摘要:
A wireless electronic device may contain at least one antenna tuning element for use in tuning the operating frequency range of the device. The antenna tuning element may include radio-frequency switches, continuously/semi-continuously adjustable components such as tunable resistors, inductors, and capacitors, and other load circuits that provide desired impedance characteristics. A test station may be used to measure the radio-frequency characteristics associated with the tuning element. The test station may provide adjustable temperature, power, and impedance control to help emulate a true application environment for the tuning element without having to place the tuning element within an actual device during testing. The test system may include at least one signal generator and a tester for measuring harmonic distortion values and may include at least two signal generators and a tester for measuring intermodulation distortion values. During testing, the antenna tuning element may be placed in a series or shunt configuration.
摘要:
A test system for testing multiple-input and multiple-output (MIMO) systems is provided. The test system may convey radio-frequency (RF) signals bidirectionally between a device under test (DUT) and at least one base station. The DUT may be placed within a test chamber during testing. An antenna mounting structure may surround the DUT. Multiple antennas may be mounted on the antenna mounting structure to transmit and receive RF signals to and from the DUT. A first group of dual-polarized antennas may be coupled to the base station through downlink circuitry. A second group of dual-polarized antennas may be coupled to the base station through uplink circuitry. The uplink and downlink circuitry may each include a splitter/combiner, channel emulators, amplifier circuits, and switch circuitry. The channel emulators and amplifier circuits may be configured to provide desired path loss, spatial interference, and channel characteristics to model real-world wireless network transmission.
摘要:
A wireless electronic device may contain an antenna tuning element for tuning the device's operating frequency range. The antenna tuning element may include radio-frequency switches, continuously/semi-continuously adjustable components such as tunable resistors, inductors, and capacitors, etc. A test system may be used to measure the radio-frequency characteristics associated with the tuning element assembled with an electronic device. The test system may include a test host, a test chamber, a signal generator, power meters, and radio-frequency testers. The electronic device under test (DUT) may be placed in the test chamber. The signal generator may generate radio-frequency test signals for energizing the antenna tuning element. The power meters and radio-frequency testers may be used to measure conducted and radiated signals emitted from the DUT while the DUT is placed in different desired orientations. A phantom object is optionally placed in the vicinity of the DUT to simulate actual user scenario.
摘要:
A wireless electronic device may contain an antenna tuning element for tuning the device's operating frequency range. The antenna tuning element may include radio-frequency switches, continuously/semi-continuously adjustable components such as tunable resistors, inductors, and capacitors, etc. A test system may be used to measure the radio-frequency characteristics associated with the tuning element assembled with an electronic device. The test system may include a test host, a test chamber, a signal generator, power meters, and radio-frequency testers. The electronic device under test (DUT) may be placed in the test chamber. The signal generator may generate radio-frequency test signals for energizing the antenna tuning element. The power meters and radio-frequency testers may be used to measure conducted and radiated signals emitted from the DUT while the DUT is placed in different desired orientations. A phantom object is optionally placed in the vicinity of the DUT to simulate actual user scenario.
摘要:
A wireless electronic device may contain at least one antenna tuning element for use in tuning the operating frequency range of the device. The antenna tuning element may include radio-frequency switches, continuously/semi-continuously adjustable components such as tunable resistors, inductors, and capacitors, and other load circuits that provide desired impedance characteristics. A test station may be used to measure the radio-frequency characteristics associated with the tuning element. The test station may provide adjustable temperature, power, and impedance control to help emulate a true application environment for the tuning element without having to place the tuning element within an actual device during testing. The test system may include at least one signal generator and a tester for measuring harmonic distortion values and may include at least two signal generators and a tester for measuring intermodulation distortion values. During testing, the antenna tuning element may be placed in a series or shunt configuration.
摘要:
A test system for testing multiple-input and multiple-output (MIMO) systems is provided. The test system may convey radio-frequency (RF) signals bidirectionally between a base station emulator and a device under test (DUT). The DUT may be placed within a test chamber during testing. An antenna mounting structure may surround the DUT. Multiple antennas may be mounted on the antenna mounting structure to transmit and receive RF signals to and from the DUT. A first group of antennas may be coupled to the base station emulator through downlink circuitry. A second group of antennas may be coupled to the base station emulator through uplink circuitry. The uplink and downlink circuitry may each include a splitter, channel emulators, and amplifier circuits. The channel emulators and amplifier circuits may be configured to provide desired path loss and channel characteristics to model real-world wireless network transmission.
摘要:
A test system for testing multiple-input and multiple-output (MIMO) systems is provided. The test system may convey radio-frequency (RF) signals bidirectionally between a base station emulator and a device under test (DUT). The DUT may be placed within a test chamber during testing. An antenna mounting structure may surround the DUT. Multiple antennas may be mounted on the antenna mounting structure to transmit and receive RF signals to and from the DUT. A first group of antennas may be coupled to the base station emulator through downlink circuitry. A second group of antennas may be coupled to the base station emulator through uplink circuitry. The uplink and downlink circuitry may each include a splitter, channel emulators, and amplifier circuits. The channel emulators and amplifier circuits may be configured to provide desired path loss and channel characteristics to model real-world wireless network transmission.
摘要:
The improved pinch valve assembly (10) functions to control the flow of fluids on a fluid system. The improved pinch valve assembly (10) controls plurality of fluid containing tubing (16). When the solenoid coil (22) is energized the plunger (28), which is securely attached to the shaft (31) which has a first pin (18A) and a second pin (18B) securely attached perpendicular to the longitudinal axis of the shaft (31), moves forward. The forward motion of the shaft (31) causes the first pin (18A) to decompress the first tubing (16A) and the third tubing (16C) permitting fluid to flow therethrough. The forward motion of the shaft (31) further causes the second pin (18B) to also move forward compressing the second tubing (16B) and the fourth tubing (16D) stopping fluid flow. The forward motion of the shaft (31) still further causes the third pin (18C) to compress the helical spring (13). When the solenoid coil (22) is de-energized the plunger (28), which is securely attached to the shaft (31) which has the first pin (18A) and the second pin (18B) securely attached perpendicular to the longitudinal axis of the shaft (31), moves aft. The aftward motion of the shaft (31) causes the first pin (18A) to compress the first tubing (16A) and the third tubing (16C) stopping fluid to flow therethrough. The aft motion of the shaft (31) further causes the second pin (18B) to also move aft releasing the second tubing (16B) and the fourth tubing (16D) permitting fluid flow. The aftward motion of the shaft (31) still further causes the third pin (18C) to decompress the helical spring (13). The helical spring (13) is biased in its released state to have sufficient force to compress the compress the first tubing (16A) and the third tubing (16C).