公开(公告)号：US08550345B2

公开(公告)日：2013-10-08

申请号：US12120909

申请日：2008-05-15

申请人： Cheng-Fang Huang ,  Pin-Hsun Huang ,  Chih-Hsiang Wang ,  Wen-Cheng Hsu ,  Yi-fang cho ,  An-Hong Liu ,  Yi-Chang Lee

发明人： Cheng-Fang Huang ,  Pin-Hsun Huang ,  Chih-Hsiang Wang ,  Wen-Cheng Hsu ,  Yi-fang cho ,  An-Hong Liu ,  Yi-Chang Lee

IPC分类号： G06F19/00

CPC分类号： G06Q10/08

摘要： This invention provides an RFID real-time information system accommodated to a semiconductor supply chain for exchanging real-time information. The RFID real-time information system is characterized by comprising an RFID middleware module for generating a stock and logistic information corresponding to a plurality of carriers and wafers from a tag information; a manufacturing information module for storing an object information corresponding to the plurality of wafers; a real-time information module for integrating the RFID middleware module with the manufacturing information module to generate real-time information corresponding to the plurality of wafers and carriers; and a business-to-business (B2B) e-commerce module comprising a plurality of B2B servers respectively disposed in vendors in the semiconductor supply chain for connecting and exchanging the real-time information through a standard protocol of e-commerce.

摘要翻译： 本发明提供一种适用于半导体供应链的RFID实时信息系统，用于交换实时信息。 RFID实时信息系统的特征在于包括：RFID中间件模块，用于从标签信息生成对应于多个载体和晶片的库存和物流信息; 制造信息模块，用于存储对应于所述多个晶片的对象信息; 实时信息模块，用于将RFID中间件模块与制造信息模块集成，以生成与多个晶片和载体对应的实时信息; 以及分别设置在半导体供应链的供应商中的多个B2B服务器的企业对企业（B2B）电子商务模块，用于通过电子商务的标准协议来连接和交换实时信息。

公开(公告)号：US07609053B2

公开(公告)日：2009-10-27

申请号：US12061781

申请日：2008-04-03

申请人： Wen Cheng Hsu ,  Min Ming Lo ,  Chao Chien Wang ,  Yi Fang Cho

发明人： Wen Cheng Hsu ,  Min Ming Lo ,  Chao Chien Wang ,  Yi Fang Cho

IPC分类号： G01R31/28 ,  G06F17/00 ,  G08B13/14 ,  G06F7/00

CPC分类号： G01R31/01 ,  G01R31/2893

摘要： This invention provides a wafer testing system and testing method thereof. The wafer testing system comprises a wafer storage section, a prober, a tester, an RFID middleware unit, an EDA system and an MES system. The wafer storage section stores a multiplicity of carriers, each of which is provided with at least a RFID tag. The prober comprises a RFID reader to read a tag information. The tester sends a test signal to the prober for implementing the wafer test so as to generate a test result and calls an interface program to convert the test result into a file conformed with a specific data format. The RFID middleware unit receives the tag information and calls related applications to process the tag information so as to generate a wafer information. The EDA system receives the file of the specific data format converted from the interface program and calculates thereof to generate a wafer yield information after wafer test. The MES system integrates the wafer information from the RFID middleware unit with the yield information from the EDA system so as to allow monitoring the wafer manufacturing process and testing yield rate in a real-time manner.

摘要翻译： 本发明提供了一种晶片测试系统及其测试方法。 晶片测试系统包括晶片存储部分，探测器，测试器，RFID中间件单元，EDA系统和MES系统。 晶片存储部存储多个载体，每个载体至少设有RFID标签。 该探测器包括读取标签信息的RFID读取器。 测试仪将测试信号发送到探测器，以实现晶片测试，以产生测试结果，并调用接口程序将测试结果转换为符合特定数据格式的文件。 RFID中间件单元接收标签信息并调用相关应用程序来处理标签信息以产生晶片信息。 EDA系统接收从接口程序转换的特定数据格式的文件，并计算它们以在晶片测试之后生成晶片产量信息。 MES系统将RFID中间件单元的晶圆信息与EDA系统的产量信息相集成，以便实时监控晶圆制造过程和测试成品率。

