摘要:
A circuit for adjusting a signal length is adapted for a memory device. The circuit adjusts a signal length of an ATD signal. The circuit includes a timing module, an encoding module and a logical control unit. Wherein, the timing module generates a plurality of timing signals according a pulse generated by the ATD signal. The encoding module is coupled to one of the data lines of the memory device. The timing signals are registered and encoded to generate a time value according to the status of the data output from the memory device. In addition, the logic control unit compares the present time value and the previous time value to generate a comparison result. The signal length of the ATD signal is adjusted according to the comparison result.
摘要:
A circuit for adjusting a signal length is adapted for a memory device. The circuit adjusts a signal length of an ATD signal. The circuit includes a timing module, an encoding module and a logical control unit. Wherein, the timing module generates a plurality of timing signals according a pulse generated by the ATD signal. The encoding module is coupled to one of the data lines of the memory device. The timing signals are registered and encoded to generate a time value according to the status of the data output from the memory device. In addition, the logic control unit compares the present time value and the previous time value to generate a comparison result. The signal length of the ATD signal is adjusted according to the comparison result.
摘要:
The present invention relates to an apparatus of bandgap buffer which comprising a voltage processing module to produce a bandgap buffer voltage in response to an input voltage and a feedback signal and a symmetry circuit coupled to the voltage processing module for producing the feedback signal and regulating the feedback signal in response to the input voltage.
摘要:
A temperature compensation circuit, applied on a metal oxide semiconductor (MOS) transistor, with a threshold voltage varying with respect to a temperature value of the MOS transistor, for having the MOS transistor corresponding to an equivalent threshold voltage substantially with a constant value throughout a temperature range, comprises a voltage generator. The voltage generator provides a voltage proportional to absolute temperature (VPTAT) to drive the body of the MOS transistor in such way that a variation of the threshold voltage due to temperature variation of the MOS transistor is substantially compensated with a variation of the threshold voltage due to body-source voltage variation of the MOS transistor, so that the MOS transistor corresponds to the equivalent threshold voltage that is temperature invariant.
摘要:
The present invention relates to a voltage bandgap buffer apparatus. This apparatus includes a voltage processing module to produce a bandgap buffer voltage in response to an input voltage and a feedback signal and a symmetry circuit. This symmetry circuit is coupled to the voltage processing module for producing the feedback signal and for regulating the feedback signal in response to the input voltage.
摘要:
A temperature compensation circuit, applied on a metal oxide semiconductor (MOS) transistor, with a threshold voltage varying with respect to a temperature value of the MOS transistor, for having the MOS transistor corresponding to an equivalent threshold voltage substantially with a constant value throughout a temperature range, comprises a voltage generator. The voltage generator provides a voltage proportional to absolute temperature (VPTAT) to drive the body of the MOS transistor in such way that a variation of the threshold voltage due to temperature variation of the MOS transistor is substantially compensated with a variation of the threshold voltage due to body-source voltage variation of the MOS transistor, so that the MOS transistor corresponds to the equivalent threshold voltage that is temperature invariant.
摘要:
A voltage driving circuit comprises a current bias generating unit and a voltage driving unit. The current bias generating unit is configured to receive a mode signal and to generate a mode selection current in response to the mode signal. The voltage driving unit is coupled to the current bias generating unit, and is configured to receive the mode selection current and to drive an output voltage at a slew rate that is set according to the mode selection current. The voltage driving unit can include a plurality of stages, where each stage is configured to drive the output voltage at a respective different slew rate according to the mode signal.
摘要:
A voltage driving circuit comprises a current bias generating unit and a voltage driving unit. The current bias generating unit is configured to receive a mode signal and to generate a mode selection current in response to the mode signal. The voltage driving unit is coupled to the current bias generating unit, and is configured to receive the mode selection current and to drive an output voltage at a slew rate that is set according to the mode selection current. The voltage driving unit can include a plurality of stages, where each stage is configured to drive the output voltage at a respective different slew rate according to the mode signal.