摘要:
A test system for testing multiple-input and multiple-output (MIMO) systems is provided. The test system may convey radio-frequency (RF) signals bidirectionally between a base station emulator and a device under test (DUT). The DUT may be placed within a test chamber during testing. An antenna mounting structure may surround the DUT. Multiple antennas may be mounted on the antenna mounting structure to transmit and receive RF signals to and from the DUT. A first group of antennas may be coupled to the base station emulator through downlink circuitry. A second group of antennas may be coupled to the base station emulator through uplink circuitry. The uplink and downlink circuitry may each include a splitter, channel emulators, and amplifier circuits. The channel emulators and amplifier circuits may be configured to provide desired path loss and channel characteristics to model real-world wireless network transmission.
摘要:
A test system for testing multiple-input and multiple-output (MIMO) systems is provided. The test system may convey radio-frequency (RF) signals bidirectionally between a base station emulator and a device under test (DUT). The DUT may be placed within a test chamber during testing. An antenna mounting structure may surround the DUT. Multiple antennas may be mounted on the antenna mounting structure to transmit and receive RF signals to and from the DUT. A first group of antennas may be coupled to the base station emulator through downlink circuitry. A second group of antennas may be coupled to the base station emulator through uplink circuitry. The uplink and downlink circuitry may each include a splitter, channel emulators, and amplifier circuits. The channel emulators and amplifier circuits may be configured to provide desired path loss and channel characteristics to model real-world wireless network transmission.
摘要:
A test system for testing multiple-input and multiple-output (MIMO) systems is provided. The test system may convey radio-frequency (RF) signals bidirectionally between a device under test (DUT) and at least one base station. The DUT may be placed within a test chamber during testing. An antenna mounting structure may surround the DUT. Multiple antennas may be mounted on the antenna mounting structure to transmit and receive RF signals to and from the DUT. A first group of dual-polarized antennas may be coupled to the base station through downlink circuitry. A second group of dual-polarized antennas may be coupled to the base station through uplink circuitry. The uplink and downlink circuitry may each include a splitter/combiner, channel emulators, amplifier circuits, and switch circuitry. The channel emulators and amplifier circuits may be configured to provide desired path loss, spatial interference, and channel characteristics to model real-world wireless network transmission.
摘要:
A wireless electronic device may contain an antenna tuning element for tuning the device's operating frequency range. The antenna tuning element may include radio-frequency switches, continuously/semi-continuously adjustable components such as tunable resistors, inductors, and capacitors, etc. A test system may be used to measure the radio-frequency characteristics associated with the tuning element assembled with an electronic device. The test system may include a test host, a test chamber, a signal generator, power meters, and radio-frequency testers. The electronic device under test (DUT) may be placed in the test chamber. The signal generator may generate radio-frequency test signals for energizing the antenna tuning element. The power meters and radio-frequency testers may be used to measure conducted and radiated signals emitted from the DUT while the DUT is placed in different desired orientations. A phantom object is optionally placed in the vicinity of the DUT to simulate actual user scenario.
摘要:
A wireless electronic device may contain an antenna tuning element for tuning the device's operating frequency range. The antenna tuning element may include radio-frequency switches, continuously/semi-continuously adjustable components such as tunable resistors, inductors, and capacitors, etc. A test system may be used to measure the radio-frequency characteristics associated with the tuning element assembled with an electronic device. The test system may include a test host, a test chamber, a signal generator, power meters, and radio-frequency testers. The electronic device under test (DUT) may be placed in the test chamber. The signal generator may generate radio-frequency test signals for energizing the antenna tuning element. The power meters and radio-frequency testers may be used to measure conducted and radiated signals emitted from the DUT while the DUT is placed in different desired orientations. A phantom object is optionally placed in the vicinity of the DUT to simulate actual user scenario.
摘要:
A wireless electronic device may contain at least one antenna tuning element for use in tuning the operating frequency range of the device. The antenna tuning element may include radio-frequency switches, continuously/semi-continuously adjustable components such as tunable resistors, inductors, and capacitors, and other load circuits that provide desired impedance characteristics. A test station may be used to measure the radio-frequency characteristics associated with the tuning element. The test station may provide adjustable temperature, power, and impedance control to help emulate a true application environment for the tuning element without having to place the tuning element within an actual device during testing. The test system may include at least one signal generator and a tester for measuring harmonic distortion values and may include at least two signal generators and a tester for measuring intermodulation distortion values. During testing, the antenna tuning element may be placed in a series or shunt configuration.
摘要:
A wireless electronic device may contain at least one antenna tuning element for use in tuning the operating frequency range of the device. The antenna tuning element may include radio-frequency switches, continuously/semi-continuously adjustable components such as tunable resistors, inductors, and capacitors, and other load circuits that provide desired impedance characteristics. A test station may be used to measure the radio-frequency characteristics associated with the tuning element. The test station may provide adjustable temperature, power, and impedance control to help emulate a true application environment for the tuning element without having to place the tuning element within an actual device during testing. The test system may include at least one signal generator and a tester for measuring harmonic distortion values and may include at least two signal generators and a tester for measuring intermodulation distortion values. During testing, the antenna tuning element may be placed in a series or shunt configuration.
摘要:
Electronic devices are provided that contain wireless communications circuitry. The wireless communications circuitry may include radio-frequency transceiver circuitry and antenna structures. A parallel-fed loop antenna may be formed from portions of a conductive bezel and a ground plane. The antenna may operate in multiple communications bands. The bezel may surround a peripheral portion of a display that is mounted to the front of an electronic device. The bezel may contain a gap. Antenna feed terminals for the antenna may be located on opposing sides of the gap. A variable capacitor may bridge the gap. An inductive element may bridge the gap and the antenna feed terminals. A switchable inductor may be coupled in parallel with the inductive element. Tunable matching circuitry may be coupled between one of the antenna feed terminals and a conductor in a coaxial cable connecting the transceiver circuitry to the antenna.
摘要:
A wireless electronic device may include antenna structures and antenna tuning circuitry. The device may include a display mounted within a housing. A peripheral conductive member may run around the edges of the display and housing. Dielectric-filled gaps may divide the peripheral conductive member into individual segments. A ground plane may be formed within the housing. The ground plane and the segments of the peripheral conductive member may form antennas in upper and lower portions of the housing. The antenna tuning circuitry may include switchable inductor circuits and variable capacitor circuits for the upper and lower antennas. The switchable inductor circuits associated with the upper antenna may be tuned to provide coverage in at least two high-band frequency ranges of interest, whereas the variable capacitor circuits associated with the upper antenna may be tuned to provide coverage in at least two low-band frequency ranges of interest.
摘要:
A test system for testing multiple-input and multiple-output (MIMO) systems is provided. The test system may convey signals bidirectionally between two test chambers. Each test chamber may be lined with foam to minimize electromagnetic reflections. Each test chamber may include structure three-dimensional array of test antennas. The test antennas may be mounted in a sphere using an antenna mounting structure. The antenna mounting structure may include multiple rings of different sizes. Test antennas may be embedded in the inner walls of the antenna mounting structure. There may be multiple receiving antennas located in each test chamber. One test chamber may include a device under test inside an array of test antennas and another test chamber may include base station antennas inside another array of test antennas. Signals may be conveyed between the test chambers using channel emulators.