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公开(公告)号：US20230333004A1
公开(公告)日：2023-10-19
申请号：US18300275
申请日：2023-04-13
发明人： Simon C. Bellemare , Ryan Lacy , Brendon Willey , Bryan Feigel
摘要： A material toughness testing apparatus includes a stylus having at least two cutting blades configured to engage with the sample and spaced apart to define a stretch passage therebetween and a stylus transport system configured to move the stylus along a path trajectory as the cutting blades cut the sample such that the sample is displaced on at least one side of the path trajectory. Each cutting blade has a blade dive surface and a blade lift surface that intersect to form a cutting edge configured to cut the sample along the path trajectory. Each blade dive surface and blade lift surface is configured to contact the sample when cutting the sample. The stylus is configured to separate the sample and configured to form a ligament in the stretch passage and to induce tension in the ligament due to opposing forces of the cutting blades and the sample.
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公开(公告)号：US10775288B1
公开(公告)日：2020-09-15
申请号：US15935417
申请日：2018-03-26
摘要： An apparatus for performing a contact mechanics test by engaging multiple styluses with a substrate through a contact load that is applied by a load applicator and transferred to the styluses through a stylus load transfer mechanism. This apparatus allows the styluses to be positioned in close proximity to allow for a smaller and more compact apparatus, with less uncertainty on the magnitude of the engagement load being applied to each stylus. Ultimately, this provides a more portable apparatus for testing of material properties.
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公开(公告)号：US11378502B2
公开(公告)日：2022-07-05
申请号：US15993424
申请日：2018-05-30
摘要： An apparatus for performing a contact mechanics test in a substrate includes a stylus having at least two contact elements. Each contact element has a contact profile, and the contact elements are disposed in the stylus to define a stretch passage therebetween. The stylus is configured to deform the substrate so as to cause the substrate to flow between the contact elements and induce tension in the substrate in order to generate and preserve micromodifications in the substrate. Methods of performing a contact mechanics test using the apparatus are also provided.
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公开(公告)号：US20140373608A1
公开(公告)日：2014-12-25
申请号：US14310611
申请日：2014-06-20
IPC分类号： G01N3/46
CPC分类号： G01N3/46
摘要： Provide in one embodiment is an apparatus, comprising an indentor wherein a tip thereof is configured to engage a sample surface, a surface-referencing device configured to establish the position of the indentor relative to the sample surface, a drive mechanism configured to move the indentor along the sample surface to form a scratch, and a measurement device configured to measure at least one of (i) a pile-up height of sample material removed from the scratch and (ii) a width of the scratch.
摘要翻译： 在一个实施例中，提供一种装置，其包括一个压头，其中其顶端被配置成接合一个样品表面，一个表面参考装置，被配置为建立该压头相对于该样品表面的位置;一个驱动机构， 以及测量装置，其被配置为测量以下中的至少一个：（i）从划痕中去除的样品材料的堆积高度和（ii）划痕的宽度中的至少一个。
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5.发明申请公开(公告)号：US20180275035A1
公开(公告)日：2018-09-27
申请号：US15993424
申请日：2018-05-30
CPC分类号： G01N3/44 , G01N3/46 , G01N3/60 , G01N19/06 , G01N2203/0053 , G01N2203/0066 , G01N2203/0078 , G06N5/04
摘要： An apparatus for performing a contact mechanics test in a substrate includes a stylus having at least two contact elements. Each contact element has a contact profile, and the contact elements are disposed in the stylus to define a stretch passage therebetween. The stylus is configured to deform the substrate so as to cause the substrate to flow between the contact elements and induce tension in the substrate in order to generate and preserve micromodifications in the substrate. Methods of performing a contact mechanics test using the apparatus are also provided.
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公开(公告)号：US09933346B2
公开(公告)日：2018-04-03
申请号：US15256276
申请日：2016-09-02
发明人： Simon C. Bellemare , Steven D. Palkovic , Phillip A. Soucy , Michael J. Tarkanian , Brendon M. Willey
CPC分类号： G01N3/46 , G01N3/60 , G01N2203/0032 , G01N2203/06 , G06F17/5018
摘要： An apparatus for performing a contact mechanics test on a substrate includes a stylus, a core configured to engage the stylus against the substrate, a stylus engagement mechanism configured to induce a contact load or a penetration depth to the stylus, a core engagement mechanism configured to maintain contact of the core and to move the core along the substrate surface, a frame configured to be fixed with respect to the apparatus or to be moved together with the core engagement mechanism as an assembly, a frame engagement mechanism configured to engage the frame with the substrate surface; and a substrate monitoring device configured to measure characteristics of substrate contact response and/or collect material machined from the substrate. Methods of performing a contact mechanics test are also provided.
