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1.发明授权公开(公告)号：US06690182B2
公开(公告)日：2004-02-10
申请号：US09899908
申请日：2001-07-06
IPC分类号： G01R2708
CPC分类号： G01N17/02 , G01N17/006 , G01N33/383
摘要： A system for monitoring the material changes in a structure is disclosed through the use monitoring instruments embedded within the structure. The instruments have at least one sensor with electrodes in contact with the surrounding material and electronics that are contained within the instrument. The sensor signals are converted to digital and transmitted to an external data logger or computer for display of the digitized signals. The connection between the microcontroller and the data logger can be either through hardwire or RF. Power is provided to the electronic sensors through either external or local methods. A power management system can be used to place the electronics into a sleep mode when not in use. The electronics are encapsulated within potting material within an instrument case that is manufactured from a material having a flexural modulus equal to, or greater than, the surrounding material to prevent mechanical failure of the device before failure of the surrounding material. The case has protective trays to protect the electrodes and rounded adjacent connection lengths to prevent the case from developing cracks.
摘要翻译： 通过嵌入结构内的使用监测仪器来公开用于监测结构中材料变化的系统。 该仪器具有至少一个传感器，其中电极与包含在仪器内的周围材料和电子元件接触。 传感器信号被转换为数字信号并传输到外部数据记录器或计算机以显示数字化信号。 微控制器和数据记录器之间的连接可以通过硬线或RF。 通过外部或局部方法将功率提供给电子传感器。 电源管理系统可用于在不使用时将电子设备置于睡眠模式。 电子器件封装在由具有等于或大于周围材料的挠曲模量的材料制造的仪器壳体内的封装材料内，以防止在周围材料失效之前器件的机械故障。 该箱具有保护托盘以保护电极和圆形相邻连接长度，以防止外壳发生裂纹。
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2.发明授权Optical micrometer for measuring thickness of transparent substrates based on optical absorption 失效用于测量基于光吸收的透明基板厚度的光学千分尺
公开(公告)号：US5959731A
公开(公告)日：1999-09-28
申请号：US960301
申请日：1997-10-29
申请人： Stephen H. Jones
发明人： Stephen H. Jones
CPC分类号： G01B11/06
摘要： Techniques and systems for measuring absolute thickness, the total thickness variation, and electric resistivity of a semiconductor substrate in a nondestructive optical fashion. Optical absorption is used to measure the absolute thickness of a semiconductor substrate with a light source and a photo transceiver. The thickness is determined by comparing the amount of absorption to a calibrated amount. Both the absolute thickness and total thickness variation of the substrate can be measured based on light absorption using an imaging device. The invention can be used to directly image and measure localized features formed on micro machined substrates. The resistivity of a substrate sample can also be measured by using an alternating electrical signal.
摘要翻译： 以非破坏性的光学方式测量半导体衬底的绝对厚度，总厚度变化和电阻率的技术和系统。 使用光吸收来测量具有光源和光收发器的半导体衬底的绝对厚度。 通过将吸收量与校准量进行比较来确定厚度。 可以基于使用成像装置的光吸收来测量基板的绝对厚度和总厚度变化。 本发明可用于直接成像和测量微加工基板上形成的局部特征。 也可以通过使用交流电信号来测量衬底样品的电阻率。
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公开(公告)号：US4514758A
公开(公告)日：1985-04-30
申请号：US442496
申请日：1982-11-18
CPC分类号： G01N15/0227 , G01P3/38
摘要： A fall velocity indicator/viewer having a sampling compartment, a camera system, and an elongated tunnel for interconnecting the camera system to the sampling compartment. The camera system includes a video camera for continuously monitoring snowflakes as they naturally fall through a viewing area in the sampling compartment. The snowflakes are illuminated by a pair of strobe lights directly and in combination with reflected light from a pair of mirrors. In addition, a mirror in the tunnel provides a reflected view from the top of the snowflakes. The video camera is capable of thereby monitoring multiple views of snowflakes in a single video frame and provide sufficient data to analyze the physical characteristics of the snowflakes as well as aid in making velocity determinations and other observations of naturally falling snowflakes.
