Semiconductor device having relief circuit for relieving defective portion
    1.
    发明授权
    Semiconductor device having relief circuit for relieving defective portion 失效
    具有用于消除缺陷部分的释放电路的半导体装置

    公开(公告)号:US06949969B2

    公开(公告)日:2005-09-27

    申请号:US10414226

    申请日:2003-04-16

    摘要: A semiconductor device includes a relief-subject circuit, a relief circuit, and a plurality of fuse elements. The relief-subject circuit implements a predetermined function. The relief circuit is provided to relieve the relief-subject circuit in order to implement the predetermined function. The plurality of fuse elements are provided corresponding to the relief circuit in order to replace the relief-subject circuit with the relief circuit, thus storing information to specify the relief-subject circuit when this relief-subject circuit is replaced by the relief circuit.

    摘要翻译: 半导体器件包括解除对象电路,浮雕电路和多个熔丝元件。 救济对象电路实现预定的功能。 提供释放电路以便释放救济对象电路以实现预定功能。 多个保险丝元件相应于释放电路设置,以便用释放电路代替救济对象电路,从而存储当释放电路被释放电路代替时指定救济对象电路的信息。

    Contact holes of a different pitch in an application specific integrated
circuit
    2.
    发明授权
    Contact holes of a different pitch in an application specific integrated circuit 失效
    在专用集成电路中具有不同音高的接触孔

    公开(公告)号:US5929469A

    公开(公告)日:1999-07-27

    申请号:US992542

    申请日:1997-12-17

    摘要: In a first inter-layer insulator film above source/drain regions of basic cells constituting a gate array, first contact holes (joint contacts) are placed, so that wings (joint plates) electrically connected with the source/drain regions via plugs in those joint contacts is locally placed above the source/drain regions. Above the wings is formed a second inter-layer insulator film, above which is formed a first level interconnection which constitutes one of metal wiring layers. In the second inter-layer insulator film are formed second contact holes, so that a semi-custom ASIC is provided in which the wings and the first level interconnection are electrically interconnected via the plugs in those second contact holes. The first and second contact holes, first level interconnection, etc. are automatically designed by use of a computer based on a grid pattern in the basic cells. According to the present invention, the basic cells need not be re-designed even if a first pitch of a pattern of the first contact holes is different from a second pitch of a pattern of the second contact holes, thus easily enabling automatic customization. Without increasing the area of the source/drain regions in the basic cells, any pitch of the wiring layers can be selected, thus increasing the integration density without deteriorating the performance of MOS FETs at the same time as reducing time required for the customization.

    摘要翻译: 在构成门阵列的基本单元的源极/漏极区域上方的第一层间绝缘膜中,放置第一接触孔(接合触点),使得通过插头在源极/漏极区域中电连接的翼(接合板) 接头接点局部放置在源极/漏极区域之上。 翼上方形成有第二层间绝缘膜,其上形成有构成金属布线层之一的第一层互连。 在第二层间绝缘体膜中形成第二接触孔,从而提供半定制ASIC,其中翼和第一级互连通过那些第二接触孔中的插塞电互连。 通过使用基于基本单元格中的网格图案的计算机来自动设计第一和第二接触孔,第一层互连等。 根据本发明,即使第一接触孔的图案的第一间距与第二接触孔的图案的第二间距不同,基本单元也不需要重新设计,因此容易实现自动定制。 在不增加基本单元中的源极/漏极区域的面积的情况下,可以选择布线层的任何间距,从而在降低定制所需时间的同时增加集成密度,而不会降低MOS FET的性能。

    Semiconductor integrated circuit device
    3.
    发明授权
    Semiconductor integrated circuit device 失效
    半导体集成电路器件

    公开(公告)号:US06326693B1

    公开(公告)日:2001-12-04

    申请号:US09372992

    申请日:1999-08-12

    IPC分类号: H01L2348

    摘要: A semiconductor integrated circuit device has core circuits having rectangular shapes in plan view and power lines surronding the core circuit to connect the cores with an external power supply. The power lines are constructed in a plurality of interconnection layers and include interlayer connections so that they have overlapping parts. Interconnections between core circuits are commonly used so as to decrease interconnection area.

    摘要翻译: 半导体集成电路器件具有在平面图中具有矩形形状的核心电路以及绕着该核心电路的电源线,以将该核与外部电源连接。 电力线构造在多个互连层中,并且包括层间连接,使得它们具有重叠部分。 通常使用核心电路之间的互连,以减少互连区域。

    SEMICONDUCTOR DEVICE HAVING A SYSTEM IN PACKAGE STRUCTURE AND METHOD OF TESTING THE SAME
    4.
    发明申请
    SEMICONDUCTOR DEVICE HAVING A SYSTEM IN PACKAGE STRUCTURE AND METHOD OF TESTING THE SAME 审中-公开
    具有包装结构中的系统的半导体器件及其测试方法

    公开(公告)号:US20080130388A1

    公开(公告)日:2008-06-05

    申请号:US11951268

    申请日:2007-12-05

    申请人: Kenichiro Mimoto

    发明人: Kenichiro Mimoto

    IPC分类号: G01R31/26 G11C7/00

    摘要: A memory chip and an integrated circuit chip are electrically connected via a plurality of bonding wires, and thereby, a semiconductor device is assembled as a SIP product. A test circuit required for testing the memory chip is built in the memory chip only, and the integrated circuit chip is not provided with the test circuit.

    摘要翻译: 存储芯片和集成电路芯片通过多根接合线电连接,从而将半导体器件组装成SIP产品。 用于测试存储器芯片所需的测试电路仅内置在存储器芯片中,并且集成电路芯片不具有测试电路。

    Semiconductor device having relief circuit for relieving defective portion
    5.
    发明申请
    Semiconductor device having relief circuit for relieving defective portion 审中-公开
    具有用于消除缺陷部分的释放电路的半导体装置

    公开(公告)号:US20060002205A1

    公开(公告)日:2006-01-05

    申请号:US11178469

    申请日:2005-07-12

    IPC分类号: G11C29/00

    摘要: A semiconductor device includes a relief-subject circuit, a relief circuit, and a plurality of fuse elements. The relief-subject circuit implements a predetermined function. The relief circuit is provided to relieve the relief-subject circuit in order to implement the predetermined function. The plurality of fuse elements are provided corresponding to the relief circuit in order to replace the relief-subject circuit with the relief circuit, thus storing information to specify the relief-subject circuit when this relief-subject circuit is replaced by the relief circuit.

    摘要翻译: 半导体器件包括解除对象电路,浮雕电路和多个熔丝元件。 救济对象电路实现预定的功能。 提供释放电路以便释放救济对象电路以实现预定功能。 多个保险丝元件相应于释放电路设置,以便用释放电路代替救济对象电路,从而存储当释放电路被释放电路代替时指定救济对象电路的信息。