摘要:
A radiation emitter component, in particular an infrared emitter component with a conventional light-emitting diode housing, includes two electrode connections, one of which has a well-shaped reflector. The housing has an optically transparent, electrically non-conducting encapsulation material. A semiconductor laser chip is fastened in a well-shaped reflector of the light-emitting diode housing. The semiconductor laser chip has a quantum well structure, in particular with a strained layer structure, for example MOVPE epitaxial layers with a layer sequence GaAlAs-InGaAs-GaAlAs. A diffusor material can be inserted into the optically transparent, electrically non-conducting material of the light-emitting diode housing. The diffusor material is constructed or inserted with regard to type and concentration in such a way that in connection with the semiconductor laser chip encapsulated in the light-emitting diode housing, a radiation characteristic curve or an increase of an effective emission surface is produced that is comparable to that of a conventional infrared light-emitting diode.
摘要:
A swivelable journal bearing for a shaft of a converter or other heavy-duty equipment comprises a spherically convex inner ring on the shaft and an annular array of rigidly interconnected socket elements each forming at least one seat for an inwardly projecting low-friction insert having a spherically concave face in contact with the ring surface. The socket elements may be short tubes welded to one another or embedded in a shell of concrete; they could also be perforated strips welded together and backed by a concrete shell.
摘要:
A friction bearing having spaced-apart inner and outer bearing rings with a plurality of separate sliding members interposed therebetween, the individual sliding members being restrained by respective generally annular members positioned adjacent and on substantially encompassing the sliding members, and fixedly attached to one of the bearing rings.
摘要:
A measuring arrangement for measuring product parameters of a component in the epitaxial layer (28) of a wafer comprises measuring probe (3) on whose contact side (23) a recess (24) is installed, into which an electrolyte can be poured. The electrolyte produces an electrical connection between a contact body (11), which is charged with a signal from a pulsed-current source, and the surface (22) of the wafer (2). A detector (16) serves for detecting the light which is emitted by the component.