摘要翻译： 具有采样室，照相机系统和用于将照相机系统互连到采样室的细长隧道的落下速度指示器/观察器。 相机系统包括摄像机，用于在雪花自然落入取样室中的观察区域时连续监测雪花。 雪花由一对闪光灯直接照亮，并与来自一对镜子的反射光结合。 此外，隧道中的镜子提供了雪花顶部的反射视图。 视频摄像机能够在单个视频帧中监视雪花的多个视图，并提供足够的数据来分析雪花的物理特性，以及有助于进行速度确定和自然落下的雪花的其他观测。
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公开(公告)号：US4472921A
公开(公告)日：1984-09-25
申请号：US368635
申请日：1982-04-15
申请人： Stephen H. Jones
发明人： Stephen H. Jones
摘要： A control arrangement for terminating the film-heating segment of a sequence of operations for a skin packaging machine. A skin packaging machine having a film supply, a film-bearing frame, an oven for heating the film in the frame, a base having a perforated surface with means for drawing a vacuum at the surface, and means for moving the frame from a position adjacent the oven to a position adjacent the perforated surface of the base further includes a control arrangement for terminating the heating of the film in the frame by the oven substantially responsive to the temperature of the film. The control arrangement includes a temperature sensor positioned adjacent the film in the frame when the frame is adjacent the oven. The temperature sensor cooperates with a temperature comparison circuit in the control arrangement to provide a comparison between the sensor temperature and a reference temperature to produce a comparison signal. The control arrangement is responsive to the comparison signal to terminate the heating of the film in the frame by the oven. The temperature sensor is mounted at the end of a conduit through which pressurized air is supplied at a set rate for cooling the temperature sensor when the oven is not heating the film.
摘要翻译： 一种用于终止皮肤包装机的一系列操作的薄膜加热段的控制装置。 一种皮肤包装机，其具有胶片供应装置，薄膜承载框架，用于加热框架中的薄膜的烘箱，具有穿孔表面的基座，具有用于在表面上拉拔真空的装置，以及用于将框架从位置移动的装置 在烤箱附近邻近基座的穿孔表面的位置还包括控制装置，用于基于膜的温度终止通过烤箱加热框架中的薄膜。 控制装置包括当框架邻近烘箱时位于框架内的膜附近的温度传感器。 温度传感器与控制装置中的温度比较电路配合，以提供传感器温度和参考温度之间的比较，以产生比较信号。 控制装置响应于比较信号以终止通过烘箱加热框架中的胶片。 温度传感器安装在管道的末端，当炉子不加热膜时，通过加压空气以设定的速率供应冷却温度传感器。
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公开(公告)号：US4437152A
公开(公告)日：1984-03-13
申请号：US261749
申请日：1981-05-08
申请人： Stephen H. Jones
发明人： Stephen H. Jones
IPC分类号： B65B57/00 , G05B19/02 , G05B19/042 , G06F15/46 , B65B53/02
CPC分类号： G05B19/0426 , G05B2219/25372 , G05B2219/25384
摘要： A microcomputer based industrial machine control arrangement which includes several operator variable controls. The control arrangement is responsive to settings of the operator variable controls to establish parameters, such as time, in the operation of the machine. The control arrangement also receives a number of machine condition indications, such as through limit switches or the like, and produces various switching commands for elements of the machine during its operation. The particular control arrangement illustrated is described in conjunction with a skin packaging machine for the vacuum application of a film over goods to be packaged.
摘要翻译： 一种基于微机的工业机器控制装置，包括几个操作员变量控制。 控制装置响应于操作员变量控制的设置，以在机器的操作中建立诸如时间的参数。 控制装置还通过限位开关等接收多个机器状态指示，并且在其操作期间为机器的元件产生各种切换命令。 所描述的特定控制装置结合皮肤包装机进行描述，用于在要包装的物品上真空地涂覆薄膜。
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6.发明授权Cantilever having sensor system for independent measurement of force and torque 失效悬臂具有用于独立测量力和扭矩的传感器系统公开(公告)号：US06237399B1
公开(公告)日：2001-05-29
申请号：US09232875
申请日：1999-01-15
IPC分类号： G01B528
CPC分类号： G01Q20/04 , G01Q60/54 , G01R33/0385 , Y10S977/873
摘要： A cantilever structure is provided having a cantilever arm with a piezo-active detector embedded on the surface at the fixed end of the cantilever as well as at a sensing point close to the free end along with an integrated amplification circuitry. Deflection of the cantilever arm is initiated by two different methods: (a) by a force at the free end which induces a surface strain at the base of the cantilever and no strain at the free end and (b) by a torque at the free end which induces a maximum strain at the free end but no strain at the base of the cantilever. In the first case a piezo-active signal is produced only in the detector at the base and in the second case only in the detector close to the free end. When both force and torque cause the deflection of the cantilever end, their contributions are separated by comparing the signals produced by both the detectors with that produced by a third ‘reference’ detector which is not part of the cantilever arm but is still situated in close proximity.
