Abstract:
The present invention relates to a method for producing a profile identifying a microorganism based on surface enhanced Raman scattering (SERS) and an apparatus thereof. The method comprises: (1) placing the microorganism on a SERS-active substrate; (2) mounting the microorganism with a mounting solution; (3) obtaining a SERS spectrum of the microorganism in step (2); and (4) analyzing the SERS spectrum to produce the profile.The present invention also relates to a method for detecting morphology alteration of a microorganism due to an antimicrobial agent or an infectious agent based on SERS and an apparatus thereof. The method comprises: (1) placing the microorganism on a SERS-active substrate; (2) mounting the microorganism with a mounting solution; (3) treating the microorganism with a pharmaceutically effective amount of the antimicrobial agent or the infectious agent; (4) obtaining a SERS spectrum of the microorganism in step (3); and (5) identifying effect of the antimicrobial agent or the infectious agent by at least one new peak in the SERS spectrum in step (4) compared to a SERS spectrum of a control sample, wherein the control sample is not treated with the antimicrobial agent or the infectious agent.
Abstract:
A test circuit adapted in a display panel of an electronic device is provided. The test circuit is to test the pixel array function of the display panel, wherein the test circuit comprises: a plurality of test signal lines, a plurality of test signal transmitters, a plurality of gate lines and at least one static electricity protection device. The test signal lines receive a plurality of corresponding test signals respectively. The test signal transmitters comprises a plurality test signal transmitter groups comprising at least one transmitter, wherein each transmitter group corresponds to a test signal line and connects the test signal line and the pixel array. Each gate line connects to the gate of the at least one transmitter. The static electricity protection device is placed between two of the gate lines.
Abstract:
A test circuit adapted in a display panel of an electronic device is provided. The test circuit is to test the pixel array function of the display panel, wherein the test circuit comprises: a plurality of test signal lines, a plurality of test signal transmitters, a plurality of gate lines and at least one static electricity protection device. The test signal lines receive a plurality of corresponding test signals respectively. The test signal transmitters comprises a plurality test signal transmitter groups comprising at least one transmitter, wherein each transmitter group corresponds to a test signal line and connects the test signal line and the to pixel array. Each gate line connects to the gate of the at least one transmitter. The static electricity protection device is placed between two of the gate lines.