摘要:
Various embodiments of the present invention provide systems and methods for data processing. As an example, a data processing circuit is disclosed that includes a data detector circuit. The data detector circuit includes an anti-causal noise predictive filter circuit and a data detection circuit. In some cases, the anti-causal noise predictive filter circuit is operable to apply noise predictive filtering to a detector input to yield a filtered output, and the data detection circuit is operable to apply a data detection algorithm to the filtered output derived from the anti-causal noise predictive filter circuit.
摘要:
An apparatus includes a low density parity check decoder operable to iteratively generate messages between a plurality of check nodes and variable nodes, and to calculate a fractional quality metric for a data block as it is decoded in the low density parity check decoder based at least in part on perceived values of data in the variable nodes. The fractional unsatisfied check quality metric is a probabilistic determination of a number of unsatisfied parity checks in the low density parity check decoder.
摘要:
A probabilistic approach of symbol error estimation is disclosed. The probabilistic approach of symbol error estimation reflects the number of symbol errors more precisely than the number of unsatisfied checks. The more precise quality metric calculated in accordance with the present disclosure allows a codec system to achieve a better overall performance. In addition, many other features that previously depend on the number of unsatisfied checks as the sector quality metric may also benefit by adopting the more precise quality metric.
摘要:
Various embodiments of the present invention provide systems and methods for data processing. As an example, a data processing circuit is disclosed that includes a data detector circuit, a biasing circuit, and a data decoder circuit. The data detector circuit is operable to apply a data detection algorithm to a series of symbols to yield a detected output, and the detected output includes a series of soft decision data corresponding to non-binary symbols. The biasing circuit is operable apply a bias to each of the series of soft decision data to yield a series of biased soft decision data. The data decoder circuit is operable to apply a data decoding algorithm to the series of biased soft decision data corresponding to the non-binary symbols.
摘要:
A probabilistic approach of symbol error estimation is disclosed. The probabilistic approach of symbol error estimation reflects the number of symbol errors more precisely than the number of unsatisfied checks. The more precise quality metric calculated in accordance with the present disclosure allows a codec system to achieve a better overall performance. In addition, many other features that previously depend on the number of unsatisfied checks as the sector quality metric may also benefit by adopting the more precise quality metric.
摘要:
Various embodiments of the present invention provide systems and methods for data processing. As an example, a data processing circuit is disclosed that includes: a data detector circuit, a data decoder circuit, and a multi-path circuit. The data detector circuit is operable to apply a data detection algorithm to a data input and a decoder output to yield a detected output. The data decoder circuit is operable to apply a decoding algorithm to a decoder input to yield the decoder output and a status input. The multi-path circuit is operable to provide the decoder input based at least in part on the detected output and the status input.
摘要:
A method for manufacturing semiconductor substrates. The method includes providing a semiconductor wafer, which has an upper surface, a backside surface, and an edge region around a periphery of the semiconductor wafer. In a preferred embodiment, the upper surface is often for the manufacture of the integrated circuit device elements themselves. The method includes subjecting the semiconductor wafer to one or more process steps to form one or more films of materials on the backside surface. The method mounts the semiconductor wafer to expose the backside surface. The method rotates the semiconductor wafer in a circular manner. In a specific embodiment, the method includes supplying an acid solution containing fluorine bearing species, a nitric acid species, a surfactant species, and an organic acid species, on at least the backside surface as the semiconductor wafer rotates. The method causes removal of one or more contaminants from the backside surface, while a portion of the center region of the backside surface remains exposed as the semiconductor wafer rotates in the circular manner.
摘要:
Various embodiments of the present invention provide systems and methods for data processing. As an example, a data processing circuit is disclosed that includes a data detector circuit, a biasing circuit, and a data decoder circuit. The data detector circuit is operable to apply a data detection algorithm to a series of symbols to yield a detected output, and the detected output includes a series of soft decision data corresponding to non-binary symbols. The biasing circuit is operable apply a bias to each of the series of soft decision data to yield a series of biased soft decision data. The data decoder circuit is operable to apply a data decoding algorithm to the series of biased soft decision data corresponding to the non-binary symbols.