray beam is transmitted through the object, and an array of detectors for measuring energy spectra of the transmitted X-rays. The measured energy spectra are used to determine atomic number of the object for identifying the material composition of the object. The X-ray scanning system may also have an array of collimated high energy backscattered X-ray detectors for measuring the energy spectrum of X-rays scattered by the object at an angle greater than 90 degrees, where the measured energy spectrum is used in conjunction with the transmission energy spectrum to determine atomic numbers of the object for identifying the material composition of the object.

    Abstract translation: 本申请公开了用于识别被扫描物体的材料组成的用于X射线扫描的系统和方法。 该系统包括至少一个用于在物体上投射X射线束的X射线源,其中投影的X射线束的至少一部分透射穿过物体,以及用于测量所述X射线束的能量谱的检测器阵列 透射X射线。 测量的能谱用于确定物体的原子序号,用于识别物体的材料组成。 X射线扫描系统还可以具有准直的高能量背散射X射线检测器阵列,用于以大于90度的角度测量由物体散射的X射线的能谱,其中测量的能谱结合使用 用传输能谱来确定用于识别物体的材料组成的物体的原子序号。

Patent Agency Ranking