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公开(公告)号：US11860082B1
公开(公告)日：2024-01-02
申请号：US16515817
申请日：2019-07-18
发明人： Simon C. Bellemare , Steven D. Palkovic , Brendon M. Willey , Soheil Safari Loaliyan , Parth P. Patel
CPC分类号： G01N19/08 , G01B11/02 , G01N1/32 , G01N3/42 , G01N3/46 , G01N33/207 , G01N2203/0082
摘要： A method for evaluating a weld in a formed object includes performing a contact mechanics test of a first region that includes the weld and storing one or more corresponding weld surface mechanical property measurements, performing a contact mechanics test of a second region that excludes the weld and storing one or more corresponding base material surface mechanical property measurements, determining a relative difference in the weld surface mechanical property measurements and the base material surface mechanical property measurements, determining one or more weld width measurements on the exterior surface of the formed object, and evaluating the weld based on the determined relative difference in the weld surface mechanical property measurements and the base material surface mechanical property measurements in relation to the determined weld width measurements in order to provide an index of weld quality that is traditionally measured through a destructive test or examination.
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公开(公告)号：US20160370272A1
公开(公告)日：2016-12-22
申请号：US15256276
申请日：2016-09-02
发明人： Simon C. Bellemare , Steven D. Palkovic , Phillip A. Soucy , Michael J. Tarkanian , Brendon M. Willey
CPC分类号： G01N3/46 , G01N3/60 , G01N2203/0032 , G01N2203/06 , G06F17/5018
摘要： An apparatus for performing a contact mechanics test on a substrate includes a stylus, a core configured to engage the stylus against the substrate, a stylus engagement mechanism configured to induce a contact load or a penetration depth to the stylus, a core engagement mechanism configured to maintain contact of the core and to move the core along the substrate surface, a frame configured to be fixed with respect to the apparatus or to be moved together with the core engagement mechanism as an assembly, a frame engagement mechanism configured to engage the frame with the substrate surface; and a substrate monitoring device configured to measure characteristics of substrate contact response and/or collect material machined from the substrate. Methods of performing a contact mechanics test are also provided.
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公开(公告)号：US09897523B2
公开(公告)日：2018-02-20
申请号：US15061415
申请日：2016-03-04
发明人： Simon C. Bellemare , Steven D. Palkovic , Phillip A. Soucy , Michael J. Tarkanian , Brendon M. Willey
CPC分类号： G01N3/46 , G01N3/60 , G01N2203/0078 , G01N2203/0098 , G01N2203/0244 , G06F17/5018 , Y02T10/82
摘要： An apparatus for performing a contact mechanics test on a substrate includes a stylus, a core configured to engage the stylus against the substrate, a stylus engagement mechanism configured to induce a contact load or a penetration depth to the stylus, a core engagement mechanism configured to maintain contact of the core and to move the core along the substrate surface, a frame configured to be fixed with respect to the apparatus or to be moved together with the core engagement mechanism as an assembly, a frame engagement mechanism configured to engage the frame with the substrate surface; and a substrate monitoring device configured to measure characteristics of substrate contact response and/or collect material machined from the substrate. Methods of performing a contact mechanics test are also provided.
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公开(公告)号：US09778158B2
公开(公告)日：2017-10-03
申请号：US14310611
申请日：2014-06-20
IPC分类号： G01N3/46
CPC分类号： G01N3/46
摘要： Provide in one embodiment is an apparatus, comprising an indentor wherein a tip thereof is configured to engage a sample surface, a surface-referencing device configured to establish the position of the indentor relative to the sample surface, a drive mechanism configured to move the indentor along the sample surface to form a scratch, and a measurement device configured to measure at least one of (i) a pile-up height of sample material removed from the scratch and (ii) a width of the scratch.
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