公开(公告)号：US08405415B2

公开(公告)日：2013-03-26

申请号：US12557478

申请日：2009-09-10

申请人： Satoshi Iwamoto ,  Koichi Yatsuka

发明人： Satoshi Iwamoto ,  Koichi Yatsuka

IPC分类号： G01R31/26

CPC分类号： G01R31/31907

摘要： Provided is a test apparatus that tests a device under test, comprising a plurality of test modules that test the device under test; a synchronization module that is connected to each of the plurality of test modules, and that synchronizes the plurality of test modules; and a test control section that is connected to the plurality of test modules and the synchronization module, and that controls the test modules and the synchronization module. The synchronization module includes a receiving section that receives, from each of the plurality of test modules, a state signal indicating a state of the test module; an aggregating section that generates an aggregate state signal by calculating an aggregate of the state signals received by the receiving section; and a transmitting section that transmits, to the plurality of test modules, a control signal ordering an operation corresponding to the aggregate state signal.

摘要翻译： 提供了一种测试被测设备的测试设备，包括测试被测设备的多个测试模块; 同步模块，其连接到所述多个测试模块中的每一个，并且使所述多个测试模块同步; 以及连接到所述多个测试模块和所述同步模块并且控制所述测试模块和所述同步模块的测试控制部分。 所述同步模块包括从所述多个测试模块中的每一个接收指示所述测试模块的状态的状态信号的接收部分; 聚合部分，其通过计算由所述接收部分接收的所述状态信号的聚合来生成聚合状态信号; 以及发送部，其向所述多个测试模块发送排序对应于所述聚合状态信号的操作的控制信号。

公开(公告)号：US20110057673A1

公开(公告)日：2011-03-10

申请号：US12557483

申请日：2009-09-10

申请人： Satoshi IWAMOTO ,  Koichi YATSUKA

发明人： Satoshi IWAMOTO ,  Koichi YATSUKA

IPC分类号： G01R31/02 ,  G01R31/3187 ,  G01R31/26

CPC分类号： G01R31/3193 ,  G01R31/31726

摘要： There is provided a test apparatus for testing a device under test, including: a plurality of test sections; and a first synchronization section and a second synchronization section that, for each of a plurality of domains that respectively include one or more of the plurality of test sections, synchronize the one or more test sections included in the domain, where each of the first synchronization section and the second synchronization section includes: a local collection section that collects, for each domain, synchronization requests from the test sections connected to the corresponding synchronization section; an exchange section that exchanges, for a discrete domain of that includes test sections connected to the first synchronization section and test sections connected to the second synchronization section, synchronization requests collected in the corresponding synchronization section with synchronization requests collected in the other synchronization section; a global collection section that collects, the synchronization requests collected in the corresponding synchronization section and the synchronization requests collected in the other synchronization section; and a distribution section that distributes the collected synchronization requests to each of the test sections connected to the corresponding synchronization section.

摘要翻译： 提供了一种用于测试被测设备的测试装置，包括：多个测试部分; 以及第一同步部分和第二同步部分，对于分别包括所述多个测试部分中的一个或多个的多个域中的每个，同步所述域中包括的一个或多个测试部分，其中每个所述第一同步 并且所述第二同步部分包括：本地收集部分，用于针对每个域收集来自连接到相应同步部分的测试部分的同步请求; 交换部分，对于其离散域，其交换包括连接到第一同步部分的测试部分和连接到第二同步部分的测试部分，在相应的同步部分中收集的同步请求中收集的同步请求; 收集相应同步部分中收集的同步请求的全局收集部分和在另一同步部分中收集的同步请求; 以及分配部，其将收集的同步请求分发到连接到对应的同步部的每个测试部。

公开(公告)号：US07876118B2

公开(公告)日：2011-01-25

申请号：US12365900

申请日：2009-02-05

申请人： Satoshi Iwamoto ,  Shigeki Takizawa ,  Koichi Yatsuka ,  Toshio Matsuura

发明人： Satoshi Iwamoto ,  Shigeki Takizawa ,  Koichi Yatsuka ,  Toshio Matsuura

IPC分类号： G01R31/26

CPC分类号： G01R31/31919 ,  G01R31/31922

摘要： Provided is a test apparatus that tests a device under test, comprising a pattern generating section that generates a test pattern for testing the device under test; a signal supplying section that supplies the device under test with a test signal corresponding to the test pattern; a trigger generating section that supplies a trigger signal to an external instrument connected to the device under test; and a synchronization control section that outputs, to the trigger generating section, a synchronization signal instructing generation of the trigger signal, based on at least a portion of the test pattern generated by the pattern generating section.

