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公开(公告)号：US20060009931A1
公开(公告)日：2006-01-12
申请号：US11224277
申请日：2005-09-12
申请人： Brian Smith , Jue Wu , Jyh-Ming Jong , Wai Fong , Leo Yuan , Prabhansu Chakrabarti
发明人： Brian Smith , Jue Wu , Jyh-Ming Jong , Wai Fong , Leo Yuan , Prabhansu Chakrabarti
IPC分类号： G01R31/00
摘要： A method and apparatus for automated calibration of I/O over a multi-variable eye window is provided. A transmitter may conduct data transmissions to a receiver of an integrated circuit (IC) over a plurality of signal lines. The data transmissions may be conducted according to a certain parameters or sets of parameters. Parameters may include voltage levels at which signals are transmitted or timing delays. The receiver may determine whether the correct data value was received over each signal line. The results may be recorded in a storage mechanism in the same IC as the receiver. The storage mechanism may, for each signal line, store a pass/fail result corresponding to the particular parameters for the data transmission. The system may select the parameters which subsequent transmissions are to be conducted over each of the plurality of signal lines from the storage mechanism.
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2.发明申请公开(公告)号：US20090164841A1
公开(公告)日：2009-06-25
申请号：US12348856
申请日：2009-01-05
摘要： A system and method for increasing the yield of integrated circuits containing memory partitions the memory into regions and then independently tests each region to determine which, if any, of the memory regions contain one or more memory failures. The test results are stored for later retrieval. Prior to using the memory, software retrieves the test results and uses only the memory sections that contain no memory failures. A consequence of this approach is that integrated circuits containing memory that would have been discarded for containing memory failures now may be used. This approach also does not significantly impact die area.
摘要翻译： 用于增加包含存储器的集成电路的产量的系统和方法将存储器分割成区域，然后独立地测试每个区域以确定存储区域（如果有的话）包含一个或多个存储器故障。 测试结果存储以供以后检索。 在使用内存之前，软件将检索测试结果，并且仅使用不包含内存故障的内存部分。 这种方法的结果是现在可以使用包含已被丢弃用于包含存储器故障的存储器的集成电路。 这种方法也不会显着影响模具面积。
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公开(公告)号：US06944692B2
公开(公告)日：2005-09-13
申请号：US09951928
申请日：2001-09-13
申请人： Brian L. Smith , Jue Wu , Jyh-Ming Jong , Wai Fong , Leo Yuan , Prabhansu Chakrabarti
发明人： Brian L. Smith , Jue Wu , Jyh-Ming Jong , Wai Fong , Leo Yuan , Prabhansu Chakrabarti
IPC分类号： H04L25/02 , G06F1/10 , G06F11/24 , G06F13/00 , G06F13/42 , G06K5/04 , H02H1/00 , H02H3/38 , H02H7/26 , H04L25/03 , G06F11/04
摘要： A method and apparatus for automated calibration of I/O over a multi-variable eye window is provided. A transmitter may conduct data transmissions to a receiver of an integrated circuit (IC) over a plurality of signal lines. The data transmissions may be conducted according to a certain parameters or sets of parameters. Parameters may include voltage levels at which signals are transmitted or timing delays. The receiver may determine whether the correct data value was received over each signal line. The results may be recorded in a storage mechanism in the same IC as the receiver. The storage mechanism may, for each signal line, store a pass/fail result corresponding to the particular parameters for the data transmission. The system may select the parameters which subsequent transmissions are to be conducted over each of the plurality of signal lines from the storage mechanism.
摘要翻译： 提供了一种用于通过多变量眼窗自动校准I / O的方法和装置。 发射机可以通过多条信号线对集成电路（IC）的接收机进行数据传输。 可以根据某些参数或参数集进行数据传输。 参数可以包括传输信号的电压电平或定时延迟。 接收机可以确定是否在每个信号线上接收到正确的数据值。 结果可以记录在与接收器相同的IC中的存储机构中。 对于每个信号线，存储机构可以存储对应于用于数据传输的特定参数的通过/失败结果。 系统可以从存储机构中选择要在多条信号线中的每条信号上进行后续传输的参数。
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公开(公告)号：US08685649B2
公开(公告)日：2014-04-01
申请号：US13156435
申请日：2011-06-09
申请人： Allison Dauner , Subhamoy Pal , Shuenn-Jue Wu
发明人： Allison Dauner , Subhamoy Pal , Shuenn-Jue Wu
CPC分类号： C12Q1/701
摘要： The invention relates to a reverse transcription loop-mediated isothermal amplification (LAMP) assay for the detection of dengue virus. The assay is capable of simultaneous detection of dengue 1-4 serotypes in a single reaction.
