公开(公告)号：US20080210854A1

公开(公告)日：2008-09-04

申请号：US12036746

申请日：2008-02-25

申请人： Kazuhiro Jindai ,  Hideto Yokoi

发明人： Kazuhiro Jindai ,  Hideto Yokoi

IPC分类号： H01J49/00

CPC分类号： H01J49/0463 ,  G06F11/0721 ,  G06F11/0766 ,  H01J49/0031 ,  H01J49/0036 ,  Y10T428/30

摘要： A foreign matter or abnormal unsmoothness inspection apparatus is constituted by a detecting member for detecting a foreign matter or abnormal unsmoothness by measuring smoothness of a surface of a substrate-like measuring object, a marking device for providing an dent on the surface of the measuring object with a predetermined horizontal distance from the foreign matter or abnormal unsmoothness, and a mass spectrum measuring device for measuring a mass spectrum of secondary ion emitted from a position with a predetermined distance from the dent by detecting the dent through impact and scanning of the surface of the measuring object with a primary ion beam.

摘要翻译： 异物或异常非平滑度检查装置由检测部件，用于通过测量基板状测量对象的表面的平滑度，用于在测量对象的表面上提供凹痕的标记装置来检测异物或异常不平滑度 具有与异物的预定水平距离或异常不平滑度的质谱测量装置，以及质谱测量装置，用于通过冲击和扫描表面来检测从凹坑预定距离的位置发射的二次离子的质谱， 具有一次离子束的测量对象。

公开(公告)号：US08231204B2

公开(公告)日：2012-07-31

申请号：US12116808

申请日：2008-05-07

申请人： Kazuhiro Jindai ,  Yuji Tsuruoka ,  Takashi Mori ,  Nobuhito Yamaguchi ,  Masao Furukawa ,  Seiichi Kamiya

发明人： Kazuhiro Jindai ,  Yuji Tsuruoka ,  Takashi Mori ,  Nobuhito Yamaguchi ,  Masao Furukawa ,  Seiichi Kamiya

IPC分类号： B41J2/05 ,  B41J2/14 ,  B41J2/16

CPC分类号： B41J2/14024 ,  B41J2/14072 ,  B41J2202/11

摘要： The present invention provides liquid ejection head enables a reduction in the distance between a print medium and an ejection port formation face of the liquid ejection head on which an ejection port is formed, improving the landing accuracy of droplets ejected from the liquid ejection head. A print head according to the present invention includes an element substrate and a supporting member. A supporting portion is located in the space between the element substrate and the supporting member. Connection wiring is formed on the supporting portion. The connection wiring is provided which connects wiring inside of the supporting member provided in the supporting member to the heat generating element.

摘要翻译： 本发明提供了一种液体喷射头，能够减少打印介质与其上形成有喷射口的液体喷射头的喷射口形成面之间的距离，从而提高了从液体喷射头喷出的液滴的着陆精度。 根据本发明的打印头包括元件基板和支撑部件。 支撑部分位于元件基板和支撑部件之间的空间中。 连接布线形成在支撑部分上。 提供连接布线，其将设置在支撑构件中的支撑构件的内部的布线连接到发热元件。

公开(公告)号：US20090009559A1

公开(公告)日：2009-01-08

申请号：US12116808

申请日：2008-05-07

申请人： Kazuhiro Jindai ,  Yuji Tsuruoka ,  Takashi Mori ,  Nobuhito Yamaguchi ,  Masao Furukawa ,  Seiichi Kamiya

发明人： Kazuhiro Jindai ,  Yuji Tsuruoka ,  Takashi Mori ,  Nobuhito Yamaguchi ,  Masao Furukawa ,  Seiichi Kamiya

IPC分类号： B41J2/14

CPC分类号： B41J2/14024 ,  B41J2/14072 ,  B41J2202/11

摘要： The present invention provides liquid ejection head enables a reduction in the distance between a print medium and an ejection port formation face of the liquid ejection head on which an ejection port is formed, improving the landing accuracy of droplets ejected from the liquid ejection head. A print head according to the present invention includes an element substrate and a supporting member. A supporting portion is located in the space between the element substrate and the supporting member. Connection wiring is formed on the supporting portion. The connection wiring is provided which connects wiring inside of the supporting member provided in the supporting member to the heat generating element.

