Multiple image photolithography system and method
    1.
    发明授权
    Multiple image photolithography system and method 有权
    多图像光刻系统及方法

    公开(公告)号:US06741333B2

    公开(公告)日:2004-05-25

    申请号:US10406030

    申请日:2003-04-02

    IPC分类号: G03B2762

    摘要: A multiple image photolithography system includes a radiation source (18) projecting electromagnetic radiation along a path. A reticle cartridge (26) is located in the path of the projected radiation. The cartridge (26) includes a photomask (34,36) located in the path of the projected radiation and a Fabry-Perot interferometer (54) located in the path of the projected radiation. A radiation-sensitive material (30) is located in the path of the projected radiation such that the projected radiation encounters the reticle cartridge (26) before the projected radiation encounters the radiation-sensitive material (30).

    摘要翻译: 多图像光刻系统包括沿着路径投射电磁辐射的辐射源(18)。 标线盒(26)位于投影辐射的路径中。 盒(26)包括位于投影辐射的路径中的光掩模(34,36)和位于投影辐射路径中的法布里 - 珀罗干涉仪(54)。 辐射敏感材料(30)位于投影辐射的路径中,使得投射的辐射在投影辐射遇到辐射敏感材料(30)之前遇到光罩盒(26)。

    Multiple image photolithography system and method
    2.
    发明授权
    Multiple image photolithography system and method 有权
    多图像光刻系统及方法

    公开(公告)号:US06567153B1

    公开(公告)日:2003-05-20

    申请号:US09692685

    申请日:2000-10-19

    IPC分类号: G03B2742

    摘要: A multiple image photolithography system includes a radiation source (18) projecting electromagnetic radiation along a path. A reticle cartridge (26) is located in the path of the projected radiation. The cartridge (26) includes a photomask (34,36) located in the path of the projected radiation and a Fabry-Perot interferometer (54) located in the path of the projected radiation. A radiation-sensitive material (30) is located in the path of the projected radiation such that the projected radiation encounters the reticle cartridge (26) before the projected radiation encounters the radiation-sensitive material (30).

    摘要翻译: 多图像光刻系统包括沿着路径投射电磁辐射的辐射源(18)。 标线盒(26)位于投影辐射的路径中。 盒(26)包括位于投影辐射的路径中的光掩模(34,36)和位于投影辐射路径中的法布里 - 珀罗干涉仪(54)。 辐射敏感材料(30)位于投影辐射的路径中,使得投射的辐射在投影辐射遇到辐射敏感材料(30)之前遇到光罩盒(26)。