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公开(公告)号：US20110317813A1
公开(公告)日：2011-12-29
申请号：US13170708
申请日：2011-06-28
IPC分类号： G01N23/207 , G01N23/20
CPC分类号： H01J35/10 , G01N23/207 , H01J2235/081 , H01J2235/086
摘要： A wavelength-classifying type X-ray diffraction device bombards a sample with characteristic X-rays generated from an X-ray generation source, and detects characteristic X-rays diffracted by the sample using an X-ray detector. The X-ray generation source is composed of several metals of different atomic number, respective metals generating several characteristic X-rays of different wavelengths. An X-ray detector is composed of several pixels for receiving X-rays and outputting pulse signals corresponding to X-ray wavelengths. Pixels are respectively furnished with classification circuits. The classification circuits classify and output pixel output signals based on each of characteristic X-ray wavelengths. X-ray intensity is detected on a per-wavelength basis in individual pixels 12. Measurement data based on different wavelength X-rays are acquired simultaneously in just one measurement. Data of diffracted X-rays of different wavelengths are acquired using the entire region of the receiving surface of a two-dimensional detector.
摘要翻译： 波长分类型X射线衍射装置用X射线产生源产生的特征X射线轰击样品，并使用X射线检测器检测由样品衍射的特征X射线。 X射线产生源由不同原子数的几种金属组成，各种金属产生不同波长的几种特征X射线。 X射线检测器由用于接收X射线的几个像素组成并且输出对应于X射线波长的脉冲信号。 像素分别配有分类电路。 分类电路基于每个特征X射线波长对像素输出信号进行分类和输出。 在单个像素12中以每个波长为基础检测X射线强度。仅在一个测量中同时获取基于不同波长X射线的测量数据。 使用二维检测器的接收表面的整个区域获取不同波长的衍射X射线的数据。
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公开(公告)号：US20120269322A1
公开(公告)日：2012-10-25
申请号：US13540652
申请日：2012-07-03
IPC分类号： G01N23/207
CPC分类号： H01J35/10 , G01N23/207 , H01J2235/081 , H01J2235/086
摘要： A wavelength-classifying type X-ray diffraction device bombards a sample with characteristic X-rays generated from an X-ray generation source, and detects characteristic X-rays diffracted by the sample using an X-ray detector. The X-ray generation source is composed of several metals of different atomic number, respective metals generating several characteristic X-rays of different wavelengths. An X-ray detector is composed of several pixels for receiving X-rays and outputting pulse signals corresponding to X-ray wavelengths. Pixels are respectively furnished with classification circuits. The classification circuits classify and output pixel output signals based on each of characteristic X-ray wavelengths. X-ray intensity is detected on a per-wavelength basis in individual pixels 12. Measurement data based on different wavelength X-rays are acquired simultaneously in just one measurement. Data of diffracted X-rays of different wavelengths are acquired using the entire region of the receiving surface of a two-dimensional detector.
摘要翻译： 波长分类型X射线衍射装置用X射线产生源产生的特征X射线轰击样品，并使用X射线检测器检测由样品衍射的特征X射线。 X射线产生源由不同原子数的几种金属组成，各种金属产生不同波长的几种特征X射线。 X射线检测器由用于接收X射线的几个像素组成并且输出对应于X射线波长的脉冲信号。 像素分别配有分类电路。 分类电路基于每个特征X射线波长对像素输出信号进行分类和输出。 在单个像素12中以每个波长为基础检测X射线强度。仅在一个测量中同时获取基于不同波长X射线的测量数据。 使用二维检测器的接收表面的整个区域获取不同波长的衍射X射线的数据。
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公开(公告)号：US4909080A
公开(公告)日：1990-03-20
申请号：US237061
申请日：1988-08-29
申请人： Mitsuhiro Kikuta , Toshinori Takahashi , Tatsuya Terayama , Kimiko Hasegawa , Chikahisa Hayashi
发明人： Mitsuhiro Kikuta , Toshinori Takahashi , Tatsuya Terayama , Kimiko Hasegawa , Chikahisa Hayashi
IPC分类号： G01F23/296
CPC分类号： G01F23/2962 , Y10S367/908
摘要： An ultrasonic level gauge that measures the level of a test surface inside a tank. A guiding pipe guides the ultrasonic wave transmitted by an ultrasonic transceiver to the test surface, and guides the ultrasonic wave reflected by the test surface back to the ultrasonic transceiver. An extended portion that extends the propagation distance of the ultrasonic wave guided by the guiding pipe may be provided on the basal portion of the guiding pipe. In this case, the ultrasonic transceiver is provided at the opening at the end of the extended portion. Also, a helical portion or a slanting portion may be provided in the guiding pipe to make the ultrasonic wave transmitted by the ultrasonic transceiver enter the test surface in a slanting direction.