摘要翻译： 本发明涉及用于检测登革热病毒的逆转录环介导的等温扩增（LAMP）测定。 该测定能够在单次反应中同时检测登革热1-4血清型。
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公开(公告)号：US20110306036A1
公开(公告)日：2011-12-15
申请号：US13156435
申请日：2011-06-09
申请人： Allison Dauner , Subhamoy Pal , Shuenn-Jue Wu
发明人： Allison Dauner , Subhamoy Pal , Shuenn-Jue Wu
IPC分类号： C12Q1/70
CPC分类号： C12Q1/701
摘要： The invention relates to a reverse transcription loop-mediated isothermal amplification (LAMP) assay for the detection of dengue virus. The assay is capable of simultaneous detection of dengue 1-4 serotypes in a single reaction.
摘要翻译： 本发明涉及用于检测登革热病毒的逆转录环介导的等温扩增（LAMP）测定。 该测定能够在单次反应中同时检测登革热1-4血清型。
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6.发明授权System and method for improving the yield of integrated circuits containing memory 有权用于提高含有记忆体的集成电路产量的系统和方法公开(公告)号：US07747915B2
公开(公告)日：2010-06-29
申请号：US12348856
申请日：2009-01-05
摘要： A system and method for increasing the yield of integrated circuits containing memory partitions the memory into regions and then independently tests each region to determine which, if any, of the memory regions contain one or more memory failures. The test results are stored for later retrieval. Prior to using the memory, software retrieves the test results and uses only the memory sections that contain no memory failures. A consequence of this approach is that integrated circuits containing memory that would have been discarded for containing memory failures now may be used. This approach also does not significantly impact die area.
摘要翻译： 用于增加包含存储器的集成电路的产量的系统和方法将存储器分割成区域，然后独立地测试每个区域以确定存储区域（如果有的话）包含一个或多个存储器故障。 测试结果存储以供以后检索。 在使用内存之前，软件将检索测试结果，并且仅使用不包含内存故障的内存部分。 这种方法的结果是现在可以使用包含已被丢弃用于包含存储器故障的存储器的集成电路。 这种方法也不会显着影响模具面积。
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7.发明授权System and method for improving the yield of integrated circuits containing memory 有权用于提高含有记忆体的集成电路产量的系统和方法公开(公告)号：US07478289B1
公开(公告)日：2009-01-13
申请号：US11145143
申请日：2005-06-03
摘要： A system and method for increasing the yield of integrated circuits containing memory partitions the memory into regions and then independently tests each region to determine which, if any, of the memory regions contain one or more memory failures. The test results are stored for later retrieval. Prior to using the memory, software retrieves the test results and uses only the memory sections that contain no memory failures. A consequence of this approach is that integrated circuits containing memory that would have been discarded for containing memory failures now may be used. This approach also does not significantly impact die area.
摘要翻译： 用于增加包含存储器的集成电路的产量的系统和方法将存储器分割成区域，然后独立地测试每个区域以确定存储区域（如果有的话）包含一个或多个存储器故障。 测试结果存储以供以后检索。 在使用内存之前，软件将检索测试结果，并且仅使用不包含内存故障的内存部分。 这种方法的结果是现在可以使用包含已被丢弃用于包含存储器故障的存储器的集成电路。 这种方法也不会显着影响模具面积。
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公开(公告)号：US07296104B2
公开(公告)日：2007-11-13
申请号：US11224277
申请日：2005-09-12
申请人： Brian L. Smith , Jue Wu , Jyh-Ming Jong , Wai Fong , Leo Yuan , Prabhansu Chakrabarti
发明人： Brian L. Smith , Jue Wu , Jyh-Ming Jong , Wai Fong , Leo Yuan , Prabhansu Chakrabarti
摘要： A method and apparatus for automated calibration of I/O over a multi-variable eye window is provided. A transmitter may conduct data transmissions to a receiver of an integrated circuit (IC) over a plurality of signal lines. The data transmissions may be conducted according to a certain parameters or sets of parameters. Parameters may include voltage levels at which signals are transmitted or timing delays. The receiver may determine whether the correct data value was received over each signal line. The results may be recorded in a storage mechanism in the same IC as the receiver. The storage mechanism may, for each signal line, store a pass/fail result corresponding to the particular parameters for the data transmission. The system may select the parameters which subsequent transmissions are to be conducted over each of the plurality of signal lines from the storage mechanism.
摘要翻译： 提供了一种用于通过多变量眼窗自动校准I / O的方法和装置。 发射机可以通过多条信号线对集成电路（IC）的接收机进行数据传输。 可以根据某些参数或参数集进行数据传输。 参数可以包括传输信号的电压电平或定时延迟。 接收机可以确定是否在每个信号线上接收到正确的数据值。 结果可以记录在与接收器相同的IC中的存储机构中。 对于每个信号线，存储机构可以存储对应于用于数据传输的特定参数的通过/失败结果。 系统可以从存储机构中选择要在多条信号线中的每条信号上进行后续传输的参数。
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