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公开(公告)号：US20240027522A1
公开(公告)日：2024-01-25
申请号：US18354771
申请日：2023-07-19
Applicant: ADVANTEST CORPORATION
Inventor： Takayuki TANAKA , Tasuku FUJIBE
CPC classification number: G01R31/2887 , G01R31/2893 , G01R31/2889 , G01R1/07328 , G01R1/07357
Abstract: An interface device is provided between a test head and a DUT. The interface device includes pin electronics ICs, RAM, a pin controller, and nonvolatile memory. The RAM stores data based on a device signal received from the DUT by means of the multiple pin electronics ICs. The pin controller controls the multiple pin electronics ICs according to a control signal from the test head. The multiple pin electronics ICs, the RAM, and the pin controller are mounted on a pin electronics PCB.
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