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    Test circuit and display device having the same
    1.
    发明申请
    Test circuit and display device having the same 有权

    公开(公告)号：US20060156111A1

    公开(公告)日：2006-07-13

    申请号：US11290792

    申请日：2005-11-30

    申请人： Ryo Nozawa

    发明人： Ryo Nozawa

    IPC分类号： G01R31/28

    CPC分类号： G09G3/006 ,  G09G3/3208 ,  G09G3/3648

    摘要： A test circuit and a test method capable of easily and accurately determining the presence or absence of a defect as well as defective points. The test circuit of the invention has a plurality of shift registers, a plurality of latch circuits, a plurality of first NOR circuits, a plurality of second NOR circuits, a plurality of first NAND circuits, a plurality of second NAND circuits, and a plurality of inverters. A plurality of source signal lines provided in a pixel area are connected to the respective plurality of latch circuits, and a test output is outputted from the inverter of the last stage.

    Driver circuit of semiconductor display device and driving method thereof and electronic apparatus
    2.
    发明申请
    Driver circuit of semiconductor display device and driving method thereof and electronic apparatus 审中-公开
    半导体显示装置的驱动电路及其驱动方法及电子设备

    公开(公告)号：US20050156838A1

    公开(公告)日：2005-07-21

    申请号：US11008137

    申请日：2004-12-10

    申请人： Keisuke Miyagawa ,  Tomoyuki Iwabuchi ,  Ryo Nozawa ,  Yasunori Yoshida ,  Akihiro Kimura

    发明人： Keisuke Miyagawa ,  Tomoyuki Iwabuchi ,  Ryo Nozawa ,  Yasunori Yoshida ,  Akihiro Kimura

    IPC分类号： H01L51/50 ,  G09G3/20 ,  G09G3/30 ,  G09G3/32 ,  H05B33/08 ,  H05B33/14

    CPC分类号： G09G3/32 ,  G09G2320/0247 ,  G09G2320/041 ,  G09G2340/0435

    摘要： A semiconductor display device that operates normally at a room temperature may not operate normally at a low temperature. Meanwhile, in semiconductor display devices with the same circuit configuration and the same driving method, the higher the operating frequency is, the better the display quality is. Thus, a semiconductor display device the operating frequency of which is set on the basis of a room temperature may not operate normally at a low temperature. According to the invention, the temperature and the operating state of a semiconductor display device are measured to vary the operating frequency in accordance with the measurement result. More specifically, the operating frequency is decreased at a low temperature to obtain normal operation, while the operating frequency is increased at a room temperature and a high temperature to improve the display quality.

    摘要翻译： 在室温下正常工作的半导体显示装置在低温下可能无法正常工作。 同时，在具有相同电路结构和相同驱动方式的半导体显示装置中，工作频率越高，显示质量越好。 因此，其工作频率基于室温设定的半导体显示装置在低温下可能无法正常工作。 根据本发明，测量半导体显示装置的温度和操作状态，以根据测量结果改变工作频率。 更具体地，在低温下工作频率降低以获得正常操作，而在室温和高温下工作频率增加以提高显示质量。

    Test circuit and display device having the same
    3.
    发明授权
    Test circuit and display device having the same 有权
    具有相同功能的测试电路和显示装置

    公开(公告)号：US07518602B2

    公开(公告)日：2009-04-14

    申请号：US11290792

    申请日：2005-11-30

    申请人： Ryo Nozawa

    发明人： Ryo Nozawa

    IPC分类号： G09G5/00

    CPC分类号： G09G3/006 ,  G09G3/3208 ,  G09G3/3648

    摘要： A test circuit and a test method capable of easily and accurately determining the presence or absence of a defect as well as defective points. The test circuit of the invention has a plurality of shift registers, a plurality of latch circuits, a plurality of first NOR circuits, a plurality of second NOR circuits, a plurality of first NAND circuits, a plurality of second NAND circuits, and a plurality of inverters. A plurality of source signal lines provided in a pixel area are connected to the respective plurality of latch circuits, and a test output is outputted from the inverter of the last stage.

    摘要翻译： 一种测试电路和测试方法，其能够容易且准确地确定缺陷的存在或不存在以及缺陷点。 本发明的测试电路具有多个移位寄存器，多个锁存电路，多个第一NOR电路，多个第二NOR电路，多个第一NAND电路，多个第二NAND电路和多个 的逆变器。 设置在像素区域中的多个源极信号线连接到相应的多个锁存电路，并且从最后一级的反相器输出测试输出。