公开(公告)号：US5049461A

公开(公告)日：1991-09-17

申请号：US367815

申请日：1989-06-19

申请人： Patrick C. Arnett ,  Andres Bryant ,  John S. Foster ,  Jane E. Frommer ,  Jon A. C. Iwata

发明人： Patrick C. Arnett ,  Andres Bryant ,  John S. Foster ,  Jane E. Frommer ,  Jon A. C. Iwata

IPC分类号： G01Q60/00 ,  G03F1/00 ,  G03F7/20 ,  H01J37/317 ,  H01L21/027 ,  H01L21/30

CPC分类号： H01J37/3174 ,  B82Y10/00 ,  B82Y40/00 ,  G03F1/78 ,  G03F7/2049 ,  H01J2237/31759 ,  Y10S430/143 ,  Y10S977/855

摘要： A high resolution lithographic mask having a desired pattern is generated and used to replicate the pattern onto a film in a one-step process.A film of phase-changeable material in one state is provided on a conductive substrate. By scanning tunneling microscope techniques, the state and thereby the conductivity or other property of the material in selected areas of the film is changed to a second state to provide from the film a mask having a desired pattern defined by crystalline areas. Amorphous material need not be removed from the mask.To replicate the pattern on another film, the latter is placed on another conductive substrate; the mask is positioned with its patterned side within electron tunneling distance of said other film; and the pattern is replicated in a single step by applying a voltage between the mask and other film. The voltage charge on said mask is positive and negative on said other film to cause current to flow in the crystalline areas of said mask and, by electron flow from said film to the mask, eliminate backscattering and insure high resolution.As the state changes (e.g., from crystalline to amorphous) in the pattern areas of said other film, conductivity in the crystalline areas will progressively decrease and, by causing a corresponding reduction in current flow in the crystalline areas, minimize the risk of undesired broadening of exposed areas of said other film.

公开(公告)号：US5357520A

公开(公告)日：1994-10-18

申请号：US830032

申请日：1992-01-31

申请人： Patrick C. Arnett ,  Jonathan D. Coker ,  Richard L. Galbraith ,  Yaw-Shing Tang ,  Roger W. Wood

发明人： Patrick C. Arnett ,  Jonathan D. Coker ,  Richard L. Galbraith ,  Yaw-Shing Tang ,  Roger W. Wood

IPC分类号： G11B5/09 ,  G11B20/10 ,  G11B20/18 ,  G11C29/00

CPC分类号： G11B20/10194 ,  G11B20/10055 ,  G11B20/182

摘要： A method and apparatus are provided for determining an adjustable precompensation value in a partial-response maximum-likelihood (PRML) data channel. The PRML data channel includes an adjustable precompensation function for modulating the write data waveform. A predetermined test pattern is written using write circuitry in the disk file. The predetermined test pattern is insensitive to channel misequalization and provides a reference for gain and timing control. The written predetermined test pattern is read back using read circuitry in the disk file. An error in sample values in the read back predetermined test pattern is identified using logic provided in the PRML data channel while performing a standard read operation of a data sector written with the test pattern. The adjustable write precompensation value is adjusted responsive to identifying an error.

摘要翻译： 提供了一种用于确定部分响应最大似然（PRML）数据信道中的可调节预补偿值的方法和装置。 PRML数据通道包括用于调制写数据波形的可调预补偿功能。 使用磁盘文件中的写入电路写入预定的测试模式。 预定的测试模式对信道估计不敏感，并为增益和定时控制提供参考。 使用磁盘文件中的读取电路读取写入的预定测试模式。 使用在PRML数据通道中提供的逻辑，在执行用测试图案写入的数据扇区的标准读取操作的同时，使用读取的预定测试图案中的采样值的错误来识别。 响应于识别错误来调整可调写入预补偿值。

公开(公告)号：US5602806A

公开(公告)日：1997-02-11

申请号：US495967

申请日：1995-06-28

申请人： Patrick C. Arnett ,  David E. Call ,  Blair I. Finkelstein ,  Glen A. Jaquette ,  Ernesto E. Marinero

发明人： Patrick C. Arnett ,  David E. Call ,  Blair I. Finkelstein ,  Glen A. Jaquette ,  Ernesto E. Marinero

IPC分类号： G11B7/24 ,  G11B7/125 ,  G11B11/10 ,  G11B11/105 ,  G11B20/18 ,  G11B11/00

CPC分类号： G11B7/126 ,  G11B11/10519 ,  G11B11/1053 ,  G11B20/1816 ,  G11B11/10506 ,  G11B11/10595

摘要： A light intensity, direct overwrite, magneto-optical system generates signals such that, during the formation of a recording mark on an optical disk, a laser is driven a) at a pedestal power level, then b) at a quench power level for a first quench period t.sub.1, the quench power level being less than the pedestal power level, then c) at a write power level for a write period t.sub.2 whereby the reference bit becomes oriented in the writing direction, the write power level being greater than the pedestal power level, then d) at the quench power level for a second quench period t.sub.3, and then e) at the pedestal power level until the formation of another recording mark begins. The system is provided with a controller to determine optimal lengths of the quench periods t.sub.1 and t.sub.3, thereby reducing thermal interference between closely spaced recording marks. From sample recording marks, recorded with different quench periods t.sub.1 and t.sub.3, the controller calculates a "quality" value, such as bit error rate, jitter or figure of merit, then determines from the quality value the quench periods t.sub.1 and t.sub.3 which will produce the highest quality recording marks.

摘要翻译： 光强度直接覆盖磁光系统产生信号，使得在光盘上形成记录标记期间，以基座功率电平a）驱动激光器，然后b）以骤冷功率电平为 第一骤冷期t1，骤冷功率水平小于基座功率电平，然后c）在写入周期t2的写入功率电平下，由此参考位在写入方向上变向，写入功率电平大于基座 功率电平，然后d）在骤冷功率电平下进行第二骤冷期t3，然后e）处于基座功率电平，直到另一个记录标记的形成开始。 该系统设置有控制器以确定骤冷时段t1和t3的最佳长度，由此减少紧密间隔的记录标记之间的热干扰。 从不同猝灭期t1和t3记录的样品记录标记中，控制器计算诸如误码率，抖动或品质因数的“质量”值，然后根据质量值确定将产生的淬火周期t1和t3 最高质量的录音标记。