摘要:
An integrated circuit is designed to improve yield when manufacturing the integrated circuit, by obtaining a design element from a set of design elements used in designing integrated circuits. A variant design element is created based on the obtained design element, where a feature of the obtained design element is modified to create the variant design element. A yield to area ratio for the variant design element is determined. If the yield to area ratio of the variant design element is greater than a yield to area ratio of the obtained design element, the variant design element is retained to be used in designing the integrated circuit.
摘要:
A method of reducing power consumption of an electric circuit having a primary supply voltage and first and second circuit blocks is discussed. The method includes determining for the first circuit block an operation time for a first critical path of the first circuit block and determining for the second circuit block an operation time of a second critical path of the second circuit block. From those operation times, the method determines that the operation time of the first critical path is faster than the operation time of the second critical path. The method then creates a first supply voltage for the first circuit block that is less than the primary supply voltage in response to determining that the operation time of the first critical path is faster than the operation time of the second critical path.
摘要:
Library design elements (102) are analyzed for manufacturability to be used in designing an IC chip to be manufactured using a particular manufacturing process. The library design elements from a library are obtained. Manufacturability attributes (104) of the library design elements are determined for the particular manufacturing process, where manufacturability attributes include yield-related attributes. Library views (106) with manufacturability attributes for the library design elements are then generated, which are utilizing by an electronic design automation (EDA) tool.
摘要:
An integrated circuit is designed to improve yield when manufacturing the integrated circuit, by obtaining a design element from a set of design elements used in designing integrated circuits. A variant design element is created based on the obtained design element, where a feature of the obtained design element is modified to create the variant design element. A yield to area ratio for the variant design element is determined. If the yield to area ratio of the variant design element is greater than a yield to area ratio of the obtained design element, the variant design element is retained to be used in designing the integrated circuit