公开(公告)号：US08694148B2

公开(公告)日：2014-04-08

申请号：US11719390

申请日：2005-11-14

Applicant: Michael Tyler ,  Robert W. Colby ,  Jeffrey W. Leonard ,  Lindsey M. Dotson ,  David A. Watt ,  Cris E. Hill ,  Laura H. Campbell

Inventor： Michael Tyler ,  Robert W. Colby ,  Jeffrey W. Leonard ,  Lindsey M. Dotson ,  David A. Watt ,  Cris E. Hill ,  Laura H. Campbell

IPC: G06F19/00 ,  G01R31/00

CPC classification number: H05K3/0026 ,  B23K26/02 ,  B23K26/382 ,  B23K26/389 ,  B23K26/40 ,  B23K31/12 ,  B23K2101/42 ,  B23K2103/12 ,  B23K2103/172 ,  B23K2103/42 ,  B23K2103/50 ,  H05K3/225 ,  H05K2201/09936 ,  H05K2203/163

Abstract: A method and system increase processed specimen yield in the laser processing of target material that includes multiple specimens formed on a common substrate. Preferred embodiments implement a feature that enables storage in the laser processing system a list of defective specimens that have somehow been subject to error during laser processing. Once the common substrate has been completely processed, the system alerts an operator to the number of improperly processed specimens and gives the operator an opportunity to run a software routine, which in a preferred embodiment uses a laser to scribe a mark on the top surface of each improperly processed specimen.

Abstract translation: 一种方法和系统在目标材料的激光加工中增加了加工样品产量，其包括在公共基底上形成的多个样品。 优选实施例实现能够在激光处理系统中存储在激光处理期间以某种方式遭受错误的缺陷样本的列表的特征。 一旦共同的基板被完全处理，系统就会向操作人员提供不正确处理的标本的数量，并给予操作者运行一个软件程序的机会，在一个优选的实施例中，该程序使用激光来刻划在 每个不正确加工的样品。

公开(公告)号：US20110208343A1

公开(公告)日：2011-08-25

申请号：US11719390

申请日：2005-11-14

Applicant: Michael Tyler ,  Robert W. Colby ,  Jeffrey W. Leonard ,  Lindsey M. Dotson ,  David A. Watt ,  Cris E. Hill ,  Laura H. Campbell

Inventor： Michael Tyler ,  Robert W. Colby ,  Jeffrey W. Leonard ,  Lindsey M. Dotson ,  David A. Watt ,  Cris E. Hill ,  Laura H. Campbell

IPC: G06F19/00

CPC classification number: H05K3/0026 ,  B23K26/02 ,  B23K26/382 ,  B23K26/389 ,  B23K26/40 ,  B23K31/12 ,  B23K2101/42 ,  B23K2103/12 ,  B23K2103/172 ,  B23K2103/42 ,  B23K2103/50 ,  H05K3/225 ,  H05K2201/09936 ,  H05K2203/163

Abstract: A method and system increase processed specimen yield in the laser processing of target material that includes multiple specimens formed on a common substrate. Preferred embodiments implement a feature that enables storage in the laser processing system a list of defective specimens that have somehow been subject to error during laser processing. Once the common substrate has been completely processed, the system alerts an operator to the number of improperly processed specimens and gives the operator an opportunity to run a software routine, which in a preferred embodiment uses a laser to scribe a mark on the top surface of each improperly processed specimen.

Abstract translation: 一种方法和系统在目标材料的激光加工中增加了加工样品产量，其包括在公共基底上形成的多个样品。 优选实施例实现能够在激光处理系统中存储在激光处理期间以某种方式遭受错误的缺陷样本的列表的特征。 一旦共同的基板被完全处理，系统就会向操作人员提供不正确处理的标本的数量，并给予操作者运行一个软件程序的机会，在一个优选的实施例中，该程序使用激光来刻划在 每个不正确加工的样品。

公开(公告)号：US07244906B2

公开(公告)日：2007-07-17

申请号：US11217077

申请日：2005-08-30

Applicant: William J. Jordens ,  Lindsey M. Dotson ,  Mark Unrath

Inventor： William J. Jordens ,  Lindsey M. Dotson ,  Mark Unrath

IPC: B23K26/38

CPC classification number: B23K26/032 ,  B23K26/03 ,  B23K26/0622 ,  B23K26/0643 ,  B23K26/38 ,  B23K26/382 ,  B23K26/389 ,  B23K26/40 ,  B23K26/705 ,  B23K2101/35 ,  B23K2101/40 ,  B23K2103/04 ,  B23K2103/08 ,  B23K2103/10 ,  B23K2103/12 ,  B23K2103/16 ,  B23K2103/172 ,  B23K2103/26 ,  B23K2103/42 ,  B23K2103/50 ,  B23K2103/52 ,  B23K2103/56

Abstract: A method and system increase the quality of results achieved by laser micromachining systems. Data relating to parameters controlling laser micromachining process are recorded during the micromachining process, identified by the feature associated with the parameters used to micromachine, and stored on the system. The stored data can be either retrieved during the micromachining process to enable real time control or retrieved after workpiece processing to conduct statistical process control.

Abstract translation: 一种方法和系统提高了激光微加工系统实现的结果质量。 在微加工过程中记录与控制激光微加工过程的参数有关的数据，由与用于微机械的参数相关联的特征识别并存储在系统上。 可以在微加工过程中检索存储的数据，以便能够进行实时控制或在工件加工后检索以进行统计过程控制。