Temperature control apparatus and test system using main flow path and sub flow path
    2.
    发明授权
    Temperature control apparatus and test system using main flow path and sub flow path 有权
    温度控制装置和使用主流路和副流路的试验系统

    公开(公告)号:US09535112B2

    公开(公告)日:2017-01-03

    申请号:US14472398

    申请日:2014-08-29

    CPC classification number: G01R31/2875 G01R31/28 G01R31/2851

    Abstract: Increase in number of valves complicates the configuration and control. A temperature control apparatus for controlling a temperature of a device, includes; a heat exchange section exchanging heat with the device; a main flow path causing a fluid to flow; a sub flow path causing, to flow, a fluid having a temperature different from a temperature of the fluid flowing through the main flow path; a mixture flow path merging the fluids from the main flow path and the sub flow path and causing the merged fluids to flow to the heat exchange section; and a flow rate adjusting section adjusting an amount of a fluid flowing from the sub flow path to the mixture flow path, in relation to the fluid flowing through the main flow path.

    Abstract translation: 阀门数量的增加使配置和控制复杂化。 一种用于控制装置的温度的温度控制装置,包括: 与所述装置进行热交换的热交换部; 使流体流动的主流路; 使流体流过与流过主流路的流体的温度不同的流体的副流路; 混合流路,其将来自主流路和副流路的流体汇合并使合并流体流向热交换部; 以及流量调节部,其相对于流过主流路的流体,调整从副流路流向混合流路的流体量。

    Electronic component handling device and electronic component testing apparatus

    公开(公告)号:US11340638B2

    公开(公告)日:2022-05-24

    申请号:US16575460

    申请日:2019-09-19

    Abstract: An electronic component handling apparatus for handling a DUT and pressing the DUT against a socket electrically connected to a tester, including: a temperature adjuster adjusting a temperature of the DUT; a first calculator calculating the temperature of the DUT on the basis of a detection result of a temperature detection circuit disposed in the DUT; a temperature controller controlling the temperature adjuster; and a first controller outputting a first signal to the temperature controller. A temperature control includes a first temperature control based on the temperature of the DUT calculated by the first calculator and a second temperature control, and when the first signal is input from the first controller to the temperature controller after the temperature controller starts the first temperature control, the temperature controller switches the temperature control from the first temperature control to the second temperature control.

    ELECTRONIC COMPONENT HANDLING DEVICE AND ELECTRONIC COMPONENT TESTING APPARATUS

    公开(公告)号:US20200241582A1

    公开(公告)日:2020-07-30

    申请号:US16575460

    申请日:2019-09-19

    Abstract: [Object] Provided is an electronic component handling apparatus capable of controlling a DUT temperature within an appropriate range even in a DUT in which an abrupt temperature change occurs under test.[Solving Means] An electronic component handling apparatus 50 includes a temperature adjuster 70 which adjusts a temperature of a DUT 90, a first calculator 86 which calculates the temperature of the DUT 90 on the basis of a detection result of a temperature detection circuit 92, a temperature controller 87 which controls the temperature adjuster 70, and a first controller 88 which outputs a first signal S1 to the temperature controller 87, in which a temperature control performed by the temperature controller 87 includes a first temperature control based on the temperature of the DUT 90 calculated by the first calculator 86 and a second temperature control different from the first temperature control and the temperature controller 87 switches the temperature control of the DUT 90 from the first temperature control to the second temperature control when the first signal S is input from the first controller 88 after the first temperature control starts.

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