摘要翻译： 提供了一种测试被测设备的测试装置，包括产生用于测试被测设备的测试图案的模式产生部分; 信号提供部分，向所述被测器件供给与所述测试图案相对应的测试信号; 触发生成部，其将触发信号提供给与被测设备连接的外部仪器; 以及同步控制部，其基于由所述图案生成部生成的所述测试图案的至少一部分，向所述触发生成部输出指示所述触发信号的生成的同步信号。

公开(公告)号：US07237159B2

公开(公告)日：2007-06-26

申请号：US10933690

申请日：2004-09-03

申请人： Koichi Yatsuka

发明人： Koichi Yatsuka

IPC分类号： G01R31/3183 ,  G01R31/3161

CPC分类号： G01R31/31907 ,  G01R31/319 ,  G01R31/31926

摘要： There is provided a test apparatus that tests an electronic device. The test apparatus includes: a plurality of test modules operable to supply and receive signals to/from the electronic device; a plurality of return circuits operable to receive fail timing signals indicating timing at which a fail occurs on output patterns output from the electronic device, the return circuits being provided corresponding to the plurality of test modules; a plurality of summarizing units operable to receive the fail timing signals output from the plurality of return circuits and compute logical sum of one or more fail timing signals among the plurality of fail timing signals to output one bit signal; and a plurality of distributing units operable to distribute the computed results of corresponding ones of the summarizing units to the plurality of test modules, the distributing units being provided corresponding to the plurality of summarizing units.

摘要翻译： 提供了测试电子设备的测试设备。 测试设备包括：多个测试模块，可操作以向/从电子设备提供信号和从电子设备接收信号; 多个返回电路，其可操作以接收指示从所述电子设备输出的输出图案上出现故障的定时的故障定时信号，所述返回电路对应于所述多个测试模块; 多个汇总单元，用于接收从多个返回电路输出的故障定时信号，并计算多个故障定时信号之间的一个或多个故障定时信号的逻辑和，以输出一个位信号; 以及多个分配单元，其可操作以将所述汇总单元中的相应汇总单元的计算结果分配给所述多个测试模块，所述分配单元对应于所述多个汇总单元提供。

公开(公告)号：US07142003B2

公开(公告)日：2006-11-28

申请号：US10938861

申请日：2004-09-10

申请人： Hironori Kanbayashi ,  Koichi Yatsuka

发明人： Hironori Kanbayashi ,  Koichi Yatsuka

IPC分类号： G01R31/26

CPC分类号： G01R31/31928 ,  G01R31/31922

摘要： There is provided a test apparatus that tests an electronic device. The test apparatus includes: a plurality of test modules operable to supply test patterns used for a test of the electronic device to the electronic device; a reference clock generation unit operable to generate a reference clock; a generation circuit operable to generate timing signals that cause the plurality of test modules to operate based on the reference clock; a plurality of timing sources being provided in response to the plurality of test modules and operable to supply the timing signals to the corresponding test modules; and a control unit operable to control phases of the timing signals supplied to each of the test modules by the plurality of timing sources so that timings at which each of the test modules outputs the test patterns according to the timing signals are made to be equal.

摘要翻译： 提供了测试电子设备的测试设备。 测试装置包括：多个测试模块，可操作以将用于电子设备测试的测试图案提供给电子设备; 参考时钟生成单元，用于生成参考时钟; 生成电路，用于产生基于所述参考时钟使所述多个测试模块工作的定时信号; 响应于所述多个测试模块提供多个定时源，并且可操作以将定时信号提供给相应的测试模块; 以及控制单元，其可操作以通过多个定时源来控制提供给每个测试模块的定时信号的相位，使得每个测试模块根据定时信号输出测试模式的定时相等。

