摘要:
A method for manufacturing a capacitor of a semiconductor memory device is provided. A first insulating layer and a second insulating layer are formed in sequence on a semiconductor substrate on which a transistor including a source region, a drain region and a gate electrode, and a buried bit-line surrounded by insulating layer are formed. Then, a contact hole is formed by sequentially etching the layers stacked on the source region, by which the source region of the transistor is exposed, and a spacer made of an insulating substance is formed inside the contact hole, and a first conductive layer is formed on the whole surface of the resultant. Next, the first conductive layer and second insulating layer are etched, and a second conductive layer is formed on the whole surface of the resultant, and a storage electrode is formed by etching the second conductive layer using the first conductive layer as a mask. According to the method, the step for forming the contact hole is very simple and less photolithography steps are required since the first conductive layer is used as a mask for etching the second conductive layer, thereby simplifying the manufacturing process.
摘要:
The present invention discloses a layout in a semiconductor device having conductive layers electrically connected to conductive regions via contact holes beneath the conductive layers. Each of the conductive layers has a layout with different widths at opposite longitudinal ends thereof, respectively, thereby being capable of achieving an improvement in the alignment margin between the conductive layer and the contact hole within a given memory cell area. Where the layout is applied to capacitors, it is possible to avoid the formation of inferior storage electrodes over regions where contact holes are formed.
摘要:
A layout structure of the interconnection layers of a semiconductor device includes a plurality of conducting lines extending adjacent one another, and at least one rectangular cut-out formed in a side of each of the conducting lines, wherein a width of gap between adjacent ones of the plurality of conducting lines is increased at each rectangular cut-out. The rectangular cut-out serves to increase the space between adjacent conducting lines so as to secure a proper gap there between upon deposition of a passivation layer.