摘要翻译： 本发明提供了一种液体喷射头，能够减少打印介质与其上形成有喷射口的液体喷射头的喷射口形成面之间的距离，从而提高了从液体喷射头喷出的液滴的着陆精度。 根据本发明的打印头包括元件基板和支撑部件。 支撑部分位于元件基板和支撑部件之间的空间中。 连接布线形成在支撑部分上。 提供连接布线，其将设置在支撑构件中的支撑构件的内部的布线连接到发热元件。

公开(公告)号：US06755709B2

公开(公告)日：2004-06-29

申请号：US10152828

申请日：2002-05-23

申请人： Kazuhiro Jindai ,  Mineto Yagyu

发明人： Kazuhiro Jindai ,  Mineto Yagyu

IPC分类号： H01J902

CPC分类号： H01J9/027 ,  H01J2329/00

摘要： In a method of fabricating an electron-emitting device, an activation step is performed in shorter time. The method forms a deposit of carbon or carbon compound on a precursory structure which becomes an electron-emitting region in an electron-emitting device made on a substrate and comprises a first step for depositing carbon or carbon compound in a gas atmosphere which includes a carbon compound of a first molecular weight, and subsequently a second step for depositing carbon or carbon compound in a gas atmosphere which includes a carbon compound of a second molecular weight smaller than the first molecular weight.

摘要翻译： 在制造电子发射器件的方法中，在较短的时间内进行激活步骤。该方法形成碳或碳化合物沉积在前体结构上，该前体结构在形成于电子发射器件的电子发射器件中成为电子发射区 底物，并且包括用于在包括第一分子量的碳化合物的气体气氛中沉积碳或碳化合物的第一步骤，以及随后在气体气氛中沉积碳或碳化合物的第二步骤，所述气体气氛包括第二 分子量小于第一分子量。

公开(公告)号：US20080001081A1

公开(公告)日：2008-01-03

申请号：US11819200

申请日：2007-06-26

申请人： Kazuhiro Jindai ,  Hideto Yokoi

发明人： Kazuhiro Jindai ,  Hideto Yokoi

IPC分类号： B01D59/44

CPC分类号： H01J49/142

摘要： A surface analysis apparatus includes a unit configured to bombard a sample surface with at least two types of ions having different sizes; a measurement device for measuring, with a time-of-flight secondary ion mass spectrometer, a mass spectrum of ions emitted from the sample surface; and an information processor outputting a difference between two mass spectra measured by bombardment of different types of ions.

摘要翻译： 表面分析装置包括被配置为用具有不同尺寸的至少两种类型的离子轰击样品表面的单元; 用于使用飞行时间次级离子质谱仪测量从样品表面发射的离子的质谱的测量装置; 以及输出通过轰击不同类型的离子测量的两个质谱之间的差的信息处理器。

公开(公告)号：US20050189859A1

公开(公告)日：2005-09-01

申请号：US10991105

申请日：2004-11-17

申请人： Yuji Tsuruoka ,  Kazuo Iwata ,  Kazuhiro Jindai ,  Hidehito Takayama ,  Eiichi Motai ,  Takashi Mori

发明人： Yuji Tsuruoka ,  Kazuo Iwata ,  Kazuhiro Jindai ,  Hidehito Takayama ,  Eiichi Motai ,  Takashi Mori

IPC分类号： B82B3/00 ,  H01J1/304 ,  H01J9/00 ,  H01J9/02

CPC分类号： B82Y10/00 ,  H01J1/304 ,  H01J9/025 ,  H01J2201/30469 ,  Y10S977/89 ,  Y10S977/892 ,  Y10S977/893

摘要： An alignment unit and an alignment method for aligning needle-like structures. The alignment unit includes a substrate having a surface and grooves defined in the surface. The grooves are sized and arranged such that when the needle-like structures are received therein, the needle-like structures are aligned.

摘要翻译： 用于对准针状结构的对准单元和对准方法。 对准单元包括具有限定在表面中的表面和凹槽的基底。 凹槽的尺寸和布置使得当针状结构被容纳在其中时，针状结构被对准。

公开(公告)号：US06780073B2

公开(公告)日：2004-08-24

申请号：US10112720

申请日：2002-04-02

申请人： Miki Tamura ,  Toshikazu Ohnishi ,  Kazuhiro Jindai

发明人： Miki Tamura ,  Toshikazu Ohnishi ,  Kazuhiro Jindai

IPC分类号： H01J900

CPC分类号： H01J9/027

摘要： A method of manufacturing an electron-emitting device includes a process for forming a pair of electric conductors spaced from each other on a substrate, and an activation process for forming a film of carbon or a carbon compound on at least one of the pair of electric conductors. The activation process is sequentially performed within plural containers having different atmospheres.

