公开(公告)号：US12025654B2

公开(公告)日：2024-07-02

申请号：US18481760

申请日：2023-10-05

Applicant: ADVANTEST Corporation

Inventor： Natsuki Shiota ,  Hiroyuki Mineo

IPC: G01R31/30 ,  G01R1/04 ,  G01R1/067 ,  G01R1/073 ,  G01R29/10 ,  G01R31/28

CPC classification number: G01R31/2863 ,  G01R29/10 ,  G01R31/2822 ,  G01R31/2867

Abstract: An electronic component testing apparatus for testing a device under test (DUT) includes: a socket unit that is electrically connected to the DUT; a first wiring board that includes a board opening; and a tester that includes a test head in which the first wiring board is mounted. The socket unit includes a first socket that faces a first main surface of the DUT and is electrically connected to the DUT and the first wiring board. The second socket that is exposed from the first wiring board through the board opening, contacts a second main surface of the DUT on a side opposite to the first main surface, and includes: a base that contacts the second main surface; and a test antenna unit that is electrically connected to the tester and faces a device antenna unit of the DUT.

公开(公告)号：US20210190855A1

公开(公告)日：2021-06-24

申请号：US17104913

申请日：2020-11-25

Applicant: ADVANTEST Corporation

Inventor： Natsuki Shiota ,  Hiroyuki Mineo

IPC: G01R31/28 ,  G01R29/10

Abstract: An electronic component testing apparatus is used for testing a device under test (DUT). The electronic component testing apparatus includes: a socket unit that is electrically connected to the DUT; a first wiring board; and a tester that comprises a test head in which the first wiring board is mounted. The socket unit includes a first socket and a second socket. The second socket includes a base and a test antenna unit. The tester tests the DUT by transmitting and receiving radio waves between a device antenna unit of the DUT and the test antenna unit while the DUT is electrically connected to the first socket and the first socket is electrically connected to the test head through the second socket.

公开(公告)号：US20240027519A1

公开(公告)日：2024-01-25

申请号：US18481760

申请日：2023-10-05

Applicant: ADVANTEST Corporation

Inventor： Natsuki Shiota ,  Hiroyuki Mineo

IPC: G01R31/28 ,  G01R29/10

CPC classification number: G01R31/2863 ,  G01R29/10 ,  G01R31/2822 ,  G01R31/2867

Abstract: An electronic component testing apparatus for testing a device under test (DUT) includes: a socket unit that is electrically connected to the DUT; a first wiring board that includes a board opening; and a tester that includes a test head in which the first wiring board is mounted. The socket unit includes a first socket that faces a first main surface of the DUT and is electrically connected to the DUT and the first wiring board. The second socket that is exposed from the first wiring board through the board opening, contacts a second main surface of the DUT on a side opposite to the first main surface, and includes: a base that contacts the second main surface; and a test antenna unit that is electrically connected to the tester and faces a device antenna unit of the DUT.

公开(公告)号：US11802904B2

公开(公告)日：2023-10-31

申请号：US17104913

申请日：2020-11-25

Applicant: ADVANTEST Corporation

Inventor： Natsuki Shiota ,  Hiroyuki Mineo

IPC: G01R31/30 ,  G01R31/28 ,  G01R29/10 ,  G01R1/04 ,  G01R1/067 ,  G01R1/073

CPC classification number: G01R31/2863 ,  G01R29/10 ,  G01R31/2822 ,  G01R31/2867

Abstract: An electronic component testing apparatus is used for testing a device under test (DUT). The electronic component testing apparatus includes: a socket unit that is electrically connected to the DUT; a first wiring board; and a tester that comprises a test head in which the first wiring board is mounted. The socket unit includes a first socket and a second socket. The second socket includes a base and a test antenna unit. The tester tests the DUT by transmitting and receiving radio waves between a device antenna unit of the DUT and the test antenna unit while the DUT is electrically connected to the first socket and the first socket is electrically connected to the test head through the second socket.