公开(公告)号：US20090114714A1

公开(公告)日：2009-05-07

申请号：US12120909

申请日：2008-05-15

申请人： Cheng-Fang Huang ,  Pin-Hsun Huang ,  Chih-Hsiang Wang ,  Wen-Cheng Hsu ,  Yi-fang Cho ,  An-Hong Liu ,  Yi-Chang Lee

发明人： Cheng-Fang Huang ,  Pin-Hsun Huang ,  Chih-Hsiang Wang ,  Wen-Cheng Hsu ,  Yi-fang Cho ,  An-Hong Liu ,  Yi-Chang Lee

IPC分类号： G06F7/00

CPC分类号： G06Q10/08

摘要： This invention provides an RFID real-time information system accommodated to a semiconductor supply chain for exchanging real-time information. The RFID real-time information system is characterized by comprising an RFID middleware module for generating a stock and logistic information corresponding to a plurality of carriers and wafers from a tag information; a manufacturing information module for storing an object information corresponding to the plurality of wafers; a real-time information module for integrating the RFID middleware module with the manufacturing information module to generate real-time information corresponding to the plurality of wafers and carriers; and a business-to-business (B2B) e-commerce module comprising a plurality of B2B servers respectively disposed in vendors in the semiconductor supply chain for connecting and exchanging the real-time information through a standard protocol of e-commerce.

摘要翻译： 本发明提供一种适用于半导体供应链的RFID实时信息系统，用于交换实时信息。 RFID实时信息系统的特征在于包括：RFID中间件模块，用于从标签信息生成对应于多个载体和晶片的库存和物流信息; 制造信息模块，用于存储对应于所述多个晶片的对象信息; 实时信息模块，用于将RFID中间件模块与制造信息模块集成，以生成与多个晶片和载体对应的实时信息; 以及分别设置在半导体供应链的供应商中的多个B2B服务器的企业对企业（B2B）电子商务模块，用于通过电子商务的标准协议来连接和交换实时信息。

公开(公告)号：US20090237098A1

公开(公告)日：2009-09-24

申请号：US12061781

申请日：2008-04-03

申请人： Wen Cheng HSU ,  Min Ming Lo ,  Chao Chien Wang ,  Yi Fang Cho

发明人： Wen Cheng HSU ,  Min Ming Lo ,  Chao Chien Wang ,  Yi Fang Cho

IPC分类号： G01R31/02

CPC分类号： G01R31/01 ,  G01R31/2893

摘要： This invention provides a wafer testing system and testing method thereof. The wafer testing system comprises a wafer storage section, a prober, a tester, an RFID middleware unit, an EDA system and an MES system. The wafer storage section stores a multiplicity of carriers, each of which is provided with at least a RFID tag. The prober comprises a RFID reader to read a tag information. The tester sends a test signal to the prober for implementing the wafer test so as to generate a test result and calls an interface program to convert the test result into a file conformed with a specific data format. The RFID middleware unit receives the tag information and calls related applications to process the tag information so as to generate a wafer information. The EDA system receives the file of the specific data format converted from the interface program and calculates thereof to generate a wafer yield information after wafer test. The MES system integrates the wafer information from the RFID middleware unit with the yield information from the EDA system so as to allow monitoring the wafer manufacturing process and testing yield rate in a real-time manner.

摘要翻译： 本发明提供了一种晶片测试系统及其测试方法。 晶片测试系统包括晶片存储部分，探测器，测试器，RFID中间件单元，EDA系统和MES系统。 晶片存储部存储多个载体，每个载体至少设有RFID标签。 该探测器包括读取标签信息的RFID读取器。 测试仪将测试信号发送到探测器，以实现晶片测试，以产生测试结果，并调用接口程序将测试结果转换为符合特定数据格式的文件。 RFID中间件单元接收标签信息并调用相关应用程序来处理标签信息以产生晶片信息。 EDA系统接收从接口程序转换的特定数据格式的文件，并计算它们以在晶片测试之后生成晶片产量信息。 MES系统将RFID中间件单元的晶圆信息与EDA系统的产量信息相集成，以便实时监控晶圆制造过程和测试成品率。