摘要翻译： 一种制造电子发射器件的方法包括在衬底上形成彼此间隔开的一对电导体的工艺，以及用于在所述一对电极中的至少一个上形成碳或碳化合物的膜的活化工艺 导体 激活过程在具有不同气氛的多个容器内依次进行。

公开(公告)号：US06419539B1

公开(公告)日：2002-07-16

申请号：US09512641

申请日：2000-02-24

申请人： Miki Tamura ,  Toshikazu Ohnishi ,  Kazuhiro Jindai

发明人： Miki Tamura ,  Toshikazu Ohnishi ,  Kazuhiro Jindai

IPC分类号： H01J902

CPC分类号： H01J9/027

摘要： A method of manufacturing an electron-emitting device includes a process for forming a pair of electric conductors spaced from each other on a substrate, and an activation process for forming a film of carbon or a carbon compound on at least one of the pair of electric conductors. The activation process is sequentially performed within plural containers having different atmospheres.

摘要翻译： 一种制造电子发射器件的方法包括在衬底上形成彼此间隔开的一对电导体的工艺，以及用于在所述一对电极中的至少一个上形成碳或碳化合物的膜的活化工艺 导体 激活过程在具有不同气氛的多个容器内依次进行。

公开(公告)号：US20100038531A1

公开(公告)日：2010-02-18

申请号：US12606256

申请日：2009-10-27

申请人： Kazuhiro Jindai ,  Hideto Yokoi

发明人： Kazuhiro Jindai ,  Hideto Yokoi

IPC分类号： H01J49/26 ,  G01N3/48

CPC分类号： H01J49/0463 ,  G06F11/0721 ,  G06F11/0766 ,  H01J49/0031 ,  H01J49/0036 ,  Y10T428/30

摘要： A foreign matter detecting apparatus includes a detecting device for detecting foreign matter by measuring smoothness of a surface of an object undergoing measurement, a marking device for providing a dent on the surface of the object with a predetermined horizontal distance from the foreign matter detected by the detecting device, and a mass spectrum measuring device for irradiating and scanning a small area with a primary ion beam, as a part of the object, including the foreign matter and the dent, so as to measure a mass spectrum of secondary ions emitted from the foreign matter located at a position within a predetermined horizontal distance from the dent.

摘要翻译： 异物检测装置包括：检测装置，用于通过测量正在进行测量的物体的表面的平滑度来检测异物;标记装置，用于在物体的表面上以与由 检测装置和用于利用一次离子束照射和扫描小区域的质谱测量装置，作为包括异物和凹陷在内的物体的一部分，以测量从该离子发射的二次离子的质谱 位于与凹坑预定的水平距离内的位置的异物。

公开(公告)号：US07629577B2

公开(公告)日：2009-12-08

申请号：US12036746

申请日：2008-02-25

申请人： Kazuhiro Jindai ,  Hideto Yokoi

发明人： Kazuhiro Jindai ,  Hideto Yokoi

IPC分类号： G01L1/04

CPC分类号： H01J49/0463 ,  G06F11/0721 ,  G06F11/0766 ,  H01J49/0031 ,  H01J49/0036 ,  Y10T428/30

摘要： A foreign matter or abnormal unsmoothness inspection apparatus is constituted by a detecting member for detecting a foreign matter or abnormal unsmoothness by measuring smoothness of a surface of a substrate-like measuring object, a marking device for providing an dent on the surface of the measuring object with a predetermined horizontal distance from the foreign matter or abnormal unsmoothness, and a mass spectrum measuring device for measuring a mass spectrum of secondary ion emitted from a position with a predetermined distance from the dent by detecting the dent through impact and scanning of the surface of the measuring object with a primary ion beam.

摘要翻译： 异物或异常非平滑度检查装置由检测部件，用于通过测量基板状测量对象的表面的平滑度，用于在测量对象的表面上提供凹痕的标记装置来检测异物或异常不平滑度 具有与异物的预定水平距离或异常不平滑度的质谱测量装置，以及质谱测量装置，用于通过冲击和扫描表面来检测从凹坑预定距离的位置发射的二次离子的质谱， 具有一次离子束的测量对象。