公开(公告)号：US20110057663A1

公开(公告)日：2011-03-10

申请号：US12557478

申请日：2009-09-10

申请人： Satoshi IWAMOTO ,  Koichi YATSUKA

发明人： Satoshi IWAMOTO ,  Koichi YATSUKA

IPC分类号： G01R31/02

CPC分类号： G01R31/31907

摘要： Provided is a test apparatus that tests a device under test, comprising a plurality of test modules that test the device under test; a synchronization module that is connected to each of the plurality of test modules, and that synchronizes the plurality of test modules; and a test control section that is connected to the plurality of test modules and the synchronization module, and that controls the test modules and the synchronization module. The synchronization module includes a receiving section that receives, from each of the plurality of test modules, a state signal indicating a state of the test module; an aggregating section that generates an aggregate state signal by calculating an aggregate of the state signals received by the receiving section; and a transmitting section that transmits, to the plurality of test modules, a control signal ordering an operation corresponding to the aggregate state signal.

摘要翻译： 提供了一种测试被测设备的测试设备，包括测试被测设备的多个测试模块; 同步模块，其连接到所述多个测试模块中的每一个，并且使所述多个测试模块同步; 以及连接到所述多个测试模块和所述同步模块并且控制所述测试模块和所述同步模块的测试控制部分。 所述同步模块包括从所述多个测试模块中的每一个接收指示所述测试模块的状态的状态信号的接收部分; 聚合部分，其通过计算由所述接收部分接收的所述状态信号的聚合来生成聚合状态信号; 以及发送部，其向所述多个测试模块发送排序对应于所述聚合状态信号的操作的控制信号。

公开(公告)号：US20100194421A1

公开(公告)日：2010-08-05

申请号：US12365900

申请日：2009-02-05

申请人： SATOSHI IWAMOTO ,  SHIGEKI TAKIZAWA ,  KOICHI YATSUKA ,  TOSHIO MATSUURA

发明人： SATOSHI IWAMOTO ,  SHIGEKI TAKIZAWA ,  KOICHI YATSUKA ,  TOSHIO MATSUURA

IPC分类号： G01R31/02 ,  G06F1/12

CPC分类号： G01R31/31919 ,  G01R31/31922

摘要： Provided is a test apparatus that tests a device under test, comprising a pattern generating section that generates a test pattern for testing the device under test; a signal supplying section that supplies the device under test with a test signal corresponding to the test pattern; a trigger generating section that supplies a trigger signal to an external instrument connected to the device under test; and a synchronization control section that outputs, to the trigger generating section, a synchronization signal instructing generation of the trigger signal, based on at least a portion of the test pattern generated by the pattern generating section.

摘要翻译： 提供了一种测试被测设备的测试装置，包括产生用于测试被测设备的测试图案的模式产生部分; 信号提供部分，向所述被测器件供给与测试图案对应的测试信号; 触发生成部，其将触发信号提供给与被测设备连接的外部仪器; 以及同步控制部，其基于由所述图案生成部生成的所述测试图案的至少一部分，向所述触发生成部输出指示所述触发信号的生成的同步信号。

公开(公告)号：US20050278598A1

公开(公告)日：2005-12-15

申请号：US10933690

申请日：2004-09-03

申请人： Koichi Yatsuka

发明人： Koichi Yatsuka

IPC分类号： G01R31/28 ,  G01R31/319 ,  G06F11/00

CPC分类号： G01R31/31907 ,  G01R31/319 ,  G01R31/31926

摘要： There is provided a test apparatus that tests an electronic device. The test apparatus includes: a plurality of test modules operable to supply and receive signals to/from the electronic device; a plurality of return circuits operable to receive fail timing signals indicating timing at which a fail occurs on output patterns output from the electronic device, the return circuits being provided corresponding to the plurality of test modules; a plurality of summarizing units operable to receive the fail timing signals output from the plurality of return circuits and compute logical sum of one or more fail timing signals among the plurality of fail timing signals to output one bit signal; and a plurality of distributing units operable to distribute the computed results of corresponding ones of the summarizing units to the plurality of test modules, the distributing units being provided corresponding to the plurality of summarizing units.

