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公开(公告)号:US5546012A
公开(公告)日:1996-08-13
申请号:US227936
申请日:1994-04-15
CPC分类号: G01R1/07378
摘要: Disclosed is a probe card assembly which includes an interface card having a plurality of contact pads on at least one surface thereof, a probe card having a plurality of contact pads on at least one surface thereof, and a carousel interposed between the interface card and the probe card having a plurality of connecting means for making contact between the interface card contact pads and probe card contact pads. Also disclosed are the probe card.
摘要翻译: 公开了一种探针卡组件,其包括在其至少一个表面上具有多个接触焊盘的接口卡,在其至少一个表面上具有多个接触焊盘的探针卡,以及插入在接口卡和接口卡之间的转盘 探针卡具有用于在接口卡接触垫和探针卡接触垫之间接触的多个连接装置。 还公开了探针卡。
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公开(公告)号:US5629631A
公开(公告)日:1997-05-13
申请号:US427395
申请日:1995-04-24
CPC分类号: G01R1/07378
摘要: Disclosed is a probe card assembly which includes an interface card having a plurality of contact pads on at least one surface thereof, a probe card having a plurality of contact pads on at least one surface thereof, and a carousel interposed between the interface card and the probe card having a plurality of connecting means for making contact between the interface card contact pads and probe card contact pads.Also disclosed are the probe card, interface card and carousel as separate articles of manufacture.
摘要翻译: 公开了一种探针卡组件,其包括在其至少一个表面上具有多个接触焊盘的接口卡,在其至少一个表面上具有多个接触焊盘的探针卡,以及插入在接口卡和接口卡之间的转盘 探针卡具有用于在接口卡接触垫和探针卡接触垫之间接触的多个连接装置。 还公开了探针卡,接口卡和转盘作为单独的制造商品。
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公开(公告)号:US5530371A
公开(公告)日:1996-06-25
申请号:US427397
申请日:1995-04-24
CPC分类号: G01R1/07378
摘要: A carousel for a probe card assembly which includes opposed planar rings supported and spaced apart by flexible supports. The flexible supports, while supporting the planar rings, also allow the planar rings to rotate with respect to each other. Also included are a plurality of connecting means which pass through perforations in the planar rings so as to thereby make interconnection between a probe card and an interface card in a semiconductor test system.
摘要翻译: 用于探针卡组件的转盘,其包括由柔性支撑件支撑并间隔开的相对的平面环。 柔性支撑件在支撑平面环的同时也允许平面环相对于彼此旋转。 还包括通过平面环中的穿孔的多个连接装置,从而在半导体测试系统中进行探针卡和接口卡之间的互连。
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