摘要翻译： 超声波液位计，用于测量罐内试验面的水平。 引导管将超声波收发器传输的超声波引导到测试面，并将测试面反射的超声波引导回超声波收发器。 可以在引导管的基部上设置延伸由引导管引导的超声波的传播距离的延伸部。 在这种情况下，超声波收发器设置在延伸部分的端部处的开口处。 此外，可以在引导管中设置螺旋部分或倾斜部分，以使超声波收发器传输的超声波以倾斜方向进入测试表面。
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公开(公告)号：US08699665B2
公开(公告)日：2014-04-15
申请号：US13170708
申请日：2011-06-28
IPC分类号： G01N23/207
CPC分类号： H01J35/10 , G01N23/207 , H01J2235/081 , H01J2235/086
摘要： A wavelength-classifying type X-ray diffraction device bombards a sample with characteristic X-rays generated from an X-ray generation source, and detects characteristic X-rays diffracted by the sample using an X-ray detector. The X-ray generation source is composed of several metals of different atomic number, respective metals generating several characteristic X-rays of different wavelengths. An X-ray detector is composed of several pixels for receiving X-rays and outputting pulse signals corresponding to X-ray wavelengths. Pixels are respectively furnished with classification circuits. The classification circuits classify and output pixel output signals based on each of characteristic X-ray wavelengths. X-ray intensity is detected on a per-wavelength basis in individual pixels 12. Measurement data based on different wavelength X-rays are acquired simultaneously in just one measurement. Data of diffracted X-rays of different wavelengths are acquired using the entire region of the receiving surface of a two-dimensional detector.
摘要翻译： 波长分类型X射线衍射装置用X射线产生源产生的特征X射线轰击样品，并使用X射线检测器检测由样品衍射的特征X射线。 X射线产生源由不同原子数的几种金属组成，各种金属产生不同波长的几种特征X射线。 X射线检测器由用于接收X射线的几个像素组成并且输出对应于X射线波长的脉冲信号。 像素分别配有分类电路。 分类电路基于每个特征X射线波长对像素输出信号进行分类和输出。 在单个像素12中以每个波长为基础检测X射线强度。仅在一个测量中同时获取基于不同波长X射线的测量数据。 使用二维检测器的接收表面的整个区域获取不同波长的衍射X射线的数据。
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公开(公告)号：US08300767B1
公开(公告)日：2012-10-30
申请号：US13540652
申请日：2012-07-03
IPC分类号： G01N23/207
CPC分类号： H01J35/10 , G01N23/207 , H01J2235/081 , H01J2235/086
摘要： A wavelength-classifying type X-ray diffraction device bombards a sample with characteristic X-rays generated from an X-ray generation source, and detects characteristic X-rays diffracted by the sample using an X-ray detector. The X-ray generation source is composed of several metals of different atomic number, respective metals generating several characteristic X-rays of different wavelengths. An X-ray detector is composed of several pixels for receiving X-rays and outputting pulse signals corresponding to X-ray wavelengths. Pixels are respectively furnished with classification circuits. The classification circuits classify and output pixel output signals based on each of characteristic X-ray wavelengths. X-ray intensity is detected on a per-wavelength basis in individual pixels 12. Measurement data based on different wavelength X-rays are acquired simultaneously in just one measurement. Data of diffracted X-rays of different wavelengths are acquired using the entire region of the receiving surface of a two-dimensional detector.
摘要翻译： 波长分类型X射线衍射装置用X射线产生源产生的特征X射线轰击样品，并使用X射线检测器检测由样品衍射的特征X射线。 X射线产生源由不同原子数的几种金属组成，各种金属产生不同波长的几种特征X射线。 X射线检测器由用于接收X射线的几个像素组成并且输出对应于X射线波长的脉冲信号。 像素分别配有分类电路。 分类电路基于每个特征X射线波长对像素输出信号进行分类和输出。 在单个像素12中以每个波长为基础检测X射线强度。仅在一个测量中同时获取基于不同波长X射线的测量数据。 使用二维检测器的接收表面的整个区域获取不同波长的衍射X射线的数据。
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