摘要:
A carrier generating unit applies a carrier that monotonically decreases to a switching control unit during either one of a first period that is a period immediately following a period in which a voltage command value is a value not more than a minimum value of the carrier, the voltage command value taking a first predetermined value larger than the minimum value of the carrier in the first period, and a second period that is a period immediately preceding a period in which the voltage command value is not less than a maximum value of the carrier, the voltage command value taking a second predetermined value smaller than the maximum value in the second period.
摘要:
A semiconductor integrated circuit test method which reduces the required data volume for testing and efficiently detects faults in a circuit to be tested, the method comprising means 110 to generate identical pattern sequences repeatedly and means 120 to control flipped bits in pattern sequences, in order to generate neighborhood pattern sequences and use the neighborhood patterns to test the circuit under test 130. The neighborhood patterns include, in whole or in part, such pattern sequences as ones without flipped bits, ones with all or some flipped bits in one pattern and ones with all or some flipped bits in consecutive patterns or patterns at regular intervals, the interval being equivalent to a given number of patterns. Because a test pattern generator is provided independently of the circuit to be tested, the problem of a prolonged design period can be eliminated, a loss in the operating speed of the circuit under test is minimized and a high fault coverage can be achieved with less hardware overhead and a smaller volume of test data.
摘要:
A mobile communication system actualizing a handoff is constructed by a mobile station, a first base transceiver station having a first radio communication area of a CDMA system, a second base transceiver station having a second radio communication area of a non-CDMA system, receiver stations and a base station controller. Herein, the mobile station travels from the first radio communication area to the second radio communication area while communicating with the first base transceiver station. When the mobile station detects an event that an Ec/Io value of a pilot signal transmitted thereto from the first base transceiver station exceeds a first threshold value, the base station controller determines the receiver stations which are located adjacent to the second base transceiver station. Then, the base station controller requests the receiver stations to receive uplink traffic signals respectively transmitted from the mobile station. Within the receiver stations, the base station controller selects a receiver station receiving the uplink traffic signal having a best Eb/No value, which is compared with a second threshold value. When it exceeds the second threshold value, the base station controller requests the mobile station to perform hard handoff from the first base transceiver station to the second base transceiver station while simultaneously requesting the second base transceiver station to enable handoff. Thus, it is possible to broaden the radio communication area of the CDMA system in a direction toward the service area of the non-CDMA system at a hard handoff mode.
摘要:
A carrier generating unit applies a carrier that monotonically decreases to a switching control unit during either one of a first period that is a period immediately following a period in which a voltage command value is a value not more than a minimum value of the carrier, the voltage command value taking a first predetermined value larger than the minimum value of the carrier in the first period, and a second period that is a period immediately preceding a period in which the voltage command value is not less than a maximum value of the carrier, the voltage command value taking a second predetermined value smaller than the maximum value in the second period.
摘要:
A manufacturing method of a semiconductor device capable of obtaining highly reliable semiconductor devices with the realization of high integration and high speed intended is provided. During processes after a desired circuit including a CMOS static type circuit is formed on a semiconductor substrate until product shipment, a first operation of feeding a predetermined input signal to the circuit and retrieving a first output signal corresponding to it and a second operation of giving an operating condition of increasing an ON resistance value of MOSFETs constituting the CMOS static type circuit and retrieving a second output signal corresponding to the condition are conducted, and a testing step of determining a failure by the first output signal varying from the second output signal.