公开(公告)号：US20240027520A1

公开(公告)日：2024-01-25

申请号：US18354198

申请日：2023-07-18

Applicant: ADVANTEST CORPORATION

Inventor： Hiroki ICHIKAWA ,  Satoshi SUDO ,  Tasuku FUJIBE

IPC: G01R31/28 ,  G01R1/073

CPC classification number: G01R31/2887 ,  G01R31/2893 ,  G01R31/2889 ,  G01R1/07328 ,  G01R1/07357

Abstract: An interface apparatus is provided between a test head and a DUT. The interface apparatus includes a frontend module configured of multiple pin electronics ICs in the form of a module.