摘要翻译： 提供了一种悬臂结构，其具有悬臂，其具有嵌入在悬臂的固定端的表面上的压电有源检测器以及接近自由端的感测点以及集成的放大电路。 悬臂的偏转由两种不同的方法启动：（a）通过自由端的力，在悬臂底部引起表面应变，在自由端没有应变，（b）通过自由端处的扭矩 其在自由端处引起最大应变，但在悬臂底部没有应变。 在第一种情况下，仅在底部的检测器中产生压电有源信号，仅在靠近自由端的检测器中产生第二种情况。 当力和力矩都导致悬臂端的偏转时，它们的贡献通过将由两个检测器产生的信号与由第三个“参考”检测器产生的信号进行比较来分离，第三个“参考”检测器不是悬臂的一部分，但仍处于闭合位置 接近。
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7.发明授权
公开(公告)号：US6057924A
公开(公告)日：2000-05-02
申请号：US148278
申请日：1998-09-04
申请人： Robert A. Ross , Stephen H. Jones
发明人： Robert A. Ross , Stephen H. Jones
IPC分类号： G01B11/06
CPC分类号： G01B11/06
摘要： Techniques and systems for obtaining the thickness map of a partially transparent substrate in a nondestructive optical fashion. The thickness is determined by comparing the amount of absorption by the substrate to a calibrated amount obtained from a substrate standard with a known thickness that is formed of the same material. Digital signal processing operations are performed to reduce noise and to improve resolution of the thickness map.
摘要翻译： 用于以非破坏性光学方式获得部分透明基板的厚度图的技术和系统。 通过将基材的吸收量与由具有由相同材料形成的已知厚度的基板标准物获得的校准量进行比较来确定厚度。 执行数字信号处理操作以减少噪声并提高厚度图的分辨率。
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公开(公告)号：US5754294A
公开(公告)日：1998-05-19
申请号：US643169
申请日：1996-05-03
CPC分类号： G01B11/06
摘要： Techniques and systems for measuring absolute thickness, the total thickness variation, and electric resistivity of a semiconductor wafer in a nondestructive optical fashion. Optical absorption is used to measure the absolute thickness of a semiconductor wafer with a light source and a phototransceiver. The thickness is determined by comparing the amount of absorption to a calibrated amount. Coherent light interference is used to measure the total thickness variation of a substrate. Alternatively, both the absolute thickness and total thickness variation of the substrate can be measured based on light absorption using a CCD imaging device. The resistivity of a wafer sample can also be measured by using an alternating electrical signal.
摘要翻译： 以非破坏性的光学方式测量半导体晶片的绝对厚度，总厚度变化和电阻率的技术和系统。 使用光吸收来测量具有光源和光收发器的半导体晶片的绝对厚度。 通过将吸收量与校准量进行比较来确定厚度。 相干光干涉用于测量基板的总厚度变化。 或者，可以基于使用CCD成像装置的光吸收来测量基板的绝对厚度和总厚度变化。 也可以通过使用交流电信号来测量晶片样品的电阻率。
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9.发明授权Method of manufacturing an optoelectronic circuit including heterojunction bipolar transistor, laser and photodetector 失效制造包括异质结双极晶体管，激光和光电探测器的光电子电路的方法
公开(公告)号：US5674778A
公开(公告)日：1997-10-07
申请号：US677262
申请日：1996-07-09
申请人： KwyRo Lee , Michael Shur , Stephen H. Jones
发明人： KwyRo Lee , Michael Shur , Stephen H. Jones
CPC分类号： H01S5/0262 , H01S5/0261 , H01S5/0264
摘要： An optoelectronic integrated circuit furnishes a monolithic integration of high-speed transistors, lasers and photodetectors for optoelectronic communication applications. The monolithic device integrates an indium phosphorus (InP) / indium gallium arsenide (InGaAs) emitter-down heterojunction bipolar transistor with an InP/InGaAs quantum well laser and modulator, and a metal-semiconductor-metal photodetector.
摘要翻译： 光电集成电路为光电通信应用提供了高速晶体管，激光器和光电探测器的单片集成。 该单片器件集成了铟铟（InP）/砷化铟镓（InGaAs）发射极 - 异质结双极晶体管与InP / InGaAs量子阱激光器和调制器以及金属 - 半导体 - 金属光电探测器。
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10.发明授权Optoelectronic circuit including heterojunction bipolar transistor laser and photodetector 失效包括异质结双极晶体管激光器和光电探测器的光电路
公开(公告)号：US5535231A
公开(公告)日：1996-07-09
申请号：US336027
申请日：1994-11-08
申请人： KwyRo Lee , Michael Shur , Stephen H. Jones
发明人： KwyRo Lee , Michael Shur , Stephen H. Jones
CPC分类号： H01S5/0262 , H01S5/0261 , H01S5/0264
摘要： An optoelectronic integrated circuit furnishes a monolithic integration of high-speed transistors, lasers and photodetectors for optoelectronic communication applications. The monolithic device integrates an indium phosphorus (InP)/indium gallium arsenide (InGaAs) emitter-down heterojunction bipolar transistor with an InP/InGaAs quantum well laser and modulator, and a metal-semiconductor-metal photodetector.
摘要翻译： 光电集成电路为光电通信应用提供了高速晶体管，激光器和光电探测器的单片集成。 该单片器件集成了铟铟（InP）/砷化铟镓（InGaAs）发射极 - 异质结双极晶体管与InP / InGaAs量子阱激光器和调制器以及金属 - 半导体 - 金属光电探测器。
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