公开(公告)号：US09618573B2

公开(公告)日：2017-04-11

申请号：US14603251

申请日：2015-01-22

Applicant: Shing Kai Yip ,  Chi Wah Cheng

Inventor： Shing Kai Yip ,  Chi Wah Cheng

IPC: G01R31/01 ,  G01R31/28 ,  G01R1/067 ,  G01R31/26 ,  G01R1/00 ,  G01N1/00

CPC classification number: G01R31/2891 ,  G01N1/00 ,  G01N2201/00 ,  G01R1/00 ,  G01R1/06705 ,  G01R31/26 ,  G01R31/2893

Abstract: A test handler comprises an orientation changing device having a device holder for holding electronic devices, the device holder having a vertical rotary axis. A conveying device is operative to convey electronic devices to the device holder, and a rotary motor connected to the device holder is operative to rotate the device holder about the vertical rotary axis to change an orientation of the electronic device held on it. A rotary turret of the test handler has a plurality of pick heads arranged on the rotary turret, and each pick head is configured to pick up electronic devices from the device holder.

公开(公告)号：US06971793B2

公开(公告)日：2005-12-06

申请号：US10395401

申请日：2003-03-21

Applicant: Ching Man Stanley Tsui ,  Sai Kit Wong ,  Shing Kai Yip

Inventor： Ching Man Stanley Tsui ,  Sai Kit Wong ,  Shing Kai Yip

IPC: G01J5/00 ,  G01R1/04 ,  G01R31/28

CPC classification number: G01R31/2874 ,  G01J5/00 ,  G01J5/0096 ,  G01J5/12 ,  G01R1/0458 ,  G01R31/2867 ,  G01R31/3025

Abstract: The invention provides a temperature monitoring system for a semiconductor test handler. A preparation stage brings a test device to a predetermined temperature for testing at a test platform at said predetermined temperature. At least one radiation sensor, such as a thermopile device, is employed in the test handler for detecting a surface temperature of the test device by measuring radiation emitted from the test device.

Abstract translation: 本发明提供了一种用于半导体测试处理器的温度监测系统。 准备阶段使测试装置达到预定温度，以在测试台在所述预定温度下进行测试。 在测试处理器中采用至少一个辐射传感器，例如热电堆设备，用于通过测量从测试设备发出的辐射来检测测试设备的表面温度。

公开(公告)号：US20150204943A1

公开(公告)日：2015-07-23

申请号：US14603251

申请日：2015-01-22

Applicant: Shing Kai YIP ,  Chi Wah CHENG

Inventor： Shing Kai YIP ,  Chi Wah CHENG

IPC: G01R31/28 ,  G01R31/26 ,  G01R1/067

CPC classification number: G01R31/2891 ,  G01N1/00 ,  G01N2201/00 ,  G01R1/00 ,  G01R1/06705 ,  G01R31/26 ,  G01R31/2893

Abstract: A test handler comprises an orientation changing device having a device holder for holding electronic devices, the device holder having a vertical rotary axis. A conveying device is operative to convey electronic devices to the device holder, and a rotary motor connected to the device holder is operative to rotate the device holder about the vertical rotary axis to change an orientation of the electronic device held on it. A rotary turret of the test handler has a plurality of pick heads arranged on the rotary turret, and each pick head is configured to pick up electronic devices from the device holder.

Abstract translation: 测试处理器包括具有用于保持电子设备的设备保持器的定向改变设备，该设备保持器具有竖直旋转轴线。 传送装置用于将电子装置传送到装置保持器，并且连接到装置保持器的旋转电机可操作以围绕垂直旋转轴线旋转装置保持架以改变保持在其上的电子装置的取向。 测试处理器的旋转转台具有设置在旋转转台上的多个拾取头，并且每个拾取头构造成从装置保持器拾取电子装置。