Semiconductor color image sensor
    2.
    发明授权
    Semiconductor color image sensor 有权
    半导体彩色图像传感器

    公开(公告)号:US06242730B1

    公开(公告)日:2001-06-05

    申请号:US09325031

    申请日:1999-06-03

    IPC分类号: H01L2700

    摘要: A semiconductor image sensor includes a metal layer formed on a semiconductor substrate. An oxide layer is disposed over the semiconductor substrate to cover the metal layer. A SOG is disposed on the oxide layer, a color filter is disposed on the SOG and a silicon-oxy-nitride layer is disposed thereon. By using the high transmittance of the SOG and the silicon-oxy-nitride layer, the blue light transmittance by the semiconductor image sensor is therefore enhanced.

    摘要翻译: 半导体图像传感器包括形成在半导体衬底上的金属层。 氧化物层设置在半导体衬底上以覆盖金属层。 在氧化物层上设置SOG,在SOG上设置滤色器,在其上配置硅 - 氮化物层。 通过使用SOG和硅 - 氮化物层的高透射率,因此增强了半导体图像传感器的蓝色透光率。

    SEMICONDUCTOR DEVICE AND INTERCONNECT STRUCTURE
    3.
    发明申请
    SEMICONDUCTOR DEVICE AND INTERCONNECT STRUCTURE 审中-公开
    半导体器件和互连结构

    公开(公告)号:US20080111160A1

    公开(公告)日:2008-05-15

    申请号:US11954182

    申请日:2007-12-11

    IPC分类号: H01L27/148

    CPC分类号: H01L27/14689 H01L21/76804

    摘要: A semiconductor device is described, including a substrate, a transistor, a hard mask layer and an anti-reflection layer. The substrate includes a first area and a second area, wherein the second area includes a photosensing area. The transistor is disposed on the substrate in the first area and the hard mask layer over the substrate in the second area. The anti-reflection layer is disposed between the hard mask layer and the substrate.

    摘要翻译: 描述了一种半导体器件,包括衬底,晶体管,硬掩模层和抗反射层。 衬底包括第一区域和第二区域,其中第二区域包括光敏区域。 晶体管设置在第一区域的基板上,第二区域中设置在基板上的硬掩模层。 防反射层设置在硬掩模层和基板之间。

    PROCESS OF MICRO-DISPLAY
    4.
    发明申请
    PROCESS OF MICRO-DISPLAY 审中-公开
    微显示过程

    公开(公告)号:US20100105157A1

    公开(公告)日:2010-04-29

    申请号:US12259037

    申请日:2008-10-27

    IPC分类号: H01L21/302

    摘要: A process of a micro-display is provided. First, a substrate having a pixel region and a periphery circuit region is provided, in which a metal reflection layer is formed in the pixel region, and a periphery circuit is formed in the periphery circuit region. Next, a dielectric layer is formed on the substrate to cover the pixel region and the periphery circuit region. Then, a patterned mask layer exposing the dielectric layer on the metal reflection layer is formed on the dielectric layer. Thereafter, a portion of the exposed dielectric layer is removed by using the patterned mask layer as a mask. Next, the patterned mask layer is removed. And then, a portion of the dielectric layer is removed to expose the metal reflection layer.

    摘要翻译: 提供微显示器的处理。 首先,提供具有像素区域和外围电路区域的基板,其中在像素区域中形成金属反射层,并且在外围电路区域中形成外围电路。 接下来,在基板上形成介电层以覆盖像素区域和外围电路区域。 然后,在电介质层上形成露出金属反射层上的电介质层的图案化掩模层。 此后,通过使用图案化掩模层作为掩模去除暴露介电层的一部分。 接下来,去除图案化的掩模层。 然后,除去介电层的一部分以露出金属反射层。

    SEMICONDUCTOR DEVICE AND INTERCONNECT STRUCTURE AND THEIR RESPECTIVE FABRICATING METHODS
    6.
    发明申请
    SEMICONDUCTOR DEVICE AND INTERCONNECT STRUCTURE AND THEIR RESPECTIVE FABRICATING METHODS 审中-公开
    半导体器件和互连结构及其相关的制作方法

    公开(公告)号:US20070099328A1

    公开(公告)日:2007-05-03

    申请号:US11163812

    申请日:2005-10-31

    IPC分类号: H01L21/00

    CPC分类号: H01L27/14689 H01L21/76804

    摘要: A semiconductor device is described, including a substrate, a transistor, a hard mask layer and an anti-reflection layer. The substrate includes a first area and a second area, wherein the second area includes a photosensing area. The transistor is disposed on the substrate in the first area and the hard mask layer over the substrate in the second area. The anti-reflection layer is disposed between the hard mask layer and the substrate.

    摘要翻译: 描述了一种半导体器件,包括衬底,晶体管,硬掩模层和抗反射层。 衬底包括第一区域和第二区域,其中第二区域包括光敏区域。 晶体管设置在第一区域的基板上,第二区域中设置在基板上的硬掩模层。 防反射层设置在硬掩模层和基板之间。