摘要翻译： 提供了测试电子设备的测试设备。 测试设备包括：多个测试模块，可操作以向/从电子设备提供信号和从电子设备接收信号; 多个返回电路，其可操作以接收指示从所述电子设备输出的输出模式上出现故障的定时的故障定时信号，所述返回电路对应于所述多个测试模块; 多个汇总单元，用于接收从多个返回电路输出的故障定时信号，并计算多个故障定时信号之间的一个或多个故障定时信号的逻辑和，以输出一个位信号; 以及多个分配单元，其可操作以将所述汇总单元中的相应汇总单元的计算结果分配给所述多个测试模块，所述分配单元对应于所述多个汇总单元提供。

公开(公告)号：US20050138505A1

公开(公告)日：2005-06-23

申请号：US10938861

申请日：2004-09-10

申请人： Hironori Kanbayashi ,  Koichi Yatsuka

发明人： Hironori Kanbayashi ,  Koichi Yatsuka

IPC分类号： G01R31/28 ,  G01R31/3183 ,  G01R31/319

CPC分类号： G01R31/31928 ,  G01R31/31922

摘要： There is provided a test apparatus that tests an electronic device. The test apparatus includes: a plurality of test modules operable to supply test patterns used for a test of the electronic device to the electronic device; a reference clock generation unit operable to generate a reference clock; a generation circuit operable to generate timing signals that cause the plurality of test modules to operate based on the reference clock; a plurality of timing sources being provided in response to the plurality of test modules and operable to supply the timing signals to the corresponding test modules; and a control unit operable to control phases of the timing signals supplied to each of the test modules by the plurality of timing sources so that timings at which each of the test modules outputs the test patterns according to the timing signals are made to be equal.

摘要翻译： 提供了测试电子设备的测试设备。 测试装置包括：多个测试模块，可操作以将用于电子设备测试的测试图案提供给电子设备; 参考时钟生成单元，用于生成参考时钟; 生成电路，用于产生基于所述参考时钟使所述多个测试模块工作的定时信号; 响应于所述多个测试模块提供多个定时源，并且可操作以将定时信号提供给相应的测试模块; 以及控制单元，其可操作以通过多个定时源来控制提供给每个测试模块的定时信号的相位，使得每个测试模块根据定时信号输出测试模式的定时相等。

公开(公告)号：US07906981B1

公开(公告)日：2011-03-15

申请号：US12557483

申请日：2009-09-10

申请人： Satoshi Iwamoto ,  Koichi Yatsuka

发明人： Satoshi Iwamoto ,  Koichi Yatsuka

IPC分类号： G01R31/02

CPC分类号： G01R31/3193 ,  G01R31/31726

摘要： There is provided a test apparatus for testing a device under test, including: a plurality of test sections; and a first synchronization section and a second synchronization section that, for each of a plurality of domains that respectively include one or more of the plurality of test sections, synchronize the one or more test sections included in the domain, where each of the first synchronization section and the second synchronization section includes: a local collection section that collects, for each domain, synchronization requests from the test sections connected to the corresponding synchronization section; an exchange section that exchanges, for a discrete domain of that includes test sections connected to the first synchronization section and test sections connected to the second synchronization section, synchronization requests collected in the corresponding synchronization section with synchronization requests collected in the other synchronization section; a global collection section that collects, the synchronization requests collected in the corresponding synchronization section and the synchronization requests collected in the other synchronization section; and a distribution section that distributes the collected synchronization requests to each of the test sections connected to the corresponding synchronization section.

摘要翻译： 提供了一种用于测试被测设备的测试装置，包括：多个测试部分; 以及第一同步部分和第二同步部分，对于分别包括所述多个测试部分中的一个或多个的多个域中的每个，同步所述域中包括的一个或多个测试部分，其中每个所述第一同步 并且所述第二同步部分包括：本地收集部分，用于针对每个域收集来自连接到相应同步部分的测试部分的同步请求; 交换部分，对于其离散域，其交换包括连接到第一同步部分的测试部分和连接到第二同步部分的测试部分，在相应的同步部分中收集的同步请求中收集的同步请求; 收集相应同步部分中收集的同步请求的全局收集部分和在另一同步部分中收集的同步请求; 以及分配部，其将收集的同步请求分发到连接到对应的同步部的每个测试部。