Radiation emitter component
    1.
    发明授权
    Radiation emitter component 失效
    辐射发射器组件

    公开(公告)号:US5999552A

    公开(公告)日:1999-12-07

    申请号:US9606

    申请日:1998-01-20

    摘要: A radiation emitter component, in particular an infrared emitter component with a conventional light-emitting diode housing, includes two electrode connections, one of which has a well-shaped reflector. The housing has an optically transparent, electrically non-conducting encapsulation material. A semiconductor laser chip is fastened in a well-shaped reflector of the light-emitting diode housing. The semiconductor laser chip has a quantum well structure, in particular with a strained layer structure, for example MOVPE epitaxial layers with a layer sequence GaAlAs-InGaAs-GaAlAs. A diffusor material can be inserted into the optically transparent, electrically non-conducting material of the light-emitting diode housing. The diffusor material is constructed or inserted with regard to type and concentration in such a way that in connection with the semiconductor laser chip encapsulated in the light-emitting diode housing, a radiation characteristic curve or an increase of an effective emission surface is produced that is comparable to that of a conventional infrared light-emitting diode.

    摘要翻译: 辐射发射器部件,特别是具有传统发光二极管外壳的红外发射器部件包括两个电极连接件,其中之一具有良好形状的反射器。 壳体具有光学透明的非导电封装材料。 将半导体激光芯片紧固在发光二极管壳体的形状好的反射器中。 半导体激光芯片具有量子阱结构,特别是具有应变层结构,例如具有层序列GaAlAs-InGaAs-GaAlAs的MOVPE外延层。 漫射材料可以插入到发光二极管外壳的光学透明的非导电材料中。 关于类型和浓度来构造或插入扩散材料,使得与封装在发光二极管外壳中的半导体激光器芯片有关,产生辐射特性曲线或有效发射表面的增加,即, 与传统的红外发光二极管相当。

    Heavy-duty swivel bearing
    2.
    发明授权
    Heavy-duty swivel bearing 失效
    重型回转轴承

    公开(公告)号:US4072372A

    公开(公告)日:1978-02-07

    申请号:US741126

    申请日:1976-11-11

    IPC分类号: F16C23/04 F16C33/26 F16C33/10

    CPC分类号: F16C23/045 F16C33/26

    摘要: A swivelable journal bearing for a shaft of a converter or other heavy-duty equipment comprises a spherically convex inner ring on the shaft and an annular array of rigidly interconnected socket elements each forming at least one seat for an inwardly projecting low-friction insert having a spherically concave face in contact with the ring surface. The socket elements may be short tubes welded to one another or embedded in a shell of concrete; they could also be perforated strips welded together and backed by a concrete shell.

    摘要翻译: 用于转换器或其他重型设备的轴的可旋转轴颈轴承包括在轴上的球形凸起的内环和刚性互连的插座元件的环形阵列,每个形成至少一个用于向内突出的低摩擦插入件的座,其具有 与环表面接触的球形凹面。 插座元件可以是彼此焊接或嵌入混凝土壳体中的短管; 它们也可以是焊接在一起并由混凝土壳支撑的穿孔条。

    Friction bearing with sliding members
    3.
    发明授权
    Friction bearing with sliding members 失效
    带滑动构件的摩擦轴承

    公开(公告)号:US4025129A

    公开(公告)日:1977-05-24

    申请号:US649241

    申请日:1976-01-15

    摘要: A friction bearing having spaced-apart inner and outer bearing rings with a plurality of separate sliding members interposed therebetween, the individual sliding members being restrained by respective generally annular members positioned adjacent and on substantially encompassing the sliding members, and fixedly attached to one of the bearing rings.

    摘要翻译: 摩擦轴承具有间隔开的内和外轴承环,其间插入有多个单独的滑动构件,各个滑动构件由相邻的大致环形构件限制,所述大致环形构件邻近并基本上包围滑动构件,并且固定地附接到 轴承圈。

    Method for measuring product parameters of components formed on a wafer and device for performing the method
    4.
    发明授权
    Method for measuring product parameters of components formed on a wafer and device for performing the method 有权
    用于测量在晶片上形成的部件的产品参数的方法和用于执行该方法的装置

    公开(公告)号:US06946864B2

    公开(公告)日:2005-09-20

    申请号:US10078146

    申请日:2002-02-19

    IPC分类号: G01N21/66 G01R31/28

    CPC分类号: G01N21/66

    摘要: A measuring arrangement for measuring product parameters of a component in the epitaxial layer (28) of a wafer comprises measuring probe (3) on whose contact side (23) a recess (24) is installed, into which an electrolyte can be poured. The electrolyte produces an electrical connection between a contact body (11), which is charged with a signal from a pulsed-current source, and the surface (22) of the wafer (2). A detector (16) serves for detecting the light which is emitted by the component.

    摘要翻译: 用于测量晶片的外延层(28)中的部件的产品参数的测量装置包括测量探针(3),其上安装有接触侧(23)的凹部(24),可以将电解液倒入其中。 电解液在与脉冲电流源的信号充电的接触体(11)和晶片(2)的表面(22)之间产生电连接。 检测器(16)用于检测由该部件发出的光。