公开(公告)号：US3964085A

公开(公告)日：1976-06-15

申请号：US605312

申请日：1975-08-18

申请人： Dawon Kahng ,  Ernest Edward La Bate ,  Martin Paul Lepselter ,  Joseph Raymond Ligenza

发明人： Dawon Kahng ,  Ernest Edward La Bate ,  Martin Paul Lepselter ,  Joseph Raymond Ligenza

IPC分类号： H01L21/8247 ,  G11C16/04 ,  H01L21/28 ,  H01L29/788 ,  H01L29/792 ,  H01L45/00 ,  H01L11/00 ,  H01L15/00 ,  B05D5/12

CPC分类号： H01L21/28282 ,  G11C16/0466 ,  H01L29/792 ,  H01L45/00

摘要： An SI.sub.1 I.sub.2 M (semiconductor-insulator.sub.1 -insulator.sub.2 -metal) memory structure, containing an impurity such as tungsten concentrated in a region including the interface ("I.sub.1 I.sub.2 ") region between the I.sub.1 and I.sub.2 region, is fabricated by depositing an oxide of the impurity, such as tungsten trioxide, on the then exposed, I.sub.1 layer prior to fabricating the I.sub.2 layer. The oxide of the impurity, such as tungsten trioxide, can be advantageously deposited by means of reactive evaporation.

公开(公告)号：US20090218339A1

公开(公告)日：2009-09-03

申请号：US12290390

申请日：2008-10-31

申请人： Martin Paul Lepselter

发明人： Martin Paul Lepselter

IPC分类号： H05B6/76

CPC分类号： H05B6/763 ,  H05B6/766

摘要： This invention relates to a method for producing a low-cost solution to the problem of radiation leakage that escapes from modern microwave ovens due to the door cracks that form in the under-size bezels used in today's microwave oven market. The appliqué structure of the Patent includes a ⅛ inch diameter copper wire that is used to terminate the field lines of any escaping radiation thus preventing leakage beyond the oven itself.

摘要翻译： 本发明涉及一种用于生产由于在当今微波炉市场中使用的小尺寸挡板形成的门裂纹而从现代微波炉逸出的辐射泄漏问题的低成本解决方案。 该专利的贴布结构包括1/8英寸直径的铜线，其用于终止任何逃逸辐射的场线，从而防止超过烤